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All papers, whether invited or contributed, whether platform or poster, have the same two-page format. All accepted papers will be published in the Proceedings, a special issue of Microscopy and Microanalysis, the official journal of the Microscopy Society of America, the Microbeam Analysis Society and the Microscopical Society of Canada/Societe de Microscopie du Canada. The deadline for receipt of all papers is February 15, 2000. Papers received after that date will not be accepted for publication.

• Please read all instructions carefully.

• Papers should be a condensed version of the final presentation and include all significant findings.

• Papers, whether invited or contributed, must adhere to the instructions on this page and the next page. The entire paper must be on two pages, no more, no less. A sample paper appears on page 16. The second page may be used for halftone illustrations.

• An Electronic Author Data Form must be filled out for each paper submitted. The form can be accessed at http://www.msa.microscopy.com/MSAMeetings/MM00/00Forms.html. A printout of the electronically submitted Author Data Sheet must accompany the paper. In lieu of the electronic printout, a letter indicating First Author, Title, and the electroni- cally assigned PD# may be used. No paper will be accepted without a valid PD#. If electronic submission of the Author Data Form is not possible, a hard copy of this form can be obtained by contacting the MSA Meeting Management at 708-361-6045. It is imperative that this request be received no later than February 1, 2000 to ensure that the form reaches you in time to be submitted with your paper.

• Three copies of each paper must be submitted along with the original. Make sure the copies are good quality since they (not the original) will be used for review and for assigning the paper to a session. Please do not submit color prints. It is not necessary to provide original micrograph prints for the copies.

• An overhead and a 35-mm projector will be supplied for all platform presentations. Any other required audio/visual equipment (video, stereo, etc.) must be indicated on the Data Form or its availability cannot be guaranteed. Audio/visual equipment may be requested for poster presentations but cannot be guaranteed without consultation.

• All papers are reviewed by the Program Committee. Reasons for rejection include: lack of relevance; poor science quality; previous publication; excessive commercialism; deliberate fraud or hoax; lack of adherence to these instructions and late submission. Authors of rejected papers will receive a written explanation for the rejection from the Program Chair.

• You are responsible for presenting your paper at the meeting. If unfore- seen circumstances prevent your attendance, you must (1) notify the Program Chair and Meeting Management as soon as possible, and (2) arrange for a colleague to present your paper. Failure to do so will result in rejection of your papers in future meetings.

• Send papers (original and three good copies) along with the Electronic Author Data Form printout to: Microscopy & Microanalysis 2000, 7000 West Southwest Highway, Chicago Ridge, IL 60415. Insert cardboard sheet(s) in the envelope to prevent bending. Advance registration Forms and Award application material can be included in the same envelope.

• Do not send papers by fax. A faxed paper will not be acknowledged or accepted as a �reservation� for an original paper received after the deadline.

• Receipt of papers will be acknowledged promptly. Corresponding authors will be notified of a session and time assignments on/or about May 15, 2000.

• Information regarding the technical content of the meeting or of specific sessions can be obtained from the MSA Web page (http://WWW.MSA.Microscopy.Com) or from the Program Chair, Stuart McKernan, University of Minnesota, 12 Shepherd Labs, 100 Union St. S. E., Minneapolis, MN 55455. Email (preferred): stuartm@tc.umn.edu; Phone: 612-624-6009; Fax: 612-626-7530. All other questions about the meeting should be directed to the MSA Meeting Managers, 7000 West Southwest Highway, Chicago Ridge, IL 60415 Phone: 708-361-6045 Fax: 708-361-6166.

Instructions for Authors

1. TEXT. Write papers so that readers who are not specialists in the subject can appreciate the purpose of the study and understand the procedures and conclusions. The entire paper must be on two pages, no more, no less.

2. TYPESETTING. Use a word processor (with laser or bubble-jet printer, NOT a dot-matrix printer) or an electric typewriter. Use 10 point Times Roman or similar, 6 lines per vertical inch. Use italics for taxonomic terms and bold face for the title. Use NO underlines except for taxonomic terms. The copy will be photographed and reproduced as it is received, and will not be reduced; please see that it is sufficiently clean and dark enough to insure legibility and good appearance. Please follow the model of the sample paper on page 16. Avoid individualized formatting and special typefaces.

3. PLEASE NOTE THAT PREPRINTED FORMS ARE NO LONGER SUPPLIED. Submit papers on good-quality plain white paper. The material must fit within a 6-3/4" x 9" rectangle. Computer printouts and figures may be pasted in place. Write author�s name and the figure number on the back of each print in soft pencil, in case it comes loose. Do NOT use cardboard backing.

4. PAGE 1. May include text only, no illustrations. Title on first line, all capitals (except for chemical symbols); bold face, single-spaced if more than one line is needed. Leave one line of space; then authors� names, each followed by a comma and one or more asterisks for reference to each author�s affiliation.Leave one line of space; then asterisk the first author�s affiliation, etc. Do NOT center; return each line to the left margin.

5. PAGE 2. May include both text (if any) and figures. Table captions above tables, at left margin; figure captions below figures. Examples: TABLE 1 D Elements and their concentrations (after Ref. 3). FIG. 1 D Energy-dispersive x-ray spectra from second region indicate presence of Y.

• Sample Abstract Page 1 [850 Kbytes]
  
• Sample Abstract Page 2 [850 Kbytes]

6. LINE DRAWINGS. Use original inked drawings or glossy prints (NOT duplicate copies), with lines and stenciled legends thick enough to remain legible after reproduction. Paste into place on page 2, with captions below each.

7. MICROGRAPHS AND OTHER HALFTONE PHOTOS. Use good-contrast glossy prints, as far as possible with comparable density ranges. On each, show (a) figure number and (b) scale line (e.g., 1 m).

8. TABLES. Type single-spaced, with a horizontal line top and bottom as wide as the widest line of the table and vertical lines separating columns (but omit outermost vertical lines). Leave extra half space above and below each horizontal line. Indicate units (in parenthesis) in column headings. Place on page 2.

9. REFERENCES. Citations are shown in the text by a superscript numeral, preferably at the end of the sentence, AFTER the period. References are collected at the end of the paper, before the figures. Acknowledgements of sponsorship or the help of colleagues is made in the last reference, corresponding to a numeral at the end of the text. USE NO UNDERLINES. For three or more authors, use first-named author�s name only plus �et al . . .� Examples:

1. R. H. Geiss and D.R.. Clarke. Proc. Ann MSA Meeting 35(1977)525.
2. J. I. Goldstein et al., Practical Electron Microscopy, New York Plenum (1975)407.
3. T. A. Hall, in G. Oster, Ed., Physical Techniques in Biological Research,
New York Academic Press (1971)12.
4. R. G. Stafford et al., in Environmental Measurement, Washington, D.C.,
NIST Special Publication 464(1977)659.
5. This research was supported by the Office of Circumlocution under
Contract N00014-78-0094. The aid of Dr. Uriah Heep of City University is gratefully
acknowledged.

10. COPYRIGHT AGREEMENT. By submitting a paper, authors (except U.S. government employees) agree that if accepted, it is to be copyrighted by MSA. Authors and others may reproduce parts of the paper (with proper acknowledgement) at no charge in the journal of a professional society, but must apply to MSA for permission to reproduce them in books and other commercial publications.

When submitting the Author Data Form through the meeting Internet site, authors of invited papers should select only the symposium number (from the list below) corresponding to the symposium in which they have been invited to speak (categories 03-33). If you are unsure of your category, check with your symposium organizer. Authors of contributed papers should suggest two categories from the list below (02-80). Write the numbers of the chosen categories on the Author Data Electronic Submission Form available at the meeting Internet site. The program committee will use this information when arranging papers into coherent sessions. Please realize that inclusion of your contributed paper into a specific category cannot be guaranteed. However, every effort will be made to place your contribution into the most appropriate session. Sessions 02-33 are specific symposia. Before selecting one of these specific symposia, please carefully read the information describing the symposia, noting any special requirements. Categories 34-80 (pages 10-11) will be organized into symposia during the program production process. Each symposium will have a poster session associated with it: therefore, authors who prefer posters can contribute to any category (02-80). Individuals invited to present a tutorial should place a check in the "invited speaker box" enter the number of the tutorial (81-86) as the category.

01. The Microscopy Society of America, Microbeam Analysis Society and Microscopical Society of Canada/Societe de Microscopie du Canada Presidential Events
Organizers: Kenneth Downing, Charles Lyman and George Harauz

The Presidents of MSA and MAS will offer special events during the early evenings of Monday and Tuesday. These events will appeal to all attendees.

02. Microscopy Milestones of the Last Millennium
Organizer: Stuart McKernan

This being the last meeting of the 1900�s is an opportune time to look back at the milestones of microscopy under the auspices of the sponsoring societies. The excellent 50-year anniversary book of the Microscopy Society of America covers a great many of these, but the society has expanded its scope since then, and the meeting is sponsored by other societies. This poster session is intended to provide a forum to showcase major microscopy milestones, from whatever branch of microscopy, to highlight the origins and advances of the art in the continental USA.

The FIB has been used for precision cutting, milling, and deposition of various materials, in applications such as device modification and specimen preparation for electron microscopy and other analytical tools. In addition, the FIB is also a powerful imaging tool. The development of dual beam instruments, e.g., the combination of a focused ion beam and an electron beam in one instrument, also allows for unique microstructural and analytical capabilities. Abstracts discussing the applications of FIB techniques or the development of FIB instrumentation are encouraged to participate in this symposium. Applications that include either biological or physical sciences are encouraged to participate.

This symposium will highlight creative new capabilities in microscopy and their tremendous impact in chemical sciences. These include innovative developments in scanning and probe methods, in-situ and environmental EM, ultra high vacuum, high-resolution imaging, holography and lithography in the studies of catalysts (including for environmental protection, polymers, chemicals and fuels), clusters, nanophase and nanofiber materials. The topics, including spectroscopy, diffraction, electronic structure, improvements in data acquisition and future advances, will illustrate the exciting range of research to gaining a deeper understanding of the materials and processes. This symposium will consist of invited and contributed talks, and posters. It will be dedicated to Prof. J. M. Thomas, a pioneer of electron microscopy applications to solid state chemical sciences.

The phase transformations symposium will focus on the application of analytical electron microscopy and scanning probe microscopy to the study of phase transformations in metallic and ceramic systems. The advent of high-resolution analytical techniques has paved the way for new insights into the atomic mechanisms controlling both diffusional and martensitic/displacive transformations. The presentations in the Symposium will highlight recent advances made in this field.

Electron Backscatter Diffraction (EBSD) in the SEM is an important tool for the study of materials. The object of this symposium is not only to highlight the more recent advances in the instrumentation (including software and hardware) for EBSD, but also to focus on applications of the technique in all fields of materials including metals, semiconductors, ceramics, biomaterials and geologic materials. Abstracts on the use of EBSD for phase identification, texture determination, grain boundary characterization and response of materials to deformation or other processes are enthusiastically encouraged.

Dating geologic samples using the electron microprobe (EPMA dating) has recently been shown to be a viable technique by several research groups. The technique is particularly effective for monazite and uraninite crystals that typically contain high concentrations of U, Th and radiogenic Pb. These crystals are often highly zoned by overgrowths representing different ages or events in the mineral's history. The advantages of EPMA dating are small spot size, ease of analysis, non-destructive analysis, non-heroic sample preparation, and cost. This session will explore recent advances, limits of age determination (detection limits), and analytical problems associated with this chemical dating method. The session will also explore the application of the technique to other mineral phases such as xenotime and zircon.

Recent years have seen dramatic changes in the field of scanning transmission electron microscopy. Only three years after the demise of the only manufacturer of dedicated a STEM (VG microscopes) we are now in a situation where both TEM/STEM and dedicated STEM instruments from three manufacturers (JEOL, Philips and Hitachi) are routinely capable of delivering sub-2� probe sizes. Furthermore, the development of Cs correctors and monochromators promises to take the spatial resolution below 1� and dramatically increase analytical performance in the very near future. The aim of this symposium is to create a forum to discuss all aspects of imaging, diffraction and spectroscopy using sub-nanometer probes in STEM. In particular, papers concerned with resolution limits and novel applications of annular-dark-field imaging, spatially resolved EELS, EDS and CBED are encouraged. The more general aspects of EELS imaging and interpretation, which are not limited to small-probe work, will be covered in a joint EELS session (symposia #9).

This symposium will concentrate on recent developments of energy-loss instrumentation enabling new science such as monochromators and high-resolution spectrometers/filters, and novel methods of data acquisition/processing to improve detection limits and provide quantitative interpretation of spectroscopic images. The application of EELS near-edge structure to solve materials /biological problems and to provide insight into the bonding and properties of materials, as well as developments in methods for fine structure calculations, their limitations and the of improved resolution via numerical and instrumental methods will also be included.

The importance of quantifying polymer microstructure at length scales ranging from nanometers to microns continues to rapidly grow as increasingly sophisticated synthesis/processing schemes are developed and greater demands are placed on polymer properties. This symposium focuses on both emerging and established microscope-based methods for quantifying polymer microstructure, including TEM and HREM, energy-loss and energy-filtering techniques, x-ray microscopy, scanned-probe microscopy for imaging and mechanical characterization, and low-voltage SEM. Contributed papers from these and other methods for polymer characterization are welcome.

The topics of the symposium will be the applications of electron cryomicroscopy and computer reconstruction to the study of biological assemblies at high resolution. Invited speakers will cover topics related to 2D crystal structure, helical arrays, and single particle analysis. Contributed platform and poster presentations using microscopy to study macromolecules are also encouraged.

Biomaterials research aims to apply understanding of the basic structure and properties of materials in the development of devices compatible with a diverse array of biological functions. The primary aim of this symposium will be to provide a lively platform for presenting diverse yet relevant arrays of recent findings regarding the design and examination of properties of novel as well as existing biomaterials. Special attention will be given to interdisciplinary techniques and approaches which encompass multi-scale spatial (from molecules to tissue) and temporal (from milliseconds to months) domains.

Pharmaceutical research and development laboratories are at the forefront of science. Platform presentations, both invited and contributed, will showcase the latest developments and applications of microscopic and microanalytical techniques in both the biological and physical sciences. Contributed poster presentations will be used to complete this overview of the current state of the industry.

Invited presentations in this symposium will focus on the application of automated and semi-automated light microscopic image analysis methods for studying the biology of cancer. Methodologies currently available for both experimental and clinical applications will be discussed as well as potential future methods. The observation of cellular and tissue level changes with respect to precancerous and metastatic changes require specialized hardware and computer software that has matured to the point of application in the clinical and biomedical laboratory. These systems are not yet commonly applied and it is the goal of this symposium to provide these communities with an assessment of power that is available. Imaging modes and instrumentation will be featured as well as image analysis software. The latter can be applied to assess qualitative or quantitative questions including morphometrics. Contributed platform and poster presentations are also encouraged to complete the overall goal of this symposium which is to illustrate the importance of imaging techniques in the study of cancer. While the symposium will emphasize cancer biology, the methods presented will be applicable to the analysis of any isolated cell or tissue system.

This symposium will honor Dr. Lee Peachey on the occasion of his retirement for his work on behalf of the Microscopy Society of America and for his scientific contributions in the fields of microscopy and muscle motility. Invited presentations will consist of several of Dr. Peachey�s collaborators from the Philadelphia area and former students from around the country. Invited presentations will focus on studies that have used microscopy to advance our knowledge of muscle and non-muscle motility. To complete the symposium we also encourage the submission of contributed papers utilizing microscopy to study muscle biology and cell motility. These presentations will be included in a special poster session set up to honor Dr. Peachey.

This symposium will examine modern light and electron microscopic techniques which can be used to study the spores, germ tubes, infection structures, hyphae and haustoria of plant pathogenic fungi and the interactions of these structures with host plants. Invited presentations will cover several topics including the use of freeze substitution in TEM studies of fungal spores, use of the vital stain FM4-64 for visualizing membrane dynamics in living fungal hyphae, the use of cryoSEM and confocal LSM in studies of pathogenesis, techniques for localization and visualization of gene products in fungal pathogens and their hosts, and an overview of the impact of cryotechniques on cytological studies of plant pathogenic fungi and their hosts. Contributed platform and poster sessions on related topics of plant pathogenic fungi are also welcome.

This symposium will deal with microorganisms (bacteria, viruses, prions) found in the environment as well as in higher life forms (animals and plants). Newly discovered pathogens or organisms with unique capabilities (detoxification, invasiveness, resistance to antibiotics) are of interest in this symposium. Of particular interest are those organisms that represent extremes, as for example: the ability to grow in extreme environments, having extreme virulence or invasiveness, or being difficult to visualize using conventional preparatory procedures. Hopefully, the participants shall describe some of the features of extreme organisms that give rise to these capabilities. Finally, many of these organisms are often difficult to visualize using standard preparatory procedures. Papers describing procedures to prepare the specimens for visualization would be germane to this symposium.

The use of computers to control microscope operations, the ability to control microscopes remotely over the Internet, and the creation of microscope computer simulations allow researchers and students to access microscopes in new ways. These developments mean changes in the way microscopy can be taught to students and researchers. This symposium will examine different ways to teach microscopy and microscope theory and operation to researchers and students of all levels, in the context of new laboratory configurations, computer simulations, remote access usage, and classroom exercises.

Microscopes include 3 major subsystems: the electron optics, the specimen, and the detector. The purpose of this symposium is to review recent detector advances and address issues inherent to detector selection and utilization. For example, advances in detectors can provide new data, or increase the efficiency of data collection, or improve the quality of the data in some aspect. Nevertheless a new detector may be better than other competing designs for only a limited class of measurements. Effective utilization of a new detector can also require changes in the electron optics or modification in specimen preparation which can be a serious consideration in microscopy. Selection of mutually exclusive detection systems (based on technical or economic limitations) often requires value judgment of the best detector over the intended range of experiments.

Digital imaging is replacing more and more of the imaging that we historically recorded on film. This symposium will focus on trying to better understand this technology and how we can best apply it to all forms of microscopy. We will emphasize the areas of acquisition, archival storage, hardcopy production, image retrieval, transmission, and display/presentation.

All forms of scanned-probe microscopy including atomic-force, scanning-tunneling, magnetic-force and near-field scanning optical microscopy will be addressed. The symposium follows a workshop and emphasizes new developments in instrumentation, techniques and applications. Special topics will include remote microscopy, the integration of SPM with the electron microscopy and automation.

Chemical mapping through spectrum imaging will become a routine microanalytical tool during the coming decade. Spectrum-imaging capabilities have become commercially available from several manufacturers during the past few years, each providing an array of tools for extracting information about the analyzed specimen. This symposium seeks, through a mix of invited and contributed papers, to provide a forum for recent applications of spectrum imaging techniques, to survey the available methods for analysis and display of spectrum images, and to highlight ongoing developments in methods for extracting the available specimen-related information from these large raw data files. An open forum is planned at the end of this symposium to allow all symposium attendees to discuss priorities and future directions for this emerging area of microanalysis.

Low voltage operation is now the dominant mode of operation for the scanning electron microscope in both physical and life sciences. This symposium will highlight the recent advances in instrumentation, low voltage imaging techniques, specimen preparation protocols, and new strategies for microanalysis, that explain this trend.

The aim of this session is to present up to date results on x-ray microanalysis of practical materials. Particular attention will be paid to rough surfaces as well as porous and multiphased materials, multilayered structures, materials with concentration gradients, and particulates on substrates. The analysis of �real world� materials was selected because most quantitative modeling work thus far has been done for flat idealized samples, and there is a need for broader analytical approaches that can be applied to many currently un-addressed practical analytical problems of the type listed above. We seek papers dealing with new quantitative procedures for diverse samples and measuring conditions including both analytical models and Monte Carlo simulations. In addition, data-rich examples from electronics, forensics, art conservation, food science, and metallurgy and ceramics or other areas that illustrate the strengths and weaknesses of existing correction procedures or the need for new correction procedures would be welcome.

As monitoring of activity on the MAS e-mail reflector will reveal, many practical questions arise concerning electron beam x-ray microanalysis procedures in solving specific problems. For example, there exist a number of elements that raise special problems for analysts because of difficulties in preparation, availability of appropriate standards, radiation damage effects, etc. Additionally, problems arise with interpreting and processing x-ray spectra in special situations. This session, which builds on the highly successful session of the same name at the 1998 Atlanta Microscopy & Microanalysis Conference, will emphasize the practical in electron beam x-ray microanalysis. Papers are sought that will detail analysts' solutions to specific problems encountered in their work. While these problems may seem parochial, it is clear that the wider microanalysis community needs to hear about them.

Environmental scanning electron microscopy has progressed from a small niche to being at the forefront of innovation in electron microscopy. This year�s symposium moves through theory and practice to problem solving. A range of topics will be presented, including image optimization, dynamic experiments, beam blanking in ESEM, color with gas detectors, gas mixing, ESEM/EDS, contrast in liquids and intriguing new methods, such as charge contrast imaging in insulators and semiconductors (band gap imaging). The emphasis will be on making sure both new users and old hands hear the latest, most useful information emanating from EM labs around the globe concerning this rapidly expanding field.

Multi-photon excitation microscopy provides attractive advantages over other methods for three-dimensionally resolved fluorescence imaging. Using these techniques, excitation occurs only at the focal point of the microscope, which minimizes photobleaching and photodamage � the ultimate limiting factors in imaging living cells. Thus, multi-photon excitation permits experiments on thick living samples that would not be possible with other imaging techniques. This symposium will highlight recent applications of this method to living cells in vivo.

There have recently been a number of advances in the imaging of biological systems at the light microscopy level. Several of these have greatly improved our knowledge of how cells respond to and interact with a number of complex signals. Among these are techniques that utilize video imaging of living cells, fluorescence resonance energy transfer (FRET), fluorescence recovery after photobleaching (FRAP), imaging of ion fluxes in cells, and the visualization of green (and other) fluorescent proteins that are incorporated into cells. In addition to these advances in techniques, there has also been significant improvement in antibodies and other reagents used in light microscopy that have been used to further our understanding of how cells interpret and translate intra- and extracellular signalling events into a cellular response. This symposium will include invited and contributed platform and poster presentations covering several topics related to these improvements in light microscopy techniques and reagents that are being used to further our understanding of how cells interpret and respond to a variety of stimuli.

The application of multimode microscopy in biological problem solving has led to the development of advanced labeling techniques based both on existing and developing technologies. These technologies have facilitated labeling for photon based, electron based, and force based imaging. They allow identification and localization of various molecular species at high sensitivity and high spatial resolution. Techniques that permit simultaneous labeling of multiple species for co-localization studies in the various imaging modes are also under development. In correlative studies, where a single sample is examined sequentially in different imaging modes, recent work has been directed toward the development of labels and procedures, which facilitate precise identification of the same label in each of the imaging modes. This session will focus on emerging labeling technologies for high resolution and correlative applications.

A variety of visualization methods have been used to understand the complexity of mechano-physical, biochemical, and cell biological processes determining normal vascular function. This symposium will explore the diversity of imaging tools used in vascular studies and demonstrate how these tools have helped shape our understanding of vascular dysfunction. In addition to invited talks from a few selected leaders in the field, contributed papers, representing novel or traditional methods of analyzing abnormal blood flow, vascular injury, changes in cellular or molecular composition, or other alterations accompanying vascularpathology are encouraged.

In this symposium we will cover state-of-the-art techniques for Immunolabeling at the electron and light microscope levels. Emphasis will be placed on cryotechniques because they have been demonstrated to give superior results in most circumstances. We will cover cryosectioning, or what is sometimes called the Tokuyasu technique, plus on-section labeling of resin-embedded cells and tissues, and labeling for scanning EM. We will also see how low temperature methods can be used at the light microscope level to produce improved signal and morphology.

The focus of this year�s symposium will be cryo microscopy. Invited speakers from both biological and materials science will present the latest technologies in this field. Learn more about this important technology and its applications. An associated contributed poster session will follow the morning session. Abstracts for this poster session are encouraged.

MICROSCOPY AND MICROANALYSIS, the official journal of the Microscopy Society of America, the Microbeam Analysis Society and the Microscopical Society of Canada, invites you to submit full length manuscripts. Indexed by BIOSIS, Chemical Abstracts, and Current Contents (both the Life Sciences and Physical Sciences editions), Microscopy and Microanalysis is a peer-reviewed journal which publishes the highest quality research on imaging and analysis in the biological and physical sciences. The review process is prompt, and reproduction standards for both color and grayscale images are outstanding. Your article will reach an international audience of over 5,000, including members of societies on four continents.

Microscopy and Microanalysis ". . . makes a fair bid to become the international house journal of microscopists." � Nature

For author instructions and/or more information on the Journal you may contact one of the six Editors listed below, or you may access us via the World Wide Web at http://link.springer-ny.com/link/service/journals/10005/index.html.

Editor-in-Chief
Editor, Electronic and Scanning Probe Microscopies
Dale E. Johnson
The Graduate School
University of South Florida FAO 126
4202 E. Fowler Avenue
Tampa, FL 33620-7900
Phone: 813-974-2846
FAX: 813-974-5762
e-mail: dej@grad.usf.edu

Editor, Biological Applications
Ralph Albrecht
Animal Health and Biomedical Sciences
University of Wisconsin-Madison
1655 Linden Drive
Madison, WI 53706-1581
Phone: 608-262-3177
FAX: 608-262-7420
e-mail: albrecht@ahabs.wisc.edu

Editor, Computers and Image Analysis
Michael O'Keefe
Lawrence Berkeley Laboratory, B72
National Center for Electron Microscopy
1 Cyclotron Road
Berkeley, CA 94720
Phone: 510-486-4610
FAX: 510-486-5888
e-mail: maok@lbl.gov

Editor, Materials Applications
Ray W. Carpenter
Center for Solid State Science, PSB-234
Arizona State University
Tempe, AZ 85287-1704
Phone: 602-965-4549
FAX: 602-965-9004
e-mail: carpenter@asu.edu

Editor, Microanalysis
Charles E. Lyman
Dept. of Materials Science and Engineering
Lehigh University
5 East Packer Avenue
Bethlehem, PA 18015
Phone: 610-758-4249
FAX: 610-758-4244
e-mail: cel1@lehigh.edu

Editor, Optical and Conofocal Microscopy
P.C. Cheng
Advanced Microscopy and Imaging Laboratory
Department of Electrical and Computer Engineering
State University of New York at Buffalo
Buffalo, NY 14260
Phone: 716-645-3868
FAX: 716-645-3868
e-mail: elepcc@corn.eng.buffalo.edu

NOTE: Authors of submitted abstracts are strongly encouraged to also consider submitting full manuscripts to the journal: Microscopy and Microanalysis following Instructions to the Authors found in the journal or at http://www.springer-ny.com/service/journals/10005/index.htm. Or contact:

Herb Niemirow, Managing Editor,
Springer-Verlag New York, Inc.
175 Fifth Avenue
New York, NY 10010-7875
Phone: 212-460-1686
Fax: 212-533-5587
E-mail: herbn@springer-ny.com