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Special Events
Posters,and
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M&M '00 Home Page
Pre Meeting Congress
Micrograph Competition
Premeeting Sunday Short courses
A separate registration fee is required to attend a Sunday Short Course.
20-01. Basic Transmission Electron Microscopy for Materials Science
Full Day: 9:00 am - 5:00 pm
Instructors: M. Grant Norton
Washington State University
Tel: 509-335-4207
Email: norton@mme.wsu.edu
John Bruley
IBM
Tel: 914-894-6594
Email: bruley@us.ibm.com
This course is intended to provide a non-mathematical description of the basic principles of transmission and analytical electron microscopy for materials science. Images provide microstructural detail from micron length-scales to atomic resolution. Convergent beam diffraction allows point and space group analysis from microcrystalline regions. EDX and EELS spectrometry provides elemental, chemical and bonding information at nanometer resolution. Factors influencing the ultimate spatial resolution and detection sensitivities will be covered. The course will be directed towards materials scientists, advanced technologists and technical managers who are required to use or interpret data taken from the TEM.
20-02. Basic Scanning Electron Microscopy
Full Day: 9:00 am - 5:00 pm
Instructors: David C. Joy
Rm. 232 Science and Engineering Research Facility
University of Tennessee, Knoxville, TN 37006-0810
Phone: 423-974-3642,
Email: djoy@utk.edu
Oliver Wells
IBM
Phone: 914-945-2321
Email: wellsoc@watson.ibm.com
This course will describe the basic components of the modern scanning electron microscope including guns, lenses, detectors, and vacuum systems and discuss the key factors which influence the types of image contrast that we see in the SEM. The factors which limit the resolution and general performance of an SEM will be analyzed and ways to evaluate the quality of an SEM will be presented. Operational procedures for conventional high vacuum as well as for variable pressure and environmental SEMs will be covered.
20-03. Practical Digital Imaging
Full Day: 9:00 am - 5:00 pm
Instructor: John M. Mackenzie, Jr.
NC State University
Tel: 919-515-2664
Email: supervisor@emc.ncsu.edu
This course will discuss the various strategies needed for producing digital data that is suitable for publication. We will discuss how to acquire the best digital image for a given sample. Noise removal and resolution issues will be discussed in detail. We will examine what the current best technologies for archiving the image data are and what image formats and standards we should adopt. We will examine in detail imaging printing. We will emphasize several issues that must be understood in order to produce high quality images every time on any printer (the most critical being the gamma correction). There will be a strong emphasis placed on the most affordable solutions available regardless of platform or operating system. We will examine the latest technologies such as digital cameras and digital video to see how they may best be applied to microscopy. We will discuss the major issues that must be addressed when moving to a more digital approach.
20-04. The Digital Darkroom
Half Day. 1:00 pm - 5:00 pm
Instructors: Joe Costello
University of North Carolina at Chapel Hill
Email: mjc@med.unc.edu
John Lemasters
University of North Carolina at Chapel Hill
Email: lemaster@med.unc.edu
The digital darkroom is a facility in which image data in one format can be converted to other formats for publications, presentations and other uses without traditional wet photographic processing. The purpose of this short course is to describe the components of the digital darkroom. Specific topics to be addressed include: 1) digital cameras; 2) flatbed, slide and other scanners; 3) image processing software to adjust image brightness, contrast and color, and to compose publication quality figures; 4) digital printers to make prints, slides and transparencies; and 5) storage formats for long-term archiving of image data.
20-05. Basic Introduction to X-Ray Energy Dispersive Spectroscopy
Half Day: 1:00 pm - 5:00 pm
Instructor: Paul K. Carpenter
SD47 USRA NASA, Marshall Space Flight Center
Huntsville, AL 35812
Phone: 256-544-6216,
Email: paul.carpenter@msfc.nasa.gov
This course will cover practical applications of the energy-dispersive spectrometer to x-ray microanalysis. Topics covered will include detector technology, advances in pulse processing, resolution and performance monitoring, detector modeling, peak deconvolution and fitting, qualitative and quantitative analysis, compositional mapping, and selection of standards. An emphasis will be placed on use of the EDS for quantitative analysis, and typical problems encountered in the analysis of a wide range of materials and sample geometries.
The following workshops will be held during the meeting
Problem Solving with the Experts
Organizers: Ron Anderson and Jose Mascorro
These are informal interactive question-and-answer sessions with experts in various fields of microscopy and microanalysis which will take place during the meeting.
Following the success of the "Experts" session in previous meetings, similar sessions will be repeated in 2000 to promote this novel means of communicating scientific knowledge. Essentially, hot topics are identified and experts are located to answer questions posed from the audience. The "experts" do not deliver prepared talks, but may make some introductory remarks. Audience members choose the questions and the expert, or other members of the audience, contribute answers.
MSA Technologists' Forum Roundtable Discussion
Organizer: Jeanette Killius
Safety Issues in the Microscopy Lab.
Computer Workshop/Software Exchange
Organizers: Nestor J. Zaluzec and John F. Mansfield
The computer workshop and software exchange will be operating throughout the Meeting. Participants can view and discuss the more than 500 megabytes of data, programs, general information and images available in the public domain software libraries. A limited number of Macs and PCs will be available for viewing, discussing, and copying programs. This year we will be setting up a new area in the workshop to allow multi-media presentations, demonstrations of public domain software and/or internet sites on a large screen display for group viewing. The workshop will also be relocating to the exhibit floor next to the various society information booths. A limited number of connections to the Internet will be available to provide access to E-mail etc. for conference attendees. However, this will be contingent upon availability of the systems with respect to other workshop demonstrations. The workshop will only be open during Exhibit hours.