Special Scientific Events

The goal of this topical conference is to present the state of the art of materials characterization of non-conductive or charging materials using microbeam analysis. Examples of charging materials include polymeric materials, ceramic materials, and dielectric materials and photoresists in the microelectronic industry. Also, the characterization of biological specimens will be covered because they are prone to problems related to charging. These materials are of great technological importance and their characterization is still a great challenge because they charge when analyzed with an electron beam.

The techniques of microbeam analysis that will be considered are: X-ray Microanalysis in the Electron Microprobe, Low Voltage Scanning Electron Microscopy, Environmental Scanning Electron Microscopy, Analytical Electron Microscopy with Field Emission Transmission Electron Microscopy, and Focused Ion Beam Milling for specimen preparation. World experts will present papers on these topics. Papers from this topical conference will be published in a special issue of Microscopy & Microanalysis.

This two-day topical conference will be held at McGill University, Montreal, Quebec, Canada, from August 2 to 3, just before the meeting Microscopy & Microanalysis 2002. Attendees are invited to register for this topical conference to hear the presentations. Only invited speakers will present oral presentations at this conference. It is understood that registrants will contribute positively at this conference by interacting with the speakers in this meeting in order to ask questions and share experiences about this very important and difficult topic.

Please complete the registration form return to Raynald Gauvin by July 31, 2002. Please register early because there are a limited number of places available.