Microscopy & Microanalysis 2011 Meeting
On behalf of the sponsoring societies, we would like to thank all attendees at the M&M 2011 Meeting. We hope you enjoyed your visit to Nashville. Plan to join us in Phoenix, AZ USA for the M&M 2012 Meeting next August.
M&M 2011 Printed Proceedings — Available by Print-On-Demand through Cambridge University Press ($90).
You may order by emailing email@example.com and a sales representative will get back to you. Proceedings book(s) will be shipped to the destination of your choice.
All attendees should have received a complimentary DVD version of the proceedings onsite in Nashville. Additional copies are still available through the Society Office by submitting an order form and $25.00 USD.
M&M 2011 EXPO Edition is available!
Click below to see this year's EXPO featuring all program details and other important meeting information.
Fellow Microscopists/Microanalysts, Colleagues, Students, and Friends,
The M&M conference is the premier meeting, spanning the physical, life and analytical sciences, which brings together delegates from around the globe who report on the latest work and advances in microscopy and microanalysis. Our Program Committee has once again put together a compelling suite of over 30 symposia reflecting the current state-of-the-art, as well as the innovative and emerging fields of research. Whether your interest is in nanotechnology or traditional metallurgy, biology or clinical diagnosis, or the growing field of multifunctional hard/soft materials, you will find a fascinating venue. In addition to our thematic symposia, we also feature a range of educational opportunities ranging from "Back to the Basics" tutorials, to in-depth, multi-day intensive workshops, as well as the chance to network with your peers.
Our meeting will begin with a plenary session featuring Prof. Stefan Hell, who will be discussing super-resolution microscopy, and Dr. Gene Ice, speaking on x-ray micro/nanoprobe characterization using synchrotron sources. We will also honor the winners of our major societal awards for distinguished scientists, professional technical achievement as well as student and post-graduate scholars.
Complementing the symposia is one of the largest exhibitions of microscopy/microanalysis instrumentation and resources in the world, which includes access to our very popular evening vendor tutorials. In addition, the traditional Sunday Short Courses will be joined this year by a Pre-Meeting Specialist Workshop on Opportunities, Artifacts and Interpretation of Aberration-Corrected Electron Microscopy Data.
We encourage all of you, whether newcomers or veterans of M&M, to submit a paper on your latest research for presentation in Nashville. We are looking forward to greeting you at our opening Sunday Reception in the Music City for what we are sure will be an exciting and educational conference for all.
|Nestor J. Zaluzec, President
Microscopy Society of America
|John Henry Scott, President
|Nat Saenz, President
International Metallographic Society