Full Symposium Descriptions

Instrumentation & Techniques Symposia

A01 Gertrude Rempfer Memorial Symposium on Advances in Electron Optics and Aberration-Corrected Electron Microscopy

Sergei Rouvimov, Rolf Koenenkamp, Wolfgang Neumann, Teresa Ruiz

Invited Presenters:

  • Harald Rose, University of Ulm
  • Max Haider, CEOS GmbH
  • Angus Kirkland, University of Oxford
  • Ute Kolb, University of Mainz
  • Alice Dohnalkova, PNNL
  • Edgar Rauch, CNRS
  • Rob Ward, Portland State University
This symposium will honor the work of Gert Rempfer by presenting and discussing the most recent advances in electron optics and microscopy, including aberration corrected transmission and photoemission electron microscopy. The symposium intends to provide an overview of major milestones in electron optics development, give current status and outline the future trends. Because instrumentation development is intimately related to progress and challenges in science, the symposium will also address a few examples of recent electron microscopy-related advances in materials science and biology. It intends to attract attention of young scientist, especially female researchers, to fast developing areas in electron microscopy. The symposium will feature an introduction by Harald Rose.

A02 The Electron Microscope of the Future: Merging the SEM, the STEM and the Ion Microscope

Raynald Gauvin, David C. Joy, Brendan J. Griffin

Invited Presenters:

  • Ludek Frank, Institute of Scientific Instruments ASCR
  • Bradley Siwick, McGill University
  • Winfried Heichler, SPECS GmbH
We no longer have to build electron microscopes in the same old way. It is amazing that an SEM built now is still recognizably the same machine as the original Oatley instrument from 1950! With STEM results at 30 keV in FE-SEM that can achieve resolution in the 0.2 - 0.3 nm , it is clear that microscopy will change significantly in the next decade. What will be the next microscope? SEM - STEM .1 - 60 keV or with another combination of energy? will the Ion microscope replace the SEM or TEM? or will the dual beam electron - He microscope become the real tool? Might it be possible to do microanalysis with SIMS in a dual-beam machine? What new combinations of techniques could be integrated?

A03 New Opportunities for In-situ Techniques and Instruments

Thomas W. Hansen, Blythe G. Clark, Klaus Qvortrup

Invited Presenters:

  • Kristian Mølhave, DTU Nanotech
  • Daniel Kiener, University Leoben
  • Niels de Jonge , INM-Leibniz Institute for New Materials
  • Khalid Hattar, Sandia National Labs
  • Jurgen Plitzko, Max Planck Institute of Biochemistry
  • Moritz Helmstaedter, Max Planck Institute of Neurobiology
In order to gain insight into matter in its working state, newly developed and modified tools are being extensively used to allow observation of various interactions with the sample in situ. These tools need to be accurate far beyond the sub-micron scale and must operate in a way that does not affect the optical performance of the instruments. The aim of this symposium is to highlight both newly developed capabilities with electron microscopes and new uses of well-established techniques. The symposium will cover all flavors of electron microscopy and bring together scientists from both the materials science and soft matter communities.

A04 Electron Tomography in Life and Material Science

Heiner Friedrich, Montserrat Barcena, Esther Bullitt

Invited Presenters:

  • David Mastronarde, University of Colorado
  • Elizabeth Wright, Emory University School of Medicine
  • Irene Wacker, Karlsruher Institut für Technologie (KIT)
  • Dirk van Dyck, University of Antwerp
  • Krijn de Jong, Utrecht University
  • Daniel Wolf, Technische Universität Dresden
Advances in sample preparation, instrumentation and methodology have widened the scope of electron tomography (ET) from sub-nanometer details to the micrometer scale. This symposium will address leading scientific and technological developments in the physical and biological sciences, using the widest possible range of ET imaging approaches and their integration with complementary techniques. Applications and developments covering — but not limited to — (aberration-corrected, energy-filtered) TEM and STEM, phase plates, diffraction or holography, are invited. Contributions including complementary approaches such as correlative light-electron microscopy, X-ray tomography, serial-block face SEM/AFM, and novel processing tools are encouraged.

A05 Revisiting Resolution for STEM and TEM

Edgar Voelkl, Rolf Erni, John Silcox, NasimAlem

Invited Presenters:

  • Knut Urban, Research Center Juelich
  • Dirk Van Dyck, University of Antwerp
  • Pierre Stadelmann, CIME-EPFL
  • James Lebeau, North Carolina State University
The development of spherical and chromatic aberration correction voids the definition of conventional "Scherzer” resolution. Live computer assistance provides a variable resolution estimate instead for thin samples. With improved probe size or point spread function, direct image interpretation is tempting but is still problematic. Can resolution be defined for samples that are not “thin”? How thick can a sample be and still allow for direct interpretation? Can object-limited resolution be quantified at all? With increased signal-to-noise ratio and aberration reduction, has the match between simulated and real images actually improved? Decision time: using TEM or STEM for imaging and/or chemical mapping for beam sensitive samples at what voltage?

A06 Applications of MicroCT in Life and Material Sciences

Douglas R. Keene, Daniel S. Perrien, Rebecca Rudolph

Invited Presenters:

  • Denton Ebel, American Museum of Natural History
  • Anjali Singhal, GE Global Research
  • Meghan Faillace, GE Inspection Technologies
With recent advances in hardware and computing power, the cost, speed, and resolution of polychromatic and synchrotron microCT systems makes them a viable option for three dimensional microscopic studies at the micrometer and submicrometer level. This symposium will provide an overview of microCT applications in a variety of fields including biomedical research, geology, archaeology, and engineering/manufacturing. Plenary talks and posters will highlight the development of novel techniques for image acquisition, processing, visualization, or analysis or application of standard techniques to new fields of study. Subjects may also include the utility of combining microCT with other imaging modalities. New studies and contributions from universities, government and industry are welcome.

A07 Mass Spectrometry Imaging (MSI): Applications, Current Challenges and Perspectives

Francisco A. Fernandez-Lima, Christine M. Mahoney

Invited Presenters:

  • Paula Clark, Tascon, USA
  • Ljiljana Pasa-Tolic, EMSL/PNNL
  • Peter K. Weber, LLNL
  • Christine Ferreira, Purdue University
  • Ingela Lanekoff, EMSL/PNNL
  • Kathy Kellersberger, Bruker Daltonics
Comprehensive surface characterization and analysis requires detailed knowledge of the chemical constituents, locations, and dynamics. With the recent advent of novel mass spectrometer and imaging probe designs, data analysis methods, and sample preparation techniques, mass spectrometry imaging provides unrivaled capability for detection, characterization and identification of surface components. This symposium will focus on the state-of-the-art, current challenges and perspectives of mass spectrometry imaging. Topics will include: high spatial resolution imaging and isotopic analysis using mass spectrometry; 2-D/3-D molecular analysis for materials and biomedical applications; novel atmospheric pressure ion sources and their applications; fundamentals on imaging probe/surface interaction and novel instrumentation; and data analysis protocols, strategies and sampling methods.

A08 EBSD, Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Natasha Erdman, Joseph R. Michael

Invited Presenters:

  • Adrien Boulineau, CEA-Grenoble
  • Sarah Brownlee, Wayne State University"
  • Patrick Trimby, Australian Centre for Microscopy & Microanalysis
  • Stuart Wright, EDAX/TSL
  • Angus Wilkinson, Oxford University
  • Tresa Pollock, University of California, Santa Barbara
Orientation mapping of crystalline materials has provided important information resulting in improved understanding of both man-made and geologic materials. This symposium highlights the advances in orientation mapping through EBSD in the SEM and precession diffraction in the TEM, and in particular improvements in resolution and accuracy of these techniques. The recent development and controversy over the use of electron diffraction techniques for elastic and plastic strain mapping is an important area. Topics of interest to this symposium include but are not limited to: EBSD, precession diffraction, transmission Kikuchi diffraction, improvements in resolution, improvements in accuracy, elastic and plastic strain measurement, applications in materials science and geological materials.

A09 Advances in Data Processing in Optical and Electron Microscopy

Edward P. Morris, David Morgan, Jeffrey L. Clendenon

Invited Presenters:

  • Kevin Eliceiri, University of Wisconsin
  • James Glazier, Indiana University
  • Michael Radermacher, University of Vermont
  • Hanspeter Winkle, Florida State University
  • Quentin Ramasse, SuperSTEM
  • Lewys Jones, University of Oxford
Many advances in microscopy have been driven by developments in software and the availability of affordable high-speed computing. This symposium will focus on software tools for EM and LM that are publically available with an emphasis on analysis after data acquisition. A major topic will be EM software for structural biology (analysis of single particles, helical structures, 2d crystals), TEM/STEM tomography and enhancing information obtained from materials. Another focus will be software developed for LM to process, visualize, segment and measure 3D/4D images.

A10 Practical Programming for Microanalysis

Andrew Deal, Philippe T. Pinard, Aaron Torpy

Invited Presenters:

  • John Donovan, University of Oregon
  • Ralf Hielscher, Technische Universität Chemnitz
  • Paul Shade, U.S. Air Force Research Laboratory
Over the past decade there have been tremendous advancements in the computational resources that are readily available. Integrated and stand-alone computer programs written by microscopists have both advanced the science of microscopy and extended the ability to collect and analyze data. This symposium is intended as a forum for the presentation and discussion of programs and programming practices that enhance our community and science. Contributions in the following areas are welcome: Scripting, APIs, and Task Automation; Quantitation Routines and Data Processing; Microscopy Simulations; Extensible/Robust Code Development; and Open Source Libraries.

A11 Ion Beam Instrumentation and Applications for Physical and Biological Sciences

Keana Scott, Mike Marko, Trevor E. Clark

Invited Presenters:

  • Bruno Humbel, University of Lausanne
  • David Joy, University of Tennessee
  • Joseph Michael, Sandia National Laboratories
  • McLean Echlin, UC Santa Barbara
Focused-ion-beam instruments are available with a widening choice of ions, for new applications involving both imaging and milling. With recent advances in detector technology and analysis techniques, applications span the needs of the semiconductor industry, materials science, and biology. We encourage abstracts on all aspects of ion beam technology including theoretical or experimental work on ion-solid interactions, FIB-based specimen preparation, processing and fabrication methods, and FIB-based 2D and 3D analyses of hard and soft materials. Advances in new instrumentation or methods such as light-ion sources, high-current ion sources, mass-filtered ion sources or low-energy ion milling are also of interest.

A12 Atom Probe Tomography In Correlative Investigations

Baptiste Gault, David J. Larson

Invited Presenters:

  • David Dierks, Colorado School of Mines
  • Christian Oberdorfer, University of Münster
  • Jim Speck, Materials Department, UCSB
  • Brian Geiser, Cameca Inc
  • Dieter Isheim, Northwestern Univeristy
  • Zhijie XU, PNNL
  • Williams Lefebvre, University of Rouen
  • Michael Miller, Oak Ridge National Laboratories
  • Michael Moody, Oxford Materials
  • Francois Vurpillot, University of Rouen
This symposium is for researchers who are using atom probe tomography (APT) in correlation with computational methods and/or other microscopy techniques to bring insights into the fundamentals of the techniques or to gain complementary information to enhance materials characterization. The symposium aims to blend experimental and theoretical work, and will capture the most recent developments around atomic-scale correlative microscopy, as well as the combined use of computational methods with APT that include atomistic simulations (DFT, molecular dynamics, Monte-Carlo, etc.) and advanced data treatment. Advances directed toward atomic-scale tomography are encouraged.

A13 Microscopy and Microanalysis for Real World Problem Solving

Stuart McKernan, Elaine F. Schumacher, Janet H. Woodward

Invited Presenters:

  • Deborah Hall, Rush University Medical Center
  • Steven Bradley, UOP, LLC, a Honeywell Company
  • Philip Howard, NASA
Microscopy and microanalysis of real world samples present special challenges. Non-ideal samples may not lend themselves to established methodologies for preparation and analysis. Sample amounts and background information about the material and the problem may be limited, and the time frame for producing results may be very short. This symposium will focus on ways in which microscopists and microanalysts develop unique and creative solutions for sample preparation, data acquisition and analysis, providing meaningful results to solve problems in the real world.

A14 New Instrumentation at the Limits: Characteristics and Applications

Ray W. Carpenter, John C. H. Spence, Moon J. Kim

Invited Presenters:

  • Jo Verbeeck, University of Antwerp
  • Yifan Cheng, UC San Francisco
  • Holger Muller, UC Berkeley
  • Eric Stach, Brookhaven NL
  • Thomas LaGrange, LLNL
  • O.L. Krivanek, Nion Co.
This symposium will review new instrumentation and techniques beyond current limits such as new fast electron sources, high efficient detectors and twisty beams for magnetic materials, and also for solving critical issues related to new and emerging advanced materials and devices. The proof of concept experiments as well as practical examples are also within the scope of this symposium.

A15 Low Voltage Transmission Microscopy: Pros and Cons

Max Haider, Rasmus R. Schroeder

Invited Presenters:

  • Ute Kaiser, University of Ulm
  • David Bell, Harvard University
  • Kazu Suenaga, AIST National instuitute
  • Ray F. Egerton, University of Alberta
This Symposium will cover the physical and instrumental aspects as well as the application of Low Voltage TEM & STEM. With this symposium we attempt to find out if there are optimum energies when working with beam sensitive materials and what are the limitations with respect of resolution, applicable dose, achievable contrast and specimen preparation. Analytical aspects at low energies should also be covered. The advantages and disadvantages when working at low energies should be of beam sensitive materials should be compiled.

A16 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?

Dale E. Newbury, Masashi Watanabe, Nestor J. Zaluzec

Invited Presenters:

  • Nicholas Ritchie, National Institute of Standards and Technology
  • Toru Hara, National Institute for Materials Science
  • Hideuiki Takahashi, JEOL, Ltd
  • Alan Sandborg, AMETEK
  • Claude Merlet, Université‚ de Montpellier II
X-ray analysis using electron optical instruments has a long history (Castaing EMPA-1951; Duncumb EMMA-1962) so much so, that the technique is often taken for granted. Today's instruments are not always optimized for precision measurements and frequently are configured to operate under diverse conditions and modes. While analyses can be readily obtained, accurate results require careful that measurement science be performed during sample preparation, instrument operation, spectrum measurement, and concentration calculations. Speakers will consider barriers to accuracy as well as developments needed for further progress in the SEM, EMPA and TEM/STEM/AEM. Contributed presentations in the areas of technology, software, limitations, and hyperdimensional imaging/analysis are welcome.

A17 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences

Elizabeth R. Wright, Alice C. Dohnalkova, Mark A. Sanders

This symposium provides an opportunity for instrument manufacturers and vendors to showcase new developments and improved products. Topics include:

  • New methods and techniques
  • Improvements to existing instrumentation
  • Innovations for new instrumentation

Biological Sciences Symposia

B01 Developmental Biology and Tissue Engineering: Bridging the Gap through Microscopy

Jay D. Potts, Richard L. Goodwin

Invited Presenters:

  • Brenda Rhongish, The University of Kansas Medical Center
  • Sandra Rugonyi, Oregon Health Sciences University
  • Richard Goodwin, University of South Carolina
  • Michael Rubart-von der Lohe, University of Indiana School of Medicine
The field of tissue engineering is one the fastest growing disciplines in science with its union of bioengineering, developmental biology and translational medicine. Principally, the end result of all three creates living, functional tissues. These fields also pose common imaging challenges, as the generation of tissues is a dynamic, 3D process. This symposium will explore a range of techniques that researchers have used to examine these dynamic processes and to overcome the obstacles associated with studyingrapidly changing molecular and structural components of cells and tissues during normal development and engineering of tissues.

B02 AFM-Based Nanoscopies in the Life Sciences

John R. Dutcher, Laurent Kreplak, Christopher M. Yip

Invited Presenters:

  • Andrew Pelling, University of Ottawa
  • Linda Johnston, NRC
  • Peter Lu, Bowling Green State University
  • Gilbert Walke, University of Toronto
The aim of this symposium is to highlight recent developments in AFM instrumentation and integration with optical techniques that are opening exciting new avenues in the Life Sciences. Topics covered will include the nanoscale mapping of chemical and mechanical properties of macromolecular assemblies, cells and tissues. Presentations will cover both methodological developments as well as applications to cell biology and medicine.

B03 Structural Biology and Cell Ultrastructure

Paula C. A. da Fonseca, Michael Radermacher, Ingeborg Schmidt-Krey

Invited Presenters:

  • David Veesler, The Scripps Research Institute
  • Edward Morris, The Institute of Cancer Research
  • Beate Rockel, Max-Planck-Institute for Biochemistry
  • John Rubinstein, The Hospital for Sick Children, University of Toronto
  • Tamir Gonen, Howard Hughes Medical Institute
  • Timothy Baker, University of California, San Diego
Our understanding of the 3D structure and function of cells, microorganisms and macromolecular assemblies has experienced great advances through recent developments of EM techniques and hybrid methodologies. This symposium highlights structural and ultrastructural studies of cells, microorganisms and biological macromolecules using electron microscopy techniques (e.g. single-particle analysis, tomographic methods; helical reconstruction, crystallographic methods) singly or combined with other structural methods (e.g. X-ray methods; atomic force microscopy). Topics will include: structure and function of macromolecular assemblies, virus structure and virus-host interactions; eukaryotic and prokaryotic cell architecture; cellular metabolism; cell division and protein translation; cellular secretion, adhesion and motility; cell-cell communication and signaling.

B04 Fluorescence Microscopy of Organelle Dynamics

Darren Boehning, Matt Lord

Invited Presenters:

  • Kirill Kiselyov, University of Pittsburgh
  • Sharon Rozovsky, University of Delaware
  • Sidney Shaw, Indiana University
  • Vladimir Sirotkin, SUNY Upstate
  • Shane Nelson, University of Vermont
The development of novel fluorescent probes and the discovery of green fluorescent protein has revolutionized the cell biology field. Combined with new imaging methodologies such as multi-photon, TIRF, and super resolution microscopy, it is now possible to visualize cellular processes in living cells with unprecedented spatio-temporal resolution. This symposium will explore how fluorescence microscopy can be exploited to examine cellular function, with an emphasis on subcellular dynamics of organelles and proteins. Topics will include fluorescent techniques for visualizing: mitochondrial structure/function, cytoskeletal dynamics, endocytosis and vesicular trafficking, protein trafficking and degradation, and cell signaling.

B05 Microscopy of Medical Devices and Biomaterials

Gabe M. Lucas, Coralee McNee, Rik Brydson

Invited Presenters:

  • Linn Hobbs, Massachusetts Institute of Technology
  • Michael Reid, Stryker Orthopaedics
  • Scott Lieberman, Exponent
  • David Jones, Stryker
Spanning the worlds of engineered materials and organic life, the design and manufacture of medical devices and biomaterials presents a unique set of problems and solutions for the microscopist. This symposium will focus on the microscopy techniques used in evaluating these novel systems from manufacture to implementation and interval evaluation through device failure. Biomedical devices include sensors, orthopedic, cardiovascular and neurological devices, medical instrumentation, endoscopic and minimally invasive devices. Biomaterials are substances engineered to take a form which is used to direct the course of therapeutic or diagnostic procedures by control of interactions with components of living systems. Biomaterial research includes polymer engineering, drug and gene design, immunology and self-assembly at the nanoscale. Contributions are encouraged from developing research to best industrial practices.

B06 Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals

Patricia E. Kysar, W. Gray Jerome, Michael P. Goheen

Invited Presenters:

  • Jennifer Gaddy, Vanderbilt University School of Medicine
  • Charles Humphrey, CDC
  • Chang Hyun Khang, University of Georgia
  • Xiao-Ming Yin, Indiana University
  • Jay Potts, University of South Carolina
  • Eric Wartchow, Children's Hospital
  • Carrie Phillips, Indiana University
Microscopy is not only useful but critically important in the ongoing research on basic mechanisms for detection, diagnosis and treatment of disease. Advances that improve rapid and accurate detection and treatment often involve the use of various microscopic techniques. These varied techniques provide us with an improved ability to diagnose and research the origins, development and response of diseases in human, plant and animal specimens. This is an opportunity to share information on the investigation of pathogenic cells, tissues and entire organisms in clinical, diagnostic and research laboratories. Emphasis will be placed on both rapid detection and improvements in methodologies.

B07 Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Alejandra Camacho, Charles D. Humphrey

Invited Presenters:

  • Madeline Dukes, Protochips
  • Daniele Musumec, University of Wisconsin-Madison
  • Skip Palenik, Microtrace LLC
  • John Bruce Green, Baxter Healthcare
  • Rober Carlton, GlaxoSmithKline
Pharmaceutical research and development presents unique challenges that have lead to the development of highly specialized analytical methods. This symposium will present applications of microscopy associated techniques to biological and materials science problems that arrive during drug discovery, vaccine research, formulation and production. In addition to presentations by invited speakers, an informal forum will be provided for sharing of thoughts and strategies related to regulatory, throughput, archiving and other issues faced in our laboratories. Contributed papers for platform or poster presentation on related topics are also welcome.

Physical Sciences Symposia

P01 The Art in Microscopy and Microanalysis

Alex D. Ball, John F. Mansfield

Invited Presenters:

  • George Vander Voort, Struers Inc
  • Carol Hirschmugl, University Wisconsin
  • Letizia Monico, University of Antwerp (Belgium); CNR-ISTM/University of Perugia (Italy)
The preservation of cultural historical artifacts is essential in the maintenance of mankind's cultural heritage. Annually, millions of people visit historical cities, archeological sites, museums and libraries around the globe. Maintaining and restoring artifacts in these institutions is a continuous process. Technological advances of both the 20th and early 21st centuries have provided new tools to study the materials, manufacture and deterioration of historical artifacts. This symposium will focus on the application of microscopy and microanalysis techniques to aid cultural heritage research, principally in the areas of conservation, maintenance, provenance and restoration. Materials of study may include: naturally occurring materials, such as wood, stone and minerals; man-made or manipulated materials such as metals, coinage, jewelry, ceramics (porcelain and pottery), glass, textiles, paper, paint and pigments or building materials and structures.

P02 Structure and Composition Analysis of Nanoparticulate Systems

Miaofang Chi, Chris J. Kiely, Jimmy Liu

Invited Presenters:

  • Beth Guiton, U. Kentucky
  • Larry Allard, Oak ridge Naitonal Laboratory
  • Gianluigi Botton, McMaster
  • Miguel José-Yacamán, University of Texas"
  • Alexandre Gloter, Laboratoire de Physique des Solides, Orsay, Paris.
  • Paul Midgely, U. Cambridge
  • Renu Sharma, NIST
  • Robert Schlogl, Fritz Haber - Berlin
  • Stig Helveg, Haldor Topsoe
Our understanding of nanoparticles and nanoparticuate systems has been greatly improved due to the recent advance in microscopy techniques, especially aberration-corrected electron microscopy and associated in-situ or chemical analysis techniques. This symposium aims to provide a platform to discuss recent progresses and current limitations on our understanding of the properties of individual nanoparticles and nanoparticulate systems. This symposium welcomes contributions from all aspects of advanced EM characterization of nanoparticles, with special emphasis on: Imaging and chemical analysis of nanoparticles with atomic-scale resolution; investigation of surface and sub-surface structures of nanoparticles; New approaches (e.g. low-voltage, low-dose, low-temperature) to minimize beam-induced effects in nanoparticulate systems, advanced image/spectrum processing and simulation methods for nanoparticles, and complementary in-situ techniques for analyzing nanoparticles under working conditions.

P03 Imaging the Hard/Soft Materials Interface: Challenges and Solutions

David C. Bell, Emmanuelle A. Marquis

Invited Presenters:

  • Antonio Nanci, University of Montreal Dental School
  • John Bartlett, The Forsyth Insitiute
  • Derk Joester, Northwestern University
  • V. K. Berry, Dow Chemical
  • Ray Egerton, University of Alberta
  • Juan-Carlos Hernandez-Garrido, Universidad de Cadiz
The issues of imaging the hard /soft materials interface has been around for many years, damage to soft materials and lack of contrast being one of the many issues. Advances now enable this regime to be imaged with usable contrast as not previously possible. The design and discovery of such new hybrid materials is becoming increasingly important, new developments in microscope design and improvements to existing technologies will be covered. The platform will focus on the high spatial and spectroscopic advantages of electron microscopy techniques as well as the challenges of damage in regards to the characterization of hard/soft interfaces materials.

P04 Deriving Fundamental Catalyst Properties from Electron Microscopy

Ilke Arslan, Larry F. Allard, Abhaya K. Datye

Invited Presenters:

  • Chris Kiely, Lehigh University
  • Jimmy (Jingyue) Liu, Arizona State University
  • Krijn de Jong, Utrecht University
  • Wharton Sinkler, UOP LLC
  • Robert Schlögl, Fritz-Haber-Institut der Max-Planck-Gesellschaft
  • Libor Kovarik, Pacific Northwest National Laboratory
Catalysis is an extremely complex science. In order to be able to design the next generation of catalysts that provide exceptional activity or selectivity, their fundamental properties must be understood at the atomic, electronic, and 3-D scales, and under in situ operating conditions. With the recent advancements in environmental microscopes and stages, understanding of catalysts is reaching new levels, including the observation of atomic motion in gas environments. We solicit contributions on applications of TEM, especially using aberration-corrected imaging, electron tomography, in situ imaging, and spectroscopic methods that advance our understanding of catalytic materials and provide clues for the optimized design of future catalyst systems.

P05 Microstructural Characterization of Metals — 150 Years After Sorby

George F. Vander Voort, James E. Martinez

Invited Presenters:

  • Joseph Goldstein, University of Massachusetts
  • Arun Gokhale, University of Georgia Tech
  • Alexander Kazakov, St. Petersburg State Politechnical University
  • Scott Sitzman, Oxford Instruments America, Inc
  • Clem Forget, Clemex Technologies Inc.
  • David Williams, The Ohio State University
  • Stefan Zaefferer, Max Planck Institute for Iron Research
On 28 July 1863, Henry Clifton Sorby announced to the world that he had observed the microstructure of iron and steel specimens and had identified (correctly) seven of the main constituents. Sorby was the first person to successfully prepare iron and steel specimens damage-free so that he could properly observe and characterize the structure. To document what he saw, hand-drawn sketches were the only option. On the centennial of this momentous event, six societies in the UK organized a symposium in Sheffield and four societies in the US organized a symposium in Cleveland. 2013 will mark the sesquicentennial of this historical event. Papers are being sought discussing the growth of microstructural characterization since 1963 in the area of metallography, and relating to the developments over the last fifty years in scanning electron microscopy, electron backscattered diffraction, electron microprobe analysis and transmission electron microscopy, as they relate to microstructural characterization and quantification of metals.

P06 Failure Analysis of Structural Materials: Microscopy, Metallography and Fractography

Brett A. Miller, Daniel P. Dennies

Invited Presenters:

  • Nick Cherolis, Rolls Royce Corporation
  • Eric Guyer, Exponent, FaAA
  • William Kane, Exponent, FaAA
  • Quinn Horn, Exponent, FaAA
  • Paul DeVries, The Boeing Company
Failure analysis of structural materials is an essential component of any design, manufacturing or research endeavor. Observable microstructures and fractographic morphology provide clues to prior material processing and changes to the material due to service or research, as well as identifying anomalies and flaws. Prevention of additional failures and research advancements are very often contingent on correct identification of material characteristics through microscope evaluation. The aim of this symposium is to highlight the use of metallographic and microscopic characterization techniques to provide insight into failures of metallic and nonmetallic materials during service applications or research.

P07 Special Problems and Solutions: Coatings, Ceramics and Polymers

John Sauer, Richard E. Chinn

Invited Presenters:

  • Earl Sanford, Corning, Inc.
  • Brian Gorman, Colorado School of Mines
  • Lucille Giannuzzi, L.A. Giannuzzi & Associates LLC
Compositions, fabrication processes and applications are continually under development in the ceramic plastic, and coatings worlds with the aid of conventional imaging of microstructures and experimental analysis. Emerging imaging techniques often reveal mechanisms and other details of these developments, especially when at least one dimension is on the micro or nano scale. This session showcases what is new in ceramography, plastography and coating analysis.