M&M 2017

2017 Pre-Meeting Congresses

  • Separate registration fee required; see registration information on website, and form for details (form available March 1, 2017).
  • See individual listings below for information on meals and breaks.


X60 Inaugural Pre-Meeting Congress for Early Career Professionals in Microscopy & Microanalysis

Saturday, August 5, 2017 * 8:30 AM to 5:00 PM
Included in Registration Fee: Breakfast, AM Break, Lunch, PM Break
(Offsite social gatherings are being planned for Friday and Saturday evenings, as well.)

Organized by MSA Student Council

Program Chair: William J. Bowman, Arizona State University
Program Co-Chair: A. Cameron Varano, Virginia Tech (Biological Sciences)
Program Co-chair: Janet L. Gbur, Case Western Reserve University (Physical Sciences)
Activities & Social Chair: Ethan L. Lawrence, Arizona State University

To commemorate MSA’s 75th anniversary, the Student Council is organizing an inaugural pre-meeting congress for early career professionals in microscopy & microanalysis, to be held on the Saturday preceding the M&M 2017 in St. Louis, MO. The event will be preceded by an informal get-together on Friday night, where participants can meet in a relaxed setting, and is scheduled to allow those interested to attend a Sunday short course or FIG-sponsored pre-meeting congress, or to enjoy a day in St. Louis with new friends.

This congress is organized by early career professionals, primarily for early career professionals, though all M&M registrants are welcome to attend. The pre-meeting will offer a highly interactive forum for participants to share cutting edge research, network, and engage with peers ahead of the main meeting. Invited speakers will be selected from among awardees to be honored at M&M 2017, giving attendees an opportunity to experience a sampling of the best research to be presented by their peers across scientific disciplines in biological science, physical science, analytical science and instrumentation. Contributed talks and posters will give attendees an opportunity to discuss their work with peers in an intimate and highly interactive setting. Further professional development opportunities will include a luncheon featuring a panel of recent graduates currently working in industry, academia, policy, and government labs.


X61 Focused Ion Beam Applications and Equipment Developments

Sunday, August 6, 2017 * 10:00 AM – 5:00 PM
Included in Registration Fee: Lunch, PM Break

Organized by the Focused Ion Beam (FIB) Focused Interest Group

Nicholas Antoniou, Revera
Srinivas Subramaniam, Intel Corporation

Focused Ion Beam technology is used in a variety of fields from electronics to life sciences. The applications space can be divided into categories such as cryogenic FIB, Direct-write lithography, 3D structure creation etc. The topics will be grouped together into sessions as follows:

  • TEM Sample prep
  • Cryogenic FIB-SEM
  • FIB Lithography and general patterning
  • Gas Assisted etching and deposition
  • Instrumentation, other

One hour will be allotted to each category with 2-3 papers and 20 minutes of open discussion. At the end of the congress, posters will be set up for informal interaction with the authors and participants.


X62 Smaller, Faster, Better: New Instrumentation for Electron Microscopy

Sunday, August 6, 2017 * 8:30 AM – 5:00 PM
Included in Registration Fee: Breakfast, AM Break, Lunch, PM Break

Organized by the Aberration-Corrected Electron Microscopy (ACEM) Focused Interest Group

Paul Voyles, University of Wisconsin
Huolin Xin, Brookhaven National Laboratory
Juan-Carlo Idrobo, Oak Ridge National Laboratory
Phil Rice, IBM

Developments in instrumentation drive new science. Now, two decades after the first working aberration correctors, this pre-meeting congress will address the question, what’s next? Topic covered will include advances in: detectors, especially high-speed pixelated and segmented detectors; monochromators to achieve energy resolution below 10 meV; aberration correctors, especially at low voltage; fast beam manipulation, especially for compressed sensing; and high brightness sources. Example applications and supporting advances in data processing and simulation will also be included. The meeting will consist of invited talks and a poster session.


X63 Understanding Radiation Beam-Damage during Cryo-, ETEM, Gas- and Liquid-Cell Electron Microscopy

Sunday, August 6, 2017 * 8:30 AM – 5:00 PM
Included in Registration Fee: Breakfast, AM Break, Lunch, PM Break

Katherine Jungjohann, Sandia National Laboratories
Taylor Woehl, University of Maryland
Patricia Abellan, SuperSTEM Laboratory (UK)

Electron-beam induced radiation damage to gases, liquids, and vitrified ice is a technical problem for the electron microscopy (EM) study of natural and engineered structures as they exist in their ambient environments. This one-day congress is designed to provide insight into the processes that occur when a high-energy electron beam interacts with a material, its gas/liquid/solid embedding medium and the interfaces between them. Steady-state radiation conditions will be evaluated in terms of temperature variations, external probing, mass transport, and imaging modes for describing the reactive system. Speakers will highlight the electron-dose threshold tolerances, low-LET ionizing radiation effects, damage mechanisms, prevention, and control of radiation effects for small volume environmental studies. The format will consist of invited presentations from radiation chemists and individuals with significant contributions to understanding electron-beam effects for environmental EM and in-situ x-rays cells. The congress will feature a lunch-time poster session and a panel discussion to identify the major challenges going forward, and should be of interested to EM researchers in the areas of cryo-EM, ETEM, gas-cell EM and liquid-cell EM.


2017 Sponsors