Microscopy & Microanalysis 2009 Meeting
July 26-30, 2009
Richmond, Virginia, USA
In-Week Intensive Workshops
 GFP Cytochrome C in BHK cells Courtesy of Brian Herman |
These in-depth courses will be held Monday-Thursday from 1 to 5PM. A certificate of participation will be issued to each participant. The course fee is $860 ($950 after June 15, 2009) and includes full registration to M&M 2009.
Download PDF Flyer of Workshops Here
X-20 Basic Confocal Light Microscopy - Once More, Jay and Silent Bob do Basic Confocal Microscopy
Jay Jerome and Bob Price
Confocal microscopy has become a primary method for visualizing structure in three dimensions. The technology is rapidly evolving with new instruments, lasers, detectors, and spectral imaging capabilities. Bob and Jay will instruct beginning and intermediate researchers on carrying out successful biological confocal microscopy experiments. Emphasis will be on practical aspects of specimen preparation, instrument setup and operation and enhancement and analysis of the digital images collected by confocal microscopy. A general knowledge of optical microscopy is helpful, but no prior knowledge of confocal microscopy is necessary to benefit from the workshop.
X-21 Introduction to SEM imaging and x-ray compositional analysis
David Joy, Nicholas Ritchie, and John Mansfield
This introductory level workshop will involve classroom lectures and live demonstrations. The SEM topics will be taught by David Joy and will cover basic instrument operation and imaging modes. The EDS topics will be taught by Nicholas Ritchie and will cover basic compositional analysis using an SEM with energy dispersive x-ray spectrometer. The lessons in the lectures will be complemented with hands on demonstrations of SEM operation and x-ray microanalysis by John Mansfield. Demonstrated topics will include the effects of working distance, accelerating voltage, probe size, imaging detector, detector bias, probe current, dead time, detector choice, sample geometry, etc.
X-22 Nanomaterial Microscopy & Microanalysis: Tools and Preparation
Phillip Russell and Donovan Leonard
With the wide variety of analytical instrumentation available, the selection of the correct ÒtoolÓ for analysis of nanomaterials is critical. By introducing various microscopy and microanalysis methods this workshop should provide a solid foundation for nanomaterial characterization for the beginning to intermediate investigator. The importance of choosing the proper preparation technique, to minimize introduction of artifacts and ensure that representative samples are identified for subsequent analysis, will also be discussed.
X-23 High-resolution TEM
Instructor: David Bell and Yimei Zhu
Modern-day electron microscopes can routinely produce lattice fringes at the 1� level or better. However, obtaining useful structural information at similar length scales requires a basic understanding of imaging theory and a working knowledge of microscope operation and correct adjustment methods. The first part of the workshop will concentrate on these basic aspects of HRTEM. Later topics to be covered will include recent progress towards quantitative electron microscopy, an introductory overview of aberration-corrected electron microscopy using either hardware or software methods, and a brief review of related HRTEM methods.
