Microscopy & Microanalysis 2009 Meeting
July 26-30, 2009
Richmond, Virginia, USA
Summary of the Scientific Program
 Sub Angstrom Resolution in Diamond Courtesy of Michael A. O'Keefe |
The Microscopy & Microanalysis 2009 meeting will be preceded on Sunday, July 26, with several full-day short courses. Topics are electron tomography, cryo EM, digital imaging, FIB methodologies, variable pressure and environmental SEM imaging and analysis, and interpretation of metallographic microstructures.
To officially start the meeting, a plenary session will be held Monday morning, July 27. The keynote speaker is Dr. Tom Pike of Imperial College London. Dr. Pike helped design and build the microscope station that was launched with the Phoenix Lander in 2008. In his talk, The Phoenix Mission: Microscopy on Mars, Dr. Pike will discuss the major results of the Phoenix Mars mission with particular emphasis on the data returned from the microscope station.
To honor the passing of one of our prominent colleagues, the symposium on advances in detectors will be dedicated to the memory of David Wittry. Also, to honor the birth centennial of Otto Scherzer, the symposium on aberration-corrected electron microscopy will be dedicated to him.
Over thirty symposia will address applications in both the biological and physical sciences and recent and emerging trends in instrumentation and techniques. In addition, contributed sessions will be organized to encompass fields of study not covered by the topical symposia.
Again, the poster sessions will offer the best opportunity for a one-on-one discussion with your colleagues. These sessions will be held Monday through Wednesday from 3:30-5:00 PM in the Exhibit Hall. Beverages will be available during this time.
A new tutorial series, "Back to the Basics" will be introduced at M&M 2009. These 1-hour sessions will cover the fundamentals of cryo-EM, the capabilities of TEM, and FIB sample preparation. In addition, other tutorials scheduled are imaging process and interpretation in 3D EM, sample preparation for material scientists, and career development for the scientific professional.
Four in-week intensive workshops will be held Monday-Thursday from 1:00-5:00 PM. These will cover basic confocal LM, introductory SEM imaging and X-ray compositional analysis, tools and preparation for nanomaterial microscopy and microanalysis, and high-resolution TEM.
Other educational opportunities include two round table discussions. One will discuss artifacts and the second covering low cost options for cryotechniques.
Microscopy and Microanalysis
Microscopy and Microanalysis publishes original research papers dealing with a broad range of topics in microscopy and microanalysis. These include articles describing new techniques or instrumentation and their applications, as well as papers in which established methods of microscopy or microanalysis are applied to important problems in the fields of biology or materials science. Microscopy and microanalysis are defined here in a broad sense, and include all current and developing approaches to the imaging and analysis of microstructure. The criteria for acceptance of manuscripts are the originality and significance of the research, the quality of the microscopy or microanalysis involved, and the interest for our readership.
Editor in Chief: Charles E. LymanMicroscopy Today Microsopy Today is an MSA magazine that provides material of interest and value to working microscopists in all fields. The magazine is free to microscopists in the US and MSA members worldwide.
Phone: 610-758-4249
e-mail: charles.lyman@lehigh.edu
Editor in Chief: Ron Anderson
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