Sustaining Member News

X-Max Large Area Silicon Drift Detector for Analytical TEM

Oxford Instruments’ X-Max large area Silicon Drift Detector (SDD) is now available for the analytical TEM. The ability to handle high count rates in a liquid nitrogen free environment, combined with INCAEnergy TEM software, ensures X-Max will maximize the performance of a TEM. An 80mm2 sensor guarantees high counts giving excellent analytical performance down to and including Be. In contrast to Si(Li) detectors, excellent energy resolution is maintained at high count rates over 100,000cps. High quality X-ray maps and linescans can be collected much more rapidly.