Sustaining Member News

FEI's New Tecnai Osiris TEM Sets New Standards

FEI's New Tecnai Osiris TEM Sets New Standards for Speed in Analytics NEWS_TEXT — FEI's Tecnai Osiris™ scanning/transmission electron microscope (S/TEM), delivers revolutionary analytical speed and performance. It includes FEI's new ChemiSTEM technology, which reduces the time for large field-of-view elemental mapping from hours to minutes. The Tecnai Osiris is designed to combine this breakthrough analytical throughput with exceptional ease-of-use to meet the requirements for both high-volume industrial and multi-user research laboratories.

The patent-pending ChemiSTEM technology enables the Tecnai Osiris to achieve a factor of 50 or more enhancement in speed of energy dispersive x-ray (EDX) elemental mapping, by combining technical advances in beam generation with disruptive changes in EDX signal detection. The Tecnai Osiris is built on a platform designed to maximize productivity and return on investment in high-volume analysis.