Sustaining Member News

FEI Takes Ultimate Performance to New Limits

FEI has released the Titan™ G2 scanning/transmission electron microscope (S/TEM) Family, inaugurating the second generation of the company's revolutionary Titan platform?the world's most powerful commercially-available microscope. The Titan G2 incorporates a number of innovative technology modules in order to deliver resolutions down to 70pm (0.7 Ångström) in both STEM and TEM, thus offering the ultimate in aberration-corrected S/TEM performance.

The Titan G2 60-300 Family offers the choice of second-generation spherical-aberration (Cs) probe and Cs image correction, and in the base configuration, it delivers 80pm specified resolution in both TEM and STEM operation. With the addition of novel FEI proprietary technology modules, such as a high brightness electron source, a monochromator and an environmentally-isolated microscope enclosure (Titan3™ G2 60-300), specified resolution improves to 70pm in either STEM or TEM modes. This configuration delivers the ultimate commercial S/TEM performance, setting records in spatial resolution, energy resolution for analytics and high tension range. Further, the environmentally-isolated configuration is equipped with a unique, fully-remote operation capability, ideal for maintaining the microscope under stable conditions, and can also be used for sharing the results in real-time across a collaborative team that is spread across a number of locations.