Full Symposia Descriptions & Program Information

Biological Sciences Symposia

B01 Super Resolution Microscopy — Principles and Practice
Jim Galbraith

Invited Speakers:

  • Mark Ellisman, UC-San Diego
  • Jim Galbraith — National Institutes of Health
  • George Patterson — National Institutes of Health
  • Vlad Verkhusha — Albert Einstein College of Medicine
  • Travis Gould — Yale University
  • Erik Jorgensen, University of Utah
  • Hesper Rego, Harvard University
  • Peter Kner, University of Georgia
  • Jeri Timlin, Sandia National Laboratories
  • Gleb Shtengel, Janelia Farm

Super resolution microscopy breaks the diffraction barrier imposed in traditional light microscopy. It is now possible to visualize individual molecules within dense ensembles with molecular specificity. Although commercial systems are becoming available, the techniques are still maturing and the field is highly dynamic. This symposium will cover topics ranging from recent technical advances to practical considerations for imaging biological specimens.

B02 Near Field and Single Molecule in Life Sciences
Erik Sánchez, Jordon Gerton

Invited Speakers:

  • Reuven Gordon, University of Victoria
  • Bennett Goldberg, Boston University
  • Laura Estrada, University of California, Irvine
  • Derek Nowak, Portland State University
  • Markus Raschke, University of Colorado-Boulder

Optical microscopy has developed considerably over the past couple of decades — the normal far-field resolution limit of l/2 has been broken by many recently developed techniques. Among these new methods is near-field optical imaging, which offers the ability to image at spatial resolutions on the order of tens of nanometers using optical wavelengths. This super-resolution technique can be applied to biological living organisms in aqueous environments, as well as to inorganic and semiconductor samples. The key mechanism behind this technique involves the manipulation of the propagation of light with the use of plasmons for a localized field enhancement or field confinement. This session will cover the latest techniques being developed which utilize these imaging concepts for the life sciences.

B03 TIRF Microscopy: Imaging Cell Biology and Molecular Dynamics at the Interface
Edward Stuenkel, Christian Merrifield, and David Perrais

Invited Speakers:

  • Wolfhard Almers, Oregon Health & Science University
  • Ronald Holz, University of Michigan
  • Jennifer Ross, University of Massachusetts
  • Nancy Thompson, University of North Carolina
  • Christien Merrifield, University of Cambridge

Total internal reflection fluorescence (TIRF) imaging provides unparalleled confinement of fluorescent excitation to a near interface region. Its use has provided powerful insight into dynamic interactions of molecules near the substrate surface, provided unmatched resolution of organelle movement and activity at cell membranes, and facilitated direct monitoring of clustering, mobility and activity of integral membrane molecules. This symposium will explore the development and use of TIRF specifically in biological applications, particularly for resolution of single molecule dynamics, vesicle movement and membrane fusion, and cystoskeletal assembly and function. Included is an integration of TIRF with approaches (FRET) defining molecular interactions and mobility towards developing physiological function.

B04 Ciliopathies In Different Organs and Organisms
Surya Nauli and Caroline A. Miller

Invited Speakers:

  • Vincent Gattone, Indiana University
  • Diego Rodriguez-Gil, Yale University
  • Jagesh Shah, Harvard University
  • Andrew Resnick, Cleveland State University

This symposium using modern advances in imaging concentrates on those organ systems requiring normal cilia function. These systems include; respiratory tract, ear, eye, reproductive organs, kidney and cerebral ventricles. Dysfunctional cilia or flagella are responsible for several human diseases. Basic research has provided a greater understanding of how cilia function in normal and diseased organs. This symposium will highlight the advances in imaging from light to electron microscopy with the latest techniques being applied to advance our understanding of the role cilia play in cell and organ function.

B05 Visualizing Cancer and Surveillance: Intravital Imaging of Tissue Microenvironment
Alex Y. Huang and David Piston

Invited Speakers:

  • David Piston, Vanderbilt University
  • Francesco Marangoni, Massachusetts General Hospital
  • Bonnie Sloane, Wayne State University
  • Alex Huang, Case Western Reserve University
  • Roberto Weigert, National Institutes of Health

Cancer develops due to intricate interactions between the tumor cells and surrounding stroma through neo-vascularization, tissue remodeling, and evasion of immune surveillance. Advances in photonic and other imaging techniques have revolutionized how investigators study these processes in vivo. For example, intravital two-photon microscopy provides an important tool for interrogating individual tumor interaction with immune cells and surrounding stroma. Other microscopic methods allow the molecular detection of tumor cell behavior and function. In addition, new imaging agents allow sensitive detection of cancer in vivo. Efforts in the applications of these and other cancer imaging methods will be presented at this symposium.

B06 3D Structure of Macromolecular Assemblies, Cellular Organelles and Whole Cells
Jun Liu, Teresa Ruiz and Phoebe Stewart

Invited Speakers:

  • Elizabeth Wright, Emory University
  • Melissa Jurica, UC-Santa Cruz
  • Peijun Zhang, University of Pittsburgh
  • Paula da Fonseca, Institute for Cancer Research
  • Montserrat Samso, Virginia Commonwealth University
  • Timothy Baker, UC-San Diego

We are advancing the basic understanding of 3D structures of macromolecular assemblies, viruses and cells, as well as their communication with the host environment, through advanced EM techniques and hybrid methodologies. This symposium will highlight structural studies of macromolecules and macromolecular assemblies using electron tomography; electron crystallography; single-particle EM analysis; EM helical reconstruction; light microscopy; atomic force microscopy and X-ray crystallography. Topics will include cellular metabolism, cell division and protein translation; cellular and bacterial adhesion; flagellar and filopodial motility; secretion systems; cell-cell communication and cell signaling; virus structure and virus-host interactions.

B07 Multi-scale Approach to Amyloid Diseases
Martin Muschol, Helen McNally and George Perry

Invited Speakers:

  • Yuri Chernoff, Georgia Tech
  • Chad Dickey, University of South Florida
  • Vladimir Kepe, UCLA
  • Yuri Lyubchenko, University of Nebraska

Topics will include:

  • Monitoring amyloid self-assembly at the molecular level
  • Regulation of amyloid formation and degradation in cells
  • Amyloid formation in animal models
  • In vitro detection of amyloid formation
  • New approaches towards characterizing amyloids and their
  • intermediates
  • Mechanisms of cell and tissue toxicity in amyloidosis

B08 Imaging Mitochondria and other Organelles in Health and Disease
Heide Schatten

Invited Speakers:

  • George Perry, University of Texas — San Antonio
  • Xiongwei Zhu, University of Texas — San Antonio
  • Heide Schatten, University of Missouri
  • Paul Walther, Universität Ulm
  • Michael Davidson, Florida State University
  • Shadi Zahedi, University of Toledo

This symposium will cover:

  • Advances in imaging organelle dynamics (mitochondria, peroxisomes, Golgi, centrosomes and others) with TEM, SEM, AFM and various forms of light microscopy, including confocal and multiphoton microscopy
  • Novel imaging techniques including live cell imaging with molecular markers
  • Organelle abnormalities in various diseases of the immune system, reproduction, cancer, neurological disorders and others

Physical Sciences Symposia

P01 A.V. Crewe Memorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond
Mike Isaacson and Ondrej Krivanek

Invited Speakers:

  • Mike Isaacson, UC Santa Cruz
  • Elmar Zeitler
  • Vernon Beck
  • Joe Wall, Brookhaven National Laboratory
  • Steve Pennycook, Oak Ridge National Laboratory
  • Akira Tonomura, Hitachi
  • David Muller, Cornell University
  • Ondrej Krivanek, NION

The Crewe symposium will commemorate the work of Albert Victor Crewe (1927-2009), whose influence on electron microscopy has been profound. The revolutionary scanning transmission electron microscope (STEM) with a bright cold field emission gun (CFEG) was invented by Crewe and designed and built in his laboratory at the University of Chicago. It is now the instrument of choice for detailed explorations of the nano-world. The work in Crewe's laboratory on STEM and aberration correction will be remembered, and the way these techniques are pushing today's research towards new frontiers will be showcased.

P02 Structural and Physical properties of Thin Films, Interfaces, and Grain Boundaries
Klaus van Benthem and Naoya Shibata

Invited Speakers:

  • Yiuchi Ikuhara, University of Tokyo
  • Gerhard Dehm, University of Leoben
  • Xiaoxing Pan, University of Michigan
  • D.L. Medlin, Sandia National Laboratories
  • Rafal Dunin-Borkowski, TU Denmark
  • Knut Urban, FZ Juelich
  • Wayne Kaplan, Technion
  • Andrew Thron, UC-Davis

This symposium will focus on microscopy of structural and functional thin films, including multi-layers and intergranular films. Invited and contributed presentations will report latest results for characterization of wetting/dewetting behavior, fundamental structural properties of homophase and heterophase grain boundaries and interfaces. The goal of this symposium is to stimulate a detailed discussion about the current understanding of the correlation of atomic interface structures and the corresponding macroscopic physical properties of the associated microstructures. Reports about in situ characterizations of the evolution of thin films and interface properties under various experimental conditions, such as modified temperatures, electrical fields, mechanical stress, etc. are especially encouraged.

P03 Microanalysis of Cement and Concrete Materials: State of the Art, Methodologies and Standardization
Luisa Amelia Dempere and Jeff Davis

Invited Speakers:

  • Paul Stutzman, NIST
  • Bernd Moeser, Bauhas-Universitaet Weimar
  • Willenberg Bradley, University of Florida
  • Karl Peterson, University of Toronto

Analysis of cement and concrete represents a unique microanalytical challenge, replete with multiple phases in semi-ordered formations at spatial ranges from nanometers to centimeters. Advancement of microanalytical methods and techniques to characterize the evolving and complex chemistry of cement and concrete has significant practical implications. This symposium will focus on the analysis of cement/concrete systems, as well as the presentation of new techniques, instruments and methods that can assist researchers working with cement and concrete microanalysis. The organizers welcome contributions from researchers using optical and electron microscopy, microanalysis, X-ray and synchrotron methods. Contributions from students are welcomed and encouraged.

P04 Imaging and Spectroscopy of Carbon-based Nano-materials and Devices
Moon Kim and Ray Carpenter

Invited Speakers:

  • Ute Kaiser, University of Ulm
  • Seongyong Park, Samsung Advanced Institute of Technology
  • Renu Sharma, NIST
  • Rhonda Stroud, Naval Research Laboratory
  • David Muller, Cornell University
  • Jianyu Huang, Sandia National Laboratory

Microelectronics and functional device research have clearly evolved to nanoscience. With reductions in device scaling, the use of new materials such as carbon nanotubes and graphene is bringing enormous new challenges to characterization required to bring systems to production. This symposium solicits papers on high resolution characterization of carbon-based materials and devices engineered for future and current cutting edge generation electronic and opto-electronic devices.

P05 Imaging and Spectroscopy of Energy-related Nanomaterials
Frederic Cosandey and Jason Graetz

Invited Speakers:

  • Daniel Abraham, Argonne National Laboratories
  • Loic Dupont, Universite Picardie
  • Shirley Meng, UC San Diego
  • Shunsuke Muto, Nagoya University
  • Ian Robertson, University of Illinois
  • Chongmin Wang, Pacific Northwest Laboratory
  • Yimei Zhu, Brookhaven National Laboratory

This symposium will focus on recent developments in microscopy (high resolution imaging and diffraction) and spectroscopy (EDS and EELS) applied towards understanding structure-property relationships in energy related nanomaterials. Topics of interest include novel energy storage and Li-ion battery materials, fuel cell and hydrogen storage materials, photovoltaic and solar cell materials and thermoelectric materials. Submission of papers on these topics using novel spectroscopy instrumentation or in-situ techniques is especially encouraged.

P06 Failure Analysis: Applications of Electron and Optical Microscopy
Michael He, Gabe Lucas, and Dave Norfleet

Invited Speakers:

  • George Vander Voort, Stuers, Inc.
  • Rich Schreiman, Rexnord
  • Clara Wright, NASA
  • Alexander Karakov, Thixomet
  • Chirag Shah, Exova
  • Arun Gokhale, Georgia Tech

Microscopy is an essential tool for the failure analyst. From simple low magnification "macros" for documentation to the most sophisticated electron microscopy and spectroscopy techniques, microscopy plays a vital role in revealing the root cause of component failures. This symposium will cover all aspects of failure analysis including metallography, SEM fractography, and other forensic techniques (including NDE) for the interpretation of failures. Individual case studies as well as ongoing materials research are encouraged for submission. Failures and forensic analyses can be submitted from any field including transportation, energy, microelectronics, defense, etc.

P07 Microscopy and Microanalysis Applications in Cultural Heritage Research
John F. Mansfield, Ed Vicenzi, and Cathy Selvius DeRoo

Invited Speakers:

  • Nahoko Sugioka, Tokyo University of the Arts
  • Joris Dik, Delft University of Technology
  • Ainslie Harrison, Smithsonian Institute
  • Patrick Rivines, Buffalo State University
  • Andrew Lins, Philadelphia Museum of Art
  • Alex Ball, National History Museum (U.K.)

In recent years, the maintenance and preservation of cultural historical artifacts has become increasingly important as governments around the globe have recognized that mankind has, in general, failed to take sufficient care of the world's historical artifacts. Millions of visitors every year are attracted to historical cities, archeological sites, museums and libraries and there has long been an awareness of the importance of cultural heritage. However, the concept of actively maintaining and restoring artifacts did not take hold until the 19th century and the technological advances of the 20th century have provided new tools to study the materials, manufacture and deterioration of historical artifacts due to age and wear. This symposium will focus on where the application of microscopy and microanalysis techniques can aid cultural heritage research, principally in the areas of conservation, maintenance, provenance and restoration. Materials of study may include: Metals; ceramics (porcelain and pottery); building materials (stone, brick and mortar); glass; textiles; paper; paint and pigments; mineralogy; coinage and jewelry.

P08 Microscopy and Microanalysis Methods Applied to Joining Technologies
Paul Vianco and David Hillman

Invited Speakers:

  • Charles Walker, Sandia National Labs

Joining technologies provide many opportunities to apply non-destructive and destructive microanalysis tools to a wide range of materials challenges. Besides the microstructures of bulk materials, there are interface structures, diffusion regions, and heat affected zones that are critical to the mechanical performance of the overall system. This symposium will address the application of microscopy and microanalysis techniques to joining applications. Papers are sought that exemplify the use of such methods towards furthering our understanding of the roles of base materials, solidification microstructures, and interface reactions on the immediate as well as long-term performance of joining structures. This symposium will address joining technologies that include soldering, brazing, diffusion bonding, anodic bonding, and transient liquid phase bonding as well as all types of welded joints. Papers that describe new, innovative joining technologies are also welcomed. The organizers encourage the submission of results from research and development activities as well as from case studies and failure analyses. Topical areas will include commercial and military products as well as energy generation and conversion systems.

Instrumentation & Techniques Symposia

A01 EBSD Data Collection and Analysis on Challenging Materials and Applications
David Field, Steven Claves, and Scott Sitzman

Invited Speakers:

  • Natasha Erdman, JEOL
  • Carl Necker, Los Alamos National Labs
  • Greg Rohrer, Carnegie Mellon University
  • Pat Trimby, University of Sydney
  • Angus Wilkingson, Oxford University

Electron backscatter diffraction (EBSD) has been used as a commercially available analysis technique for over two decades and is increasingly common in physical science laboratories throughout the world. In spite of a growing population of expert practitioners there continues to be a number of materials for which performing EBSD measurements is particularly difficult. This arises either because of the nature of the crystallographic phases in the specimen or because of challenging specimen preparation such as is common in multi-phase or reactive materials. Additionally, advancements in instrumentation have enabled analyses approaching the resolution limits of the technique. As more investigators are encountering such difficult problems, this symposium offers an opportunity to come together to share experiences that can advance the current state of applications using EBSD.

A02 Opportunities and Advances for In-situ Experiments in Electron-Optical Instruments
Blythe Clark, Thomas Hansen, and Nestor Zaluzec

Invited Speakers:

  • Ian Robertson, UIUC
  • Daniel Gianola, U Penn
  • Charlotte Appel, Haldor Topsoe
  • Peter Crozier, Arizona State University
  • Dean Miller, Argonne National Labs

There is an ever-increasing demand for studying the properties of material and matter in their natural environment or when exposed to extreme conditions. Accomplishing this requires continual instrumental as well as technical advancements. The aim of this symposium is to consider and explore the pros and cons of innovative electron optical techniques for studying materials properties during in situ investigations, including exposure to elevated temperatures, ion irradiation, force, gas, liquids, or photons in both scanning and transmission instruments. Exemplified with problems from all sciences, the invited speakers will set the tone for pushing the capabilities of the experiments and instruments to the next level. This symposium is also open to contributed papers dealing with creative or pioneering in-situ studies in both hard and soft materials.

A03 Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing
Paul Carpenter, Raynald Gauvin, Edward Vicenzi, and John Fournelle

Invited Speakers:

  • Claude Merlet, Montpelier University
  • Xavier Llovet, University of Barcelona
  • Janos Labar, Hungarian Academy of Sciences
  • Ma Chi, Cal Tech
  • Gareth Seward, UC Santa Barbara
  • Karsten Goemann, University of Tasmania
  • Carl Henderson, University of Michigan
  • John Armstrong, Carnegie Institute of Washington
  • John Donovan, University of Oregon
  • Dale Newbury, NIST
  • Nicholas Richie, NIST
  • David Snoyenbos, Cameca Instruments
  • Hideke Takahashi, JEOL

Raimond Castaing defined the fields of microanalysis and microscopy by building the first electron-probe microanalyzer with wavelength-dispersive spectrometers, and made fundamental contributions to electron microscopy, an analysis of physics and the development of quantitative analysis, x-ray correction theory, electron-backscatter diffraction, SIMS, and applications of these instruments and concepts to real world samples. We celebrate these accomplishments within the framework of current and promising developments in these fields. We welcome contributed presentations by all those interested in microanalysis and microscopy, including researchers and students, and promise exciting and inspiring invited presentations by leaders in the field of microanalysis.

A04 Focused Ion Beam Symposium
Lucille Giannuzzi and Noel Smith

Invited Speakers:

  • Michael Phaneuf, JEOL
  • Frank Altmann, Fraunhofer Institute
  • Bruno Humbel, Universite de Lausanne
  • Richard Livengood, Intel Corporation
  • Shan Xu, Howard Hughes Medical Institute

Abstracts on all aspects of focused ion beams to further the understanding of the physical and life sciences are encouraged. Theoretical or experimental work on ion-solid interactions is appropriate. 2D or 3D FIB-based specimen preparation, applications, and analyses are welcome. New FIB-based nano and micro fabrication and prototyping techniques, software, or patterning topics also fit the symposium. Advances in new FIB instrumentation or methods such as light ion sources, high current ion sources, mass filtered ion sources or low energy ion milling are suitable for this session.

A05 Advancing Data Collection and Analysis for Atom Probe Tomography
Brian P. Gorman and Karen T. Henry

Invited Speakers:

  • Tom Kelly, Cameca
  • Micheal Moody, University of Sydney
  • Satya Kuchibhatla, Oak Ridge National Laboratories
  • Sergej Mutas, GLOBALFOUNDRIES Dresden, Germany
  • Greg Thompson, University Alabama
  • David Diercks, University of North Texas

Atom probe tomography is a rapidly advancing area of materials characterization. Hardware advancements in the recent past have allowed data acquisition of organic and insulating materials, but also difficulties in data interpretation and reconstruction. Reconstruction improvements through image analysis, finite element modeling, and cross-correlative techniques are beginning to improve the tomographic spatial resolution. Software based analysis techniques have opened up new avenues for small volume chemistry observations beyond traditional voxel summation methods. This symposium seeks contributions related to both software and hardware improvements to atom probe tomography data acquisition as well as data analysis techniques.

A06 Advances in EELS and EFTEM
Gianluigi Botton and Peter A. van Aken

Invited Speakers:

  • Koh Saitoh, Nagoya University
  • Vicki Keast, University of Newcastle
  • Wilfried Sigle, Max-Planck Institute
  • David Muller, Cornell University
  • Maria Varela del Arco, Oak Ridge

As nanoscale phenomena and structures become increasingly important for understanding the chemical and physical properties of ceramics, composites, geological materials, biomaterials and biological structures, careful integration of new characterization techniques and multidisciplinary approaches have become essential. Hence, this symposium aims to attract researchers to showcase contributions covering methods, theory and applications, both in materials and biological sciences, where recent improvements in electron energy loss spectroscopy and energy filtered TEM have been made in terms of energy and spatial resolution for chemical analysis, near-edge structures work, application of low-loss spectroscopy and instrumentation.

A07 Microanalysis Standards
Heather Lowers, Eric Steel, and Paul Carpenter

Invited Speakers:

  • Allen Kennedy, Curtin University of Technologuy
  • Tim Rose, Smithsonian
  • John Fournelle, University of Wisconsin, Madison
  • Axel Renno, Institute of Mineralogy, TU
  • Brian Gorman, Colorado School of Mines

Microanalysis standards are central to quantitative microscopy and microanalysis and are important in the fields of EPMA, SEM, EDS, WDS, optical, and atom-probe microscopy. Informal conversations with scientists reveal a general lack of knowledge concerning available standards and how they can be used in the modern laboratory. Many laboratories utilize commercial standard mounts with unknown provenance and are commonly up to 25 years old. Analysts may not be able to demonstrate the accuracy of microanalytical techniques used in their lab due to use of inappropriate standards or insufficient use of secondary standards. This session will highlight the availability of standard reference materials, ongoing studies of these and other microscopy and microanalysis standards, and issues related to their use in the laboratory. Discussions will also determine the needs of the scientific community for new standards for existing technologies as well as those needed for emerging technologies. This session forms the initial evaluation of topical materials which will be expanded in the planned MAS 2012 Topical Conference on Standards. A proposed round-robin analytical program will be initiated during 2011 with results presented at the MAS Standards TC in 2012.

A08 Remote & Collaborative Instrument Operation for Research, Teaching and Maintenance
John F. Mansfield and Gary M. Brown

Invited Speaker:

  • Sébastian Gautsch, École Polytechnique Fédérale de Lausanne

Since the mid-1990s, remote microscope control or remote collaboration has been attempted by many researchers. Initially, full computer control of microscope systems was in its infancy and remote operation systems required considerable specialized hardware, a suite of custom software applications, or both together. Nevertheless, these early pioneers were successful in laying the foundation for collaboratories, telepresence operation and remote teaching and learning. As we enter the second decade of the 21st century, microscope manufacturers have been able to take advantage of the advancements in computer technology, principally raw processor speed, to produce complex and sophisticated applications for instrument control. The much improved speed of the commodity Internet, in the past decade, has meant that remote operations and collaborations are now much easier for those early practitioners. However, there is still a certain degree of reticence exhibited by other members of the microscope community to embrace implementation of remote and collaborative systems. This symposium will highlight examples of research, teaching, training, service and maintenance by remote operation and collaboratory systems in a series of invited and contributed presentations. All are welcome to present their latest activities in remote control and collaboration.

A09 Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options
Brendan Griffin, David Joy, and Dale Newbury

Invited Speakers:

  • David Joy, Oak Ridge
  • Peter Statham, Oxford Instruments
  • Ralf Terborg, Bruker
  • Cornelia Rodenburg, University of Sheffield
  • Heiner Jaksch, Carl Zeiss
  • Raynald Gauvin, McGill University

This symposium will cover:

  • Developments in conventional and in-lens secondary electron detectors
  • Comparisons between conventional and angular-selective backscattered electron detectors
  • Imaging with x-rays using Silicon Drift Detectors
  • X-ray image resolution with field emission sources
  • Energy-filtered SE imaging applications for microanalysis

A10 Advances in 3D Electron Microscopy
Niels de Jonge, Christian Kuebel, and Alioscka Sousa

Invited Speakers:

  • Joost Batenburg, CWI
  • Mark Ellisman, UC-San Diego
  • Heiner Friedrich, Eindhoven Univ. of Technology
  • Werner Kuhlbrandt, Max Planck Institute of Biophysics
  • Richard Leapman, NIBIB, NIH
  • Andrew Lupini, Oak Ridge
  • Jens Mieler, Vanderbilt University
  • Paul Midgley, University of Cambridge
  • Jurgen Plitzko, Max Planck Institute

Three-dimensional electron microscopy (3D EM) is used both in biology and materials science to gain insight into structure-function relationships. This symposium aims to address forefront scientific and technological developments in the field of 3D EM, including tilt-series tomography, and single particle reconstruction. Several novel methodologies have been introduced in the past decade, including, for example, the use of phase-plate technology for 3D cryo-EM, scanning transmission electron microscopy (STEM) tomography, focal-series STEM, atom probe tomography, focused ion beam (FIB) sectioning combined with scanning electron microscopy (SEM). This symposium will also explore novel computational approaches for 3D reconstruction, segmentation and visualization as well as for the multi-scale merging of 3D data sets.

A11 Effects of Metallographic and Other Preparation Techniques on Microstructural Characterization
George Vander Voort, Sidnei Paciornick, and James Martinez

Invited Speakers:

  • Victoria Long, NASA
  • Tom Murphy, Hoeganaes Corp.
  • Alexander Kazakov, St. Petersburg State Polytechnical Univ

The realm of materials science offers many challenges for revealing and characterizing microstructures. The art and science of metallography continues to advance to meet these challenges with new automated techniques for new materials and traditional engineering alloys. This symposium will cover all aspects of specimen preparation for metals, ceramics, composites, polymers, microelectronics, and virtually any other material, as they influence characterization techniques. Contributions are welcome for all specimen preparation methods, not only mechanical grinding/polishing, such as ion-beam techniques. The effects of sample preparation on revealing and characterizing microstructure will be highlighted in this symposium including applications of light microscopy, image analysis, micro- and nano-indentation hardness, SEM imaging, EBSD or EDS, and any other relevant method.

A12 Advances in Electron Crystallography for Materials Research
Sergei Rouvimov, Wolfgang Neumann, Chongmin Wang and Peter Moeck.

Invited Speakers:

  • Jim Ciston, BNL
  • Paulo Ferreira, University of Texas at Austin
  • Angus Kirkland, Univ of Oxford
  • Thomas Lagrange, LLNL
  • Laurence Marks, Northwestern Univ.
  • Edgar Rauch, CNRS, Grenoble
  • John Spence, Arizona State Univ.
  • Amish Shah, Arizona State Univ.
  • Petra Specht, UCB
  • Jim Zuo, Univ of Illinois

Electron crystallography experiences a rapid growth due to increased demands for structure analysis of nano-crystals and advances in instrumentation. Aberration-corrected and computer controlled microscopes allow for automation while maintaining high resolution and high precision measurements and, thus, yield new exciting opportunities for crystallographic applications. This symposium will focus on advances in electron crystallography, its applications to organic and inorganic crystals, automated acquisition and handling of 3-dimensional electron diffraction data, nano crystallographic fingerprinting, precession electron diffraction, 3D diffraction tomography in real and reciprocal space and crystallographic data processing. The symposium will provide an opportunity to present papers on both metrology development and materials applications and feature a keynote talk on electron crystallography by Laurence Marks.

A13 Microscopy, Microanalysis, and Image Analysis in the Pharmaceutical Sciences and Diagnostic Microscopy
Andrew Vogt, Cindy Smith, Phoebe Stewart, and Karen Weidenheim

Invited Speakers:

  • Carolyn Larabell, UC-San Francisco
  • Beverly Maleef, GlaxoSmithKline
  • Rekha Panchal, US Army Medical Research Institute of Infectious Diseases
  • Robert Weaver, Sandoz inc.
  • Ty Abel, Vanderbilt Univ
  • Agnes Fogo, Vanderbilt University

Microscopy is playing an increasingly important role in both diagnostics and in drug discovery. The role of diagnostic microscopy in human, animal and plant disorders retains critical importance in today's world. Pharmaceutical research and development laboratories are at the forefront of science and have developed specialized technologies. This symposium will present a variety of biological and materials science applications of significance to the microscopy community. An informal forum will be provided for sharing of thoughts and strategies related to regulatory and other issues faced in our laboratories in addition to talks and posters by contributed and invited speakers.

A14 Equipment Funding Opportunities & Strategies for Success
Owen Mills and Christopher Gilpin

Invited Speakers:

  • Debby Sherman, Purdue Univ.
  • Shahbazian Yassar Reza, Michigan Technological Univ.

This symposium will cover:

  • Major research instrumentation funding opportunities
  • Grant application guidelines: follow the rules!
  • Strategies for success: increasing funding prospects
  • Do's and don'ts in proposal preparation
  • Lessons from successful and unsuccessful proposals

A15 Vendor Symposium: Tools for Science
Thomas Nuhfer and Stephen Mick

This symposium is designed for manufacturers and instrument vendors to showcase their new and improved products. Topics include:

  • New developments and technologies
  • Improvements for existing instrumentation
  • Breakthroughs and new instruments.

A16, A17, A18 Self-Assembled Sessions

Self-assembled sessions, organized among colleagues within a particular area of interest not addressed in the current slate of symposia, will be accepted depending on scientific interest as reflected by the quality and quantity of the contributed papers, and space and time availability during the meeting. Proposals for, or questions regarding Self-Assembled Sessions should be directed to:

Program Chair, David Giovannucci at MM2011ProgramChair@microscopy.org no later than February 15, 2011.

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