In-Week Intensive Workshops

Organizer: Mike Marko

  • These in-depth courses will be held Monday-Thursday from 1:00 PM to 5:00 PM.
  • A certificate of participation will be issued to each participant.
  • Four (4) Continuing Microscopy Education Units are available (registration fee $10).
  • The registration fee includes full registration for M&M 2012.

Workshop fees:
$600      Student (member or non-member; early or regular)
$980      Member, early registration
$1,100   Member, regular
$1,100   Non-member, early registration
$1,225   Non-member, regular

X-18 Introduction to SEM imaging and X-ray Compositional Analysis
David Joy and Brad Thiel
This introductory-level workshop will involve classroom lectures and live demonstrations. The SEM topics will be taught by David Joy and will cover basic instrument operation and imaging modes. The EDS topics will be taught by Brad Thiel and will cover basic compositional analysis using SEM with an energy dispersive x-ray spectrometer. The lessons in the lectures will be complemented with hands on demonstrations of SEM operation and x-ray microanalysis. Demonstrated topics will include the effects of working distance, accelerating voltage, probe size, imaging detector, detector bias, probe current, dead time, detector choice, sample geometry, etc.

X-19 Basic Confocal Light Microscopy
Jay Jerome and Bob Price
Confocal microscopy has become a primary method for visualizing structure in three dimensions. The technology is rapidly evolving with new instruments, lasers, detectors, and spectral imaging capabilities. Bob and Jay will instruct beginning and intermediate researchers on carrying out successful biological confocal microscopy experiments. Emphasis will be on practical aspects of specimen preparation, instrument setup and operation and enhancement and analysis of the digital images collected by confocal microscopy. A general knowledge of optical microscopy is helpful, but no prior knowledge of confocal microscopy is necessary to benefit from the workshop.

X-20 Nanomaterial Microscopy & Microanalysis: Tools and Preparation
Phillip Russell and Louis Germinario
With the wide variety of analytical instrumentation available, the selection of the correct "tool" for analysis of nanomaterials is critical. By introducing various microscopy and microanalysis methods, this workshop should provide a solid foundation for nanomaterial characterization for the beginning to intermediate investigator. The importance of choosing the proper preparation technique, to minimize introduction of artifacts and to ensure that representative samples are identified for subsequent analysis, will also be discussed.