Tutorials, Tech Forum, and Outreach Sessions

Technologists' Forum Special Topic: Energy Dispersive Spectrometry

X30 EDS Revisited — Basics and Advances

Valerie Woodward, E. Ann Ellis

The Technologists' Forum will be revisiting energy dispersive x-ray spectrometry (EDS) at M&M 2013. If you haven't updated your system in the past 10 years, or you are new to the discipline, the TF special topics session is the place to be. This session will consist of invited talks, but if you have a contributed paper that fits the descriptions below, please submit it for consideration for a supporting poster session.

  • What is EDS and how does it differ from other "X" methods
  • State of the art in detectors
  • Quantitative and qualitative analysis, peak overlaps, artifacts and misconceptions
  • X-ray mapping and spectrum imaging
  • Preparation and applications in life and materials sciences
Physical Sciences Tutorials

  • One (1) Continuing Microscopy Education Unit is available for each Tutorial attended (fee $10/members; $50/non-members).
X40 Practical Processing of Spectrum Imaging Datasets by Multivariate Statistical Analysis: Advantages and Disadvantages

Masashi Watanabe

Spectrometry techniques such as X-ray energy dispersive spectrometry and electron energy-loss spectrometry are very powerful approaches for materials characterization using electron microscopes. However, these spectrometry techniques are not very efficient since signal generation and collection are limited in comparison to other imaging approaches. Multivariate statistical analysis (MSA) in combination with a spectrum imaging method may handle data with limited signals very efficiently and is now commonly used in electron microscopy. Although this MSA approach is very useful, it may create unexpected artifacts, which mislead results. In this tutorial, advantages and disadvantages of the MSA approach will be discussed.

X41 State-of-the-Art Microanalysis at the nm-Scale and Smaller: Going from Pretty Pictures to Quantitative Analysis of Hyperspectral Data

Paul G. Kotula

With the recent advent of commercially available state-of-the-art analytical electron microscopes we now have the ability to collect high-resolution x-ray microanalytical data quickly and efficiently. Indeed atomic-resolution x-ray microanalysis has been recently demonstrated. The question then becomes how to process and interpret such high-resolution microanalytical data. This tutorial will cover aspects of the instrumentation including new electron sources, aberration correction, and large solid angle x-ray detectors as well as data processing to quantify the resulting hyperspectral x-ray data sets. Examples from microelectronic, alloy and ceramic systems will be used to demonstrate approaches to quantification as well as remaining challenges.

X42 Practical Aspects of Atom Probe Tomography in Materials Science

David Seidman

  • Atom-probe tomography (APT) in conjunction with aberration-corrected electron microscopy and electron energy loss spectroscopy
  • Applications of atom-probe tomography to metals, semiconductors, ceramics and biominerals to solve specific scientific and technological problems
Biological Sciences Tutorials

  • One (1) Continuing Microscopy Education Unit is available for each Tutorial attended (fee $10/members; $50/non-members).
X50 Correlative Imaging of Tissues: The Potential of Large Volume Array Tomography

Irene Wacker

The application of a range of methods for imaging serial sections in the SEM is providing unprecedented opportunities for the reconstruction of large volumes at ultrastructural resolution. We are examining the possibilities for combining these methods with different light microscopic modalities. Current efforts are also focused on the automation of sample preparation and data recording workflows. Examples will be presented to illustrate different workflow requirements that range from single cells to complex tissues such as the neuromuscular junction. The potential to develop hierarchical workflows that allow data collection to be focused on relevant features will be discussed.

X51 Biomedical Applications of microCTin Hard and Soft Tissues — Going Beyond the Bone

Daniel S. Perrien

This tutorial will cover:

  • Basic concepts of microCT image acquisition and analysis
  • Advantages and limitations of microCT
  • Common applications of microCT to skeletal analysis
  • Techniques for imaging and analysis of soft tissue and vasculature
  • Considerations and methods for matching the technique to specific biological questions
X52 Chemically Sensitive ImagingUsing Scanning Transmission X-ray Microscopy (STXM)

Adam Hitchcock

This tutorial will cover:

  • STXM instrumentation and capabilities
  • Sample preparation
  • Data acquisition strategies
  • Data analysis approaches
  • Examples (as time permits)
Microscopy Outreach Sessions

X90 Microscopy in the Classroom — Strategies for Education and Outreach

Alyssa Calabro, Craig Queenan, David Becker

Local educators and registered conference attendees are invited to participate in presentations, round table discussions, and demonstrations of effective strategies for microscopy outreach and education from K-12 and beyond. This session will show how microscopy in education serves as an important learning tool for inspiring our future STEM professionals. Those involved in microscopy education or educational outreach are encouraged to submit an abstract about their successful program or lesson for poster presentation.

X91 It's a Family Affair

Elaine Humphrey, Frauke Hogue, Stuart McKernan

This exciting session will pique the scientific interest of children of all ages — no previous microscopy experience needed!

  • Program designed for the delegates' families and friends
  • Hands-on activities and demonstrations will prove that science is fun
  • Solve the mystery using clues left at the scene of the crime using electron microscopes on the exhibit floor

Delegates who wish to attend in order to develop outreach opportunities at their home institutions are encouraged to attend.