Sunday Short Courses

Organizer: Mike Marko

  • These full-day courses run from 8:30 AM to 5:00 PM on Sunday, August 4.
  • Additional fees and registration required.
  • A certificate of participation will be issued to each participant after the meeting, upon request.
  • Two (2) Continuing Microscopy Education Units are available (fee $10/members; $50/non-members).
  • Morning and afternoon coffee breaks are included.
  • Lunch is on your own.
  • Click here for registration fee details.

X10 Cryo-preparation for Biological EM
Kent McDonald

In this course, we will briefly review why cryo-techniques for specimen preparation are superior to conventional methods. We will discuss some low-cost-alternative cryo-methods, as well as demonstrate some of the latest equipment and techniques for high-pressure freezing, plunge freezing, cryosectioning, cryoSEM, and freeze fracturing. The Tokuyasu method for immunolabeling will also be covered briefly. Persons taking this course should leave with a better understanding of these cryotechniques and their role in different applications such as EM tomography, vitreous cryosectioning, and EM immunolabeling, as well as their routine use for the best-available preservation of cellular fine structure.

X11 Immunolabeling Technology for Light and Electron Microscopy
Caroline Miller, Rick Powell, Steven Goodman

The requirements for successful immunohistochemical and immunocytochemical labeling vary widely with different biological systems. The optimal techniques for light-microscope labeling often differ greatly from those needed for electron microscopy. The basics of immunolabeling at the light- and electron-microscope levels will be presented, illustrated with examples from several different biological systems. Some of the more complex methods and applications used in electron microscopy will be discussed in depth. The course will cover specimen preparation, immunogold labeling and enhancement methods, multiple labeling and correlative LM/EM techniques.

X12 3D Electron Microscopy of Macromolecular Assemblies
Teresa Ruiz, Michael Radermacher, Edward Morris

This short course will provide a comprehensive description of the methods used for 3D structure determination from electron micrographs of macromolecular complexes or weakly scattering specimens available in multiple copies. Specimen-preparation techniques for single particles (deep stain, vitreous ice) will be presented, followed by selection of optimal imaging conditions, including low-dose imaging. Next, a detailed explanation of image-processing techniques, with special emphasis on the random-conical reconstruction technique, will be presented. Finally, structure interpretation and docking of X-ray structures to 3D EM densities will be demonstrated. The techniques described could be applied to both biological and materials science specimens.


X13 Electron Tomography in Life and Material Sciences
Ariane Briegel, Christian Kübel, Heiner Friedrich

This short course will explain the basics of electron tomography, the experimental setups, and the instrumental prerequisites, illustrated by a broad range of application examples. Bright-field, energy-filtered, and scanning TEM tomographic methods will be discussed, emphasizing high resolution for hard materials applications, and low-dose cryo imaging for biological samples and soft materials applications. A variety of reconstruction algorithms will be introduced, as well as a survey of 3-D analysis and visualization methods. We intend the course to be of interest to both beginners and already-experienced users of electron tomography from the fields of biology and materials science.

X14 Imaging and Analysis with Variable Pressure or Environmental SEM
Brendan J. Griffin, Matthew Phillips

This short course aims to take the challenge out of imaging in variable-pressure SEM mode. We will sequentially address VPSEM column components and operation: electron (SE and BSE), and light (CL) imaging and x-ray analysis strategies and detectors for both biological and materials samples. Procedures for monitoring instrument performance and optimizing image quality will then be presented. Examples of the novel charge-related contrasts available in VPSEM will also be discussed. The appropriate use of hot, cool and cold stages is included. The course will conclude with invited manufacturer presentations on new developments and a final lecture comparing VPSEM with conventional SEM. Lecture pdfs will be available online.

X15 Advanced Focused Ion Beam Methods
Lucille Giannuzzi, Joseph Michael

The use of FIB instruments in materials and biological science laboratories is growing rapidly. The versatility and capabilities of these tools are also rapidly improving. This course will first cover ion/solid interactions, which are so important for a user of FIB instrumentation to understand. We will then discuss techniques of sample preparation for SEM and TEM, using conventional liquid-metal Ga+ ion FIBs. We will introduce liquid-metal alloy sources, the gas field-ionization source, the plasma-ion source, and the various ions that are now commercially available to benefit differing applications. The course will conclude with discussions of 3D applications and nanofabrication.

X16 Practical Considerations for Quantitative Image Analysis
James Grande

This workshop covers a wide range of practical topics that are encompassed within the field of image analysis. The subjects will be covered in an easy-to-understand format so that users with little or no experience can comprehend the concepts of how image analysis can provide extensive quantitative measurements that may lead to better understanding of material performance. Topics covered range from cameras and other input devices to image-processing algorithm overviews and how best to extract quantitative data. Treating image analysis as a problem-solving tool along with discerning key metrics within a microstructure is discussed through several real-life examples.


X17 Practical Fractography
Ronald J. Parrington

Fractography, the science of examining fracture surfaces, is the most valuable tool available to the failure analyst. This short version of the popular 2-day ASM class will provide the participants with a comprehensive overview of fractography, with an emphasis on understanding the fundamental principles and identifying fracture features that characterize the important failure mechanisms. Numerous case histories will be used to demonstrate practical tips and techniques for performing fractography on the macro-scale (with the unaided human eye, macro-photography and stereomicroscopy) and on the micro-scale with the scanning electron microscope.

X18 Transmission Electron Microscopy of Materials
Alwyn Eades, Michael Kaufman, Bob Field

This course will provide an introduction to the characterization of materials and defects, with particular emphasis on crystalline materials. Transmission electron microscopy is very powerful and can provide highly valuable information about materials. However, much of the current literature focuses on the very newest techniques and overlooks the value of basic methods using standard instruments. It is those basic methods that will be the focus of this course.