In-Week Intensive Workshops

Organizer: Mike Marko

  • These in-depth courses will be held Monday-Thursday from 1:00 PM to 5:00 PM.
  • A certificate of participation will be issued to each participant after the meeting, upon request.
  • Four (4) Continuing Microscopy Education Units are available (fee $10/members; $50/non-members).
  • Additional fees and registration required.
  • The registration fee includes full registration to M&M 2013.
  • Click here for details regarding registration fees.

X19 Introduction to SEM Imaging and X-ray Compositional Analysis
David Joy, Brad Thiel

This introductory-level workshop will involve classroom lectures and live demonstrations. The SEM topics will be taught by David Joy and will cover basic instrument operation and imaging modes. The EDS topics will be taught by Brad Thiel and will cover basic compositional analysis using SEM with an energy dispersive x-ray spectrometer. The lessons in the lectures will be complemented with hands on demonstrations of SEM operation and x-ray microanalysis. Demonstrated topics will include the effects of working distance, accelerating voltage, probe size, imaging detector, detector bias, probe current, dead time, detector choice, sample geometry, etc.

X20 Specimen Preparation for Biological Microscopy
Mark Sanders

Lecture material will provide information on the basic components of specimen-processing systems, the basics of live-cell incubation using fluorescent probes, biological specimen preparation for light, electron and super-resolution microscopy, strategies and protocols for antibody labeling, and an overview of advanced applications, including in-situ hybridization and decalcification. There will be a special focus on the advantages of microwave-assisted processing. The workshop will include a hands-on component as well as lectures from experts in the field of sample preparation for live, fixed-cell and tissue imaging.

X21 Nanomaterial Microscopy & Microanalysis: Tools and Preparation
Phillip Russell, Lou Germinario

With the wide variety of analytical instrumentation available, the selection of the correct “tool� for analysis of nanomaterials is critical. By introducing various microscopy and microanalysis methods, this workshop should provide a solid foundation for nanomaterial characterization for the beginning to intermediate investigator. The importance of choosing the proper preparation technique, to minimize introduction of artifacts and to ensure that representative samples are identified for subsequent analysis, will also be discussed.