2015 Sponsors

Sunday Short Courses

Organizer: Mike Marko

  • These full-day courses run from 8:30 AM to 5:00 PM on Sunday.
  • A certificate of participation will be issued to each qualifying participant.
  • Eight instructional hours; two Continuing Microscopy Education Units are available (registration fee $10 for members).
  • Morning and afternoon coffee breaks are included; lunch is on your own.
  • Separate registration is required; see Registration page for fee information.


X-10 Cryo-preparation for Biological EM
Instructors: Kent McDonald, Richard Webb

In this course, we will review why cryo-techniques for biological specimen preparation are superior to conventional methods. We will discuss some low-cost cryo-methods, as well as some of the latest equipment and techniques for high-pressure freezing, freeze substitution, cryosectioning and correlative LM-EM. We will show how to recognize ice-damage artifacts and provide a library of reference materials that can be accessed online after the course. Persons taking this course should leave with a better understanding of these biological cryotechniques and their role in different applications such as EM tomography, EM immunolabeling and cryo-EM of vitrified sections, as well as their routine use for the best-available preservation of cellular fine structure.

X-11 Immunolabeling Technology for Light and Electron Microscopy
Instructors: Caroline Miller, Rick Powell, Steven Goodman

The requirements for successful immunohistochemical and immunocytochemical labeling vary widely with different biological systems. The optimal techniques for light-microscope labeling often differ greatly from those needed for electron microscopy. The basics of immunolabeling at the light- and electron-microscope levels will be presented, illustrated with examples from several different biological systems. Guidelines and representative methods will be presented for pre-embedding and post-embedding EM labeling, cryo-EM techniques, and labeling cells, protein complexes and single particles in suspension. Some of the more complex methods and applications used in electron microscopy will be discussed in depth.


X-12 3-D Reconstruction with SerialEM and IMOD
Instructors: David Mastronarde, Cindi Schwartz

This workshop will cover the use of SerialEM for data acquisition and IMOD for 3-D reconstruction and analysis. For SerialEM, topics include basic operation, low dose mode, STEM imaging, use of direct detector cameras, tilt series acquisition, montaging, and automatic acquisition from multiple areas. For IMOD, topics include reconstruction from single and dual-axis tilt series, alignment of slices or tomograms from serial sections, automated processing of multiple tilt series, and modeling and visualization. Cryo and room-temperative applications will be covered. Although the emphasis will be on biological samples, many points are applicable to materials science.

X-13 Imaging and Analysis with Variable Pressure or Environmental SEM
Instructors: Brendan J. Griffin, Matthew Phillips

This short course aims to take the challenge out of imaging in variable-pressure SEM mode. We will sequentially address VPSEM column components and operation: electron (SE and BSE), and light (CL) imaging and x-ray analysis strategies and detectors for both biological and materials samples. Procedures for monitoring instrument performance and optimizing image quality will then be presented. Examples of the novel charge-related contrasts available in VPSEM will also be discussed. The appropriate use of hot, cool and cold stages is included. The course will conclude with invited manufacturer presentations on new developments and a final lecture comparing VPSEM with conventional SEM. Lecture pdfs will be available online.

X-14 Advanced Focused Ion Beam Methods
Instructors: Lucille Giannuzzi, Joe Michael

The use of FIB instruments in materials and biological science laboratories is growing rapidly. The versatility and capabilities of these tools are also rapidly improving. This course will first cover ion/solid interactions, which are so important for a user of FIB instrumentation to understand. We will then discuss techniques of sample preparation for SEM and TEM, using conventional liquid-metal Ga+ ion FIBs. We will introduce liquid-metal alloy sources, the gas field-ionization source, the plasma-ion source, and the various ions that are now commercially available to benefit differing applications. The course will conclude with discussions of 3D applications and nanofabrication.

X-15 Practical Considerations for Image Analysis and ImageJ
Instructor: James Grande

The course first focuses on a wide range of practical topics in the field of image analysis, covered in an easy-to-understand format so that users with little or no experience can comprehend how image analysis can provide extensive quantitative measurements leading to better understanding of material performance. Treating image analysis as a problem-solving tool, along with discerning key metrics within a microstructure, will be discussed through several real-life examples. The course then will cover the use of the public-domain image-analysis package ImageJ/Fiji. This analysis tool will be explored in terms of its extensive capabilities and types of image-analysis projects, using several examples. Programming considerations will be discussed, with basic examples of batch-processing images for enhanced analysis of structural features. Finally, the strengths and weaknesses of image-analysis tools, and options for applying them in various types of imaging systems, will be described and discussed.


X16 Overview of Scanning Probe Microscopy (SPM/AFM) for Nanoscale Morphological, Mechanical, and Optical Characterization of Materials - CANCELED
Instructors: Dalia Yablon, Greg Haugstad

Scanning probe microscopy (SPM) has developed into a widely used commercial tool in many applied R&D applications while still actively growing in new frontiers and research. This course will cover an overview of the method and operating principles of scanning probe microscopy to provide the audience with enough technical background to understand SPM’s nanoscale characterization capabilities. General concepts of SPM will be covered including: hardware elements and software; various modes including contact mode, tapping mode, force curves, in addition to more advanced modes such as multifrequency methods and dynamic contact methods. Emphasis will be on using SPM for nanoscale morphological (topographic), mechanical (modulus), and optical (Raman/IR) based characterization. Finally, specific examples of how SPM is used to solve industrial R&D problems will be demonstrated. This course is suitable for any scientist or engineer with basic physics/math/chemistry background who wants to learn more about this powerful and flexible nanoscale characterization tool.

X17 Standard Practice for Production and Evaluation of Field Metallographic Replicas - CANCELED
Instructor: Frederick Schmidt

This course will cover the use, application and practice of making quality acetate replicas for future examination and evaluation to solve engineering problems. The use of acetone replication during inspection of objects of evidence has the advantage of preserving the evidence. It makes a clear, clean mold of the surface and is totally non-destructive per ASTM E1351. A review of non-destructive testing methods will be followed by the actual making of your own replica tapes. Specific examples of case histories for problem-solving using methods in the field will be presented.

X-18 Nanomaterial Microscopy & Microanalysis: Tools and Preparation
Instructors: Phillip Russell, Lou Germinario, Donovan Leonard, John Thornton

With the wide variety of analytical instrumentation available, the selection of the correct "tool" for analysis of nanomaterials is critical. By introducing various microscopy and microanalysis methods, this workshop should provide a solid foundation for nanomaterial characterization for the beginning to intermediate investigator. The importance of choosing the proper preparation technique, to minimize introduction of artifacts and to ensure that representative samples are identified for subsequent analysis, will also be discussed.