M&M 2016

2016 Pre-Meeting Congresses

  • Separate registration fee required — see "Registration Fees" for details.
  • Breakfast, Lunch, and coffee breaks are included.

Exploiting the Diffractive Properties of Electrons for Solving Materials Problems

Sunday, July 24, 2016 • 8:00 AM to 5:00 PM
Organized by the Electron Crystallography and Automated Mapping Methods Focused Interest Group

Jörg Wiezorek, University of Pittsburgh
Yoosuf Picard, Carnegie Mellon University
Sergei Rouvimov, University of Notre Dame
Robert Stroud, nanoMegas

This Pre-Meeting Congress reviews basic methodologies in the analysis of crystalline materials using electron diffraction. Both scanning electron microscopy and transmission electron microscopy methods are featured. This Congress will feature nine invited speakers, each an internationally renowned expert in the utilization of electron diffraction methods for analyzing one or more of the following structural properties of crystalline materials: phase/symmetry, orientation, defects, and strain. Each speaker will describe the fundamental physics, explain the basic methodologies and approaches, and highlight key recent research findings and/or important technique developments. This session provides an excellent opportunity for electron microscopists to review SEM and TEM methodologies based on electron diffraction, and gain new insights on the latest advances and applications of state-of-the-art diffraction methods.


Essentials of Atom Probe Tomography

Sunday, July 24 — 8:30 AM – 5:00 PM
Atom Probe Tomography Focused Interest Group

Richard L. Martens, University of Alabama
Arun Devaraj, Pacific Northwest National Laboratory
Prakash Kolli, University of Maryland
Baishakhi Mazumder, Oak Ridge National Laboratory

Atom probe tomography (APT) has been growing very rapidly over the past decade. Commercial instrumentation and FIB-based specimen preparation have driven much of this growth. Accordingly, the number of people utilizing the technique has also been rising rapidly. This one-day pre-meeting congress, organized by the MSA Atom Probe Tomography Focused Interest Group (APT-FIG), will present the basics of atom probe tomography in an introductory overview. APT instrumentation and experimental design, theory, specimen preparation, data analysis, and applications will be discussed