M&M 2016

Full Symposium Descriptions


Biological Sciences Symposia


B01 Nanostructured Scaffolds for Regenerative Medicine

Organizers: Marco C. Bottino, Caroline A. Miller
The principles of tissue engineering for regeneration involve the combination and interplay of three major elements such as scaffolds, stem cells, and cell signaling molecules. Advances in the science and technology of nanomaterials have led to increased enthusiasm for approaches such as electrospinning of nanofibers. In recent years, regenerative medicine has changed the therapeutics of a wide range of diseases. The symposium will bring materials scientists, chemical/biomedical engineers, cell biologists, and clinician-scientists that will provide research evidence on the major areas relevant to nanostructured scaffolds development for regenerative medicine. Our goal is to stimulate discussion of the latest research approaches and technologies that will help propose future directions targeting clinical use.

Invited Speakers:

  • Susan Bellis, University of Alabama – Birmingham
  • Marco Bottino, Indiana University


B02 New Technologies for Digital Pathology

Organizers: Rohit Bhargava, David Mayerich
A wealth of technologies is changing the traditional approach of careful sample preparation, staining and manual recognition with light microscopy. New instrumentation for microscopy in different spectral regions, recognition algorithms and imaginative new applications are merging in emerging digital pathology applications that promises more effective medical care and decision-making. This symposium will explore the multifaceted activities related to microscopy for digital pathology. Experts will describe cutting edge research in all three areas, with emphasis on innovative new solutions to traditional problems in pathology.

Invited Speakers:

  • Anant Madabhushi, Case Western Reserve University
  • Metin Gurcan, The Ohio State University
  • Richard Levenson, UC Davis Health System


B03: Super-resolution Visualization of Cellular and Inter-Cellular Processes in Health and Disease

Organizer: Rob Gourdie
The 2014 Nobel prize was awarded to to Eric Betzig, W.E. Moerner and Stefan Hell for the development of super-resolved fluorescence microscopy, which has enabled imaging of cellular nanostructure at resolutions an order of magnitude below the Abbe limit of 200 nm. Super-resolution microscopy shifts the paradigm — with an impact on the field of cell biology comparable to the advent of laser scanning confocal microscopy or electron microscopy. In our session we aim to cover examples of the application of both stochastic (e.g., PALM, STORM) and deterministic (e.g., STED, SSIM) super-resolution technologies, to study homeostatic and diseased cells at the nanoscale.

Invited Speakers

  • Eli Rothenberg, New York University
  • James Smyth, Virginia Polytechnic Institute
  • Mike Koval, Emory University


B04 Microscopy and Morphogenesis

Organizers: Rich Goodwin, Jay Potts
Despite centuries of investigation, how biological organisms grow and develop specific shapes, colors, and structures is largely unknown. Yet, it is critically important for the continuity of life that certain shapes and structures be constructed in a precise and reproducible fashion. A fundamental problem facing investigation of the morphogenesis is the temporal and spatial resolution necessary to observe growing and differentiating cells over extended periods of time. The advent of new imaging and analytical tools promises to shed light on the cellular and molecular processes that drive the development of biological forms. This session will focus on how these new technologies are answering long held questions.

Invited Speakers

  • Sai Veeraraghavan, Virginia Polytechnic Institute
  • Joy Lincoln, Nationwide Children's Hospital
  • Bruce Gao, Clemson University
  • Han Han, University of South Carolina
  • Logan Hsu, Baylor University
  • David Bader, Vanderbilt University


B05 Pathology: When Normal Goes Wrong

Organizers: Jay Jerome, Bill Gunning
Pathological situations are just those in which the homeostatic balance becomes disrupted outside of the range of cells, tissues or organs to compensate effectively. This puts the organism in jeopardy. In this session, we will explore the underlying mechanisms of known homeostatic disruptions occurring in specific disease states, the consequences of the disruptions and possible therapies to restore balance. Although we will explore individual disease states we hope to highlight the commonality of certain disruptions across diseases to encourage cross-discipline discussion.

Invited Speakers

  • Andrea Kalinoski. University of Toledo
  • Ramya Chandrasekaran, Vanderbilt University
  • Jay Potts, University of South Carolina
  • Jay Jerome, Vanderbilt University


B06 Pharmaceuticals and Medical Science

Organizers: John Bruce Green, Bridget Carragher
This symposium will cover diverse content related to the research, development, manufacturing and use of both pharmaceuticals and medical products. It will include discussions of new approaches to the characterization and understanding of pharmaceuticals as well as detailed case studies. These presentations will generally address the unique challenges related to drug discovery, vaccine research, formulation, biocompatibility, production, product life cycle, medical product implementation, regulatory issues, and eventual patient use. Research topics may include any of the instruments and methods found at the exposition, ranging from microCT for whole device imaging right down to high-resolution TEM for structural biology of vaccines.

Invited Speakers

  • Claudio Ciferri, Genentech
  • Anette Schneemann, Nanoimaging Services
  • Sachin Attavar, EAG
  • Marcus Cicerone, NIST
  • Jim Slipeka, Baxter
  • Frank Platek, FDA
  • Scott Aldrich, Ultramikro
  • Joe Neilly, Abbvie


B07 3D Structures of Macromolecular Assemblies, Cellular Organelles and Whole Cells

Organizers: Elizabeth R. Wright, Teresa Ruiz, Kristin N. Parent
Our understanding of the 3D structure and functional subtleties of cells, microorganisms and macromolecular assemblies has experienced great advances through recent developments of EM techniques and hybrid methodologies. This symposium will highlight structural and ultrastructural studies of cells, microorganisms and macromolecules using a variety of structural and hybrid techniques including electron tomography; electron crystallography; single-particle EM analysis; EM helical reconstruction; scanning and transmission electron microscopy; atomic force microscopy, X-ray crystallography, and modeling. Topics will include: eukaryotic and prokaryotic architecture; cellular metabolism; cell division and protein translation; cellular secretion, adhesion and motility; cell-cell communication and signaling; virus structure and virus-host interactions and all aspects of structure and function of macromolecular assemblies.

Invited Speakers

  • Maryann Martone, University of California, San Diego
  • Kenneth Taylor, Florida State University
  • Vera Moiseenkova-Bell, Case Western Reserve University
  • Reza Khayat, The City College of New York
  • Tanmay Bharat, MRC Laboratory of Molecular Biology


B08 Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals

Organizers: Jon Charlesworth, Greg Ning, Betty Thompkins, Caroline Miller
Microscopy is not only useful but also critically important in the ongoing research, detection, diagnosis and treatment of disease. Advances that improve rapid and accurate detection and treatment often involve the use of various microscopic techniques. These varied techniques provide us with an improved ability to diagnose and research the origins, development and response of diseases in human, plant and animal specimens. This is an opportunity to share information on the investigation of pathogenic cells, tissues and entire organisms in clinical, diagnostic and research laboratories. Emphasis will be placed on using latest microscopy in both clinical and research laboratories.

Invited Speakers

  • Rachel Cianciolo, Ohio State University
  • Ryan Goffredi, Children's Hospital Colorado

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Physical Sciences Symposia


P01 Dr. Gareth Thomas Symposium: Materials Solutions through Microscopy

Organizers: David B. Williams, Ron Gronsky
Gareth Thomas was primarily responsible for the growth of transmission electron microscopy to become the characterization tool for materials in the USA and around the world. Building on a large group of graduate students, post docs and international collaborators at UC Berkeley for almost 50 years from 1959 until the early 2000s, his ideas and his students diffused throughout the world of TEM. Together they transformed the TEM from a physics-based instrument for the study of electron scattering into a practical tool for the complete characterization of the physical, chemical, mechanical, electrical and magnetic properties of crystalline materials Many of the early fundamental studies of phase transformations and defects in crystalline materials can be traced to Gareth' influence: aluminum and Ni-base alloys and steels, through silicon-based ceramics, superconductors and magnetic materials. Gareth's single-minded focus on creating the National Center for Electron Microscopy introduced many materials scientist to the need for thinking BIG about the future of the field. He was among the first electron microscopists to take a university leadership position, acting as vice chancellor for student affairs at Berkeley during the troubled times around 1970. He was among the first to understand the need to commercialize some of our discoveries, starting companies based on his own research. In so many areas Gareth was ahead of his time and this symposium will gather many of his former students and what's left of his contemporaries to honor his achievements by showing how his influence continues to transform the combined fields of materials science and transmission electron microscopy.


P02 Electron Microscopy of Materials for Electrochemical Power Systems

Organizers: Mark Aindow, Karren L. More
This symposium will highlight the roles of electron microscopy imaging, diffraction, and spectrometry in studies of materials, components, and devices for electrochemical power systems. There are many different types of electrochemical systems; each of these presents its own materials-related technological challenges, and microscopy is an essential tool for elucidating the materials degradation mechanisms and for developing new materials with significantly enhanced stability, durability, and performance. Contributions are welcome in the areas of energy materials,such as electrocatalysts and catalyst supports, electrolytes, electrodes, interconnects and seals, as well as membrane electrode assemblies and complete cells/stacks. Several sessions will emphasize the microscopic and spectroscopic techniques used to study component materials and aging phenomena, whereas others will be devoted to particular types of materials and cell technologies, including materials optimization and new materials development.

Invited Speakers

  • Quentin Jeangros, EPFL, Switzerland
  • Laure Guétaz, CEA, France
  • Scott A. Barnett, Northwestern University
  • C. Barry Carter, University of Connecticut
  • David A. Cullen, Oak Ridge National Laboratory
  • Paulo J. Ferreira, University of Texas, Austin
  • Adam P. Hitchcock, McMaster University, Canada
  • Christopher J. Kiely, Lehigh University
  • Shirley Meng, University of California, San Diego
  • Dean J. Miller, Argonne National Laboratory
  • Megan Holtz, Cornell University


P03 Combining Simulation, Experiment, and Data Science for Materials Characterization and Design

Organizers: Paul Voyles, Jinwoo Hwang, Mark Oxley
Simulation of complex electron scattering phenomena is an essential tool for understanding microscopy data, which in turn provide essential constraints on materials simulations such as density functional theory and molecular dynamics. This symposium will cover advances in simulation methods and new discoveries enabled by combining simulations and experiments. It will also include application of methods from data science, including machine learning and image processing, that enable automated, quantitative analysis of microscopy data and simulations, and the use of microscopy to inform simulation-aided materials design in the spirit of the Materials Genome Initiative.

Invited Speakers

  • Benjamin Berkels, RWTH Aachen University, Germany
  • Andreas Thust, Ernst Ruska Center, Germany
  • James LeBeau, North Carolina State University
  • Matthew Weyland, Monash University, Australia
  • James Ciston, Lawrence Berkeley Laboratory
  • John Rehr, University of Washington
  • Christian Dwyer, Arizona State University
  • Bryan Esser, The Ohio State University
  • Sergei Kalinin, Oak Ridge National Laboratory


P04 Nuclear and Irradiated Materials

Organizers: Chad M. Parish, Khalid Hattar, Peter Hosemann
Materials in fission, fusion, accelerator, or space environments are subjected to irradiation and can undergo significant compositional and structural evolution as a result. Because damage cascades and transmutation are atomistic processes, understanding and predicting the changes in properties and performance in radiation environments require atomistic and microstructural tools. Radiation environments vary from cryogenic temperatures, high energy, and low flux environments often found in space applications, to neutron damage of liquid helium-cooled superconductors and 1200°C tungsten under helium and neutron bombardment in a fusion reactor. Modern microscopy and microanalysis tools provide the means to study not only the smallest defects at the atomic scale, but also the real-time evolution of radiation damage. Coupling these techniques with modeling can enable the understanding to be extended from nm through mm or larger. This symposium aims to bring together instrumentation, modelling, and applications expertise to advance the science of materials for radiation environments.

Invited Speakers

  • Samuel Briggs, University of Wisconsin
  • Bai Cui, University of Nebraska - Lincoln
  • Janelle Wharry, Purdue University
  • Jonathan Hinks, University of Huddersfield, UK
  • Shen Dillon, University of Illinois


P05 Microscopy for Thin Films of Metals, Semiconductors, and Insulators

Organizers: Laxmikant V. Saraf, C. Barry Carter
This symposium will emphasize advances in S/TEM especially when linked to other microscopies, as applied to metal, semiconductor and insulator (i.e., inorganic) thin films. Defects in thin films, whether single-layer or multi-layer stacks, epitaxial (epitactic) or polycrystalline, must be characterized by combining analytical tools. Defects determine the physical and chemical properties in most thin films and thus control materials performance. This symposium will cover all aspects of microscopy-based characterization of thin films produced using MBE, CVD, and other methods, including sputter deposition (DC/RF), evaporation, physical vapor deposition, e-beam evaporation, PLD, ALD, and . Comparable studies of thin-film growth using techniques suitable for deposition in other environments, such as sol-gel, dip-coating, casting, spray pyrolysis and exfoliation processes are solicited. Studies that use in situ or operando methods, or that combine different microscopies, are particularly encouraged. Applications of such studies include all aspects of detector/sensor technologies and development of alternative energy technologies.

Invited Speakers

  • Roberto Myers, The Ohio State University
  • Donovan Leonard, Oak Ridge National Laboratory
  • Katherine Jungjohann, Sandia National Laboratories
  • Vinayak Dravid, Northwestern University


P06 Magnetic Materials, Phenomena and Imaging at the Nanoscale

Organizers: Marc De Graef, Amanda Petford-Long
A full understanding of bulk and nanoscale magnetic materials requires local probes that explore the magnetic structure and its response to applied fields/temperature at appropriate length scales, and that correlate this with microstructure and chemistry. Suitable techniques include Lorentz TEM (including differential phase contrast, holography, and other phase reconstruction methods), electron energy loss spectroscopy, dichroism techniques (including vortex beam studies), magnetic force microscopy, and spin-polarized STM. The symposium goal is to bring together experimentalists involved in applying/developing these techniques, in addition to those involved in image simulations or the development of theory to explain quantitatively the observed magnetic contrast.

Invited Speakers
  • Charudatta Phatak, Argonne National Laboratory
  • Daniel Wolf, University of Dresden, Germany
  • Peter Fischer, Lawrence Berkeley National Laboratory
  • Shane White, The Ohio State University
  • Aditya Mohan, Purdue University


P07 Failure Analysis Applications of Microanalysis, Microscopy, Metallography and Fractography

Organizers: Daniel P. Dennies, Noah Budiansky
This symposium is intended to be a forum for the exchange of information and knowledge regarding the use of microanalysis, microscopy, metallography and fractography in materials-related failure analysis. Invited papers would include those involving failure investigations where microstructures, metallography and fractography are critical to identifying the root cause. Of particular interest are unique, innovative, and/or challenging applications of microscopy, metallography, fractography, and sample preparation in failure analysis. Target attendees will include engineers and scientists from all levels of analytical expertise and all related backgrounds, not just materials engineers.

Invited Speakers
  • Paul Ledwith, Exponent - Failure Analysis Associates
  • William Lenthe, University of California, Santa Barbara
  • Shari Rosenbloom, Corrosion Testing Laboratories, Inc.


P08 Microscopy of Additive Manufacturing and 3D Printing in Materials and Biology

Organizers: Manuel Garcia-Leiner, Daniel P. Dennies, Michael Yost
Additive manufacturing/3D printing encompasses multiple methods for building parts directly from feedstock such as powders, filaments, wires, and biomaterials with only minimal or no post build machining to produce a final shape. Resultant microstructures can be unique to the process and properties can be strongly dependent on such microstructures. In recent years, technologies have been developed for the additive manufacturing of polymers, metals, ceramics and biomaterials. In general, processes include powder-based fusion processes as well as extrusion or spray processes for the design of complex, highly functional parts. These days, additive manufacturing techniques are introduced to highly demanding, and highly specialized applications. More recently, biological and medical opportunities have sprung up taking advantage of 3D bio-printing. Implantable devices, heart valves, blood vessels and whole organs have begun to be manufactured. Each of these processes brings unique challenges to build parts and tissues that meet specifications and biocompatibility. Papers will highlight additive manufacturing and 3D printing in all areas of science from metals, polymers and ceramics to specific developments in biology and medicine.

Invited Speakers
  • John Porter, UES, Inc.
  • Noah Budiansky, Exponent
  • Ying Mei, Clemson University
  • Mark Aubart, Arkema Inc.


P09 From Angstrom to AU: Studies of Planet-Forming Materials

Organizers: Eve L. Berger, Francis M. McCubbin, Adrian J. Brearley
Micro- and nano-scale analyses of planetary materials (e.g., meteorites, IDPs, asteroidal and Lunar return samples, and experimental and terrestrial analogs) inform our understanding of our solar system's history. With the development of new techniques and novel implementations (EPMA, EELS, EDS, SIMS, FTIR, APT, EBSD, XCT, microscale geochronology, etc.) we further maximize the information gleaned from small-sample analyses. This meeting will report current research milestones gained through the use of these techniques, both individually and as part of coordinated analyses of planetary materials.

Invited Speakers
  • Jessica Barnes, Open University, UK
  • Juliane Gross, Rutgers University
  • Philipp Heck, The Field Museum
  • Martin Lee, University of Glasgow, UK
  • Laurent Remusat, Museum National d'Histoire Naturelle, France
  • Adam Sarafian, Woods Hole Oceanographic Institute/MIT
  • Shirin Kaboli, University of Nevada Las Vegas


P10 Microscopy and Characterization of Ceramics, Polymers and Composites

Organizers: Richard E. Chinn, Ronald J. Parrington
Ceramics, polymers, and composites are key materials in many industrial applications, including cutting-edge technologies such as ceramic matrix composites (CMC) for high temperature gas turbine applications. This symposium will examine the materialography, fractography, microscopic examination, and characterization of ceramics, polymers and composites. While traditional approaches to nonmetallic material microscopy and evaluation are welcome, papers that address new and innovative sample preparation and evaluation techniques are of special interest.

Invited Speakers
  • Dale Edwards, Engineering Systems Inc.
  • Robert Pieper, Element Materials Technology
  • Cecilia Larrosa Wilson, Exponent, Failure Analysis Associates


P11 Metallography and Microstructural Characterization of Metals

Organizers: Coralee McNee, George Vander Voort
The field of metallurgy and materials science offers many challenges for revealing and characterizing the microstructure of metals and alloys. The art and science of metallography continues to advance to meet these challenges with new automated techniques for preparing and evaluating both new materials and traditional engineering alloys. This symposium will cover all aspects of specimen preparation and evaluation for metals, microelectronics, and virtually any other metallic material, as they influence characterization techniques. Contributions are welcome for all specimen preparation methods. The influence of specimen preparation upon properly revealing and characterizing microstructure will be the central focus of this symposium covering applications of light microscopy, quantitative metallography and image analysis, micro-indentation hardness, SEM imaging and EMPA, TEM, EBSD or WDS/EDS analysis, and any other relevant method.

Invited Speakers
  • Alexander A. Kazakov, St. Petersburg State Polytechnic University, Russia
  • Joseph W. Newkirk, Missouri University of Science and Technology
  • Arun M. Gohkale, Georgia Institute of Technology
  • Joachim Mayer, RWTH Aachen University, Germany
  • Dalaver H. Anjum, King Abdullah University of Science and Technology, Saudi Arabia
  • Kodze Karacali, Erdemir, Turkey


P12 Microscopy and Analysis in Forensic Science

Organizers: S. Frank Platek, Stefanie L. Heckman
The symposium topics will include the application of light and electron microscopy including x-ray microanalysis, confocal microscopy, atomic force microscopy, FT-IR imaging and Raman mapping and 3D surface metrology in forensic case samples and research. Topics will include case histories and the type of evidence presented for examination, identification of trace evidence and sample preparation for microscopic examination. Also included will be the interpretation of case-related microscopic and spectral results, forensic research topics as well as preparation and presentation of the results of microscopic analyses of trace evidence for court testimony.

Invited Speakers
  • Skip Palenik, Microtrace, LLC
  • Nadav Lavin, Israel Police Division, Israel
  • Andrew Vogt, AbbVie

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Analytical Sciences Symposia

A01 Vendor Symposium

Organizers: Paul Kotula, Teresa Ruiz

  • New methods and techniques
  • New developments and technologies
  • Breakthrough and new instrumentation
  • Improvements to existing instrumentation


A02 TEM Phase Plate Imaging in Biological and Materials Science

Organizers: RadostinDanev, Mike Marko
Conventional imaging with TEM relies on defocus to produce phase contrast. This approach has inherent problems in terms of non-optimal information transfer in Fourier space, especially for low spatial frequencies. Phase plates enable in-focus phase contrast and provide a practical solution for these problems. The theory, construction, and practical use of phase plates will be explored. High-resolution low-dose imaging is facilitated in biological cryo-EM. In materials science, the combination of a physical phase plate with a Cs-corrector offers an opportunity for characterization of both atomic details and larger structures. The number of laboratories adopting phase plates is rapidly growing and this will be a timely opportunity to share experiences.

Invited Speakers
  • Sara Sandin, Nanyang Technological University, Singapore
  • Hong Zhou, University of California, Los Angeles
  • Mazdak Radjainia, Monash University, UK
  • Miroslava Schaffer, Max-Planck Institute for Biochemistry, Germany
  • Matthias Wolf, Okinawa Institute of Science and Technology, Japan
  • Felix Baeuerlein, Ludwig Maximilians University Munich, Germany
  • Bart Buijsse, FEI Company
  • Hirofumi Iijima, JEOL Ltd., Japan


A03 X-ray Imaging and Analysis

Organizers: Jeff Davis, Ric Wuhrer, Eric Telfeyan
This broad symposium will accept papers on all aspects of X-ray imaging and X-ray image analysis. Our goal is to bring together the diverse methods of X-ray imaging, such as SEM-EDS mapping, µXRF, µXRD and µCT. We are also emphasizing software for image analysis, including quantitative analysis, multivariate statistical methods and machine learning methods, and we are seeking contributions from the vendor community about new hardware, detectors and techniques. Papers on practical applications of X-ray imaging and correlative microscopy are also encouraged.

Invited Speakers
  • Mirna Saliba, Diamond Light Source, UK
  • Ken Moran, Moran Scientific
  • Si Chen, Argonne National Laboratory
  • Nicholas Yaraghi, University of California, Riverside
  • Lothar Strüder, University of Siegen, Germany
  • Pierre Hovington, Hydro-Quebec, Canada


A04 Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Organizers: Lucille A. Giannuzzi, Nabil Bassim, Srinivas Subramaniam
Focused ion beam (FIB) instruments are mainstay capabilities for microscopy facilities. FIB columns may be used alone or combined with additional FIB or SEM columns or multiple analytical detectors on a single instrument. The FIB by itself or in combination with other beams and analytical capabilities provides unique methods of specimen preparation, 2D and 3D characterization, and prototyping opportunities. Papers are welcome that covers any of these topics or new applications of FIB-based development and applications.

Invited Speakers
  • Shida Tan, Intel Corporation
  • McLean Echlin, University of California, Santa Barbara
  • Ehrenfried Zschech, Fraunhofer Institute, Germany
  • Konrad Rykaczewski, Arizona State University
  • Arash Parsi, Westinghouse


A05 Applications of Correlative Microscopy to Physical and Biological Sciences

Organizers: Si Chen, Renu Sharma, Nestor J. Zaluzec
This symposium will focus on the latest developments in correlative microscopy and it applications to physical and biological sciences. Both correlative imaging and spectroscopy are emerging methods that combine two or more complementary imaging or spectroscopy techniques to provide mesoscale or multiple parameter information of a sample or a reaction process. For example, correlative light and electron microscopy combines sub-micron scale information provided by optical and fluorescence signals with (sub-)nanoscale structural information obtained from electron scattering. Synchrotron-based X-ray fluorescence microscopy or spectroscopy in conjunction with electron microscopy provides chemical information in addition to information about the ultrastructure. Sample preparation, modifications to the microscope, or sample holders to suit multiple imaging/spectroscopy techniques and image registration are critical aspects for correlative microscopy, which will also be covered in this symposium.

Invited Speakers
  • Ben Giepmans, UMCG, Netherlands
  • Matthew Kulzick, BP Corporate Research Center
  • Paul Quinn, Diamond Light Source, UK
  • Lydia Joubert, Stanford University
  • Richard Ortega, University of Bordeaux, France


A06 Analytical Electron Microscopy for Advanced Characterization from Multi-dimensional Data Acquisition to Integrated Analysis

Organizers: Chaoying Ni, Peter A. van Aken, Masashi Watanabe
Recent advances in instrumentation related to analytical electron microscopy including high brightness electron sources, stable columns, and efficient signal-detectors allow high resolution analysis with concurrent acquisition of multi-dimensional data: not only traditional analytical signals such as X-rays and energy-loss electrons but also signals for imaging and diffraction. With these multidimensional data, more advanced quantitative information can be obtained such as chemical compositions, electronic structure and local nanostructures. The improved multi-dimensional data acquisitions including diffraction imaging and analytical tomography and advanced quantitative analysis require efficient data processing. This symposium focuses on the latest scientific impact in terms of hardware/software development and new applications of analytical electron microscopy.

Invited Speakers
  • Wilfried Sigle, Max-Plank-Institute, Germany
  • Mathieu Kociak, Université Paris-Sud, France
  • Sara Bals, University of Antwerp, Belgium
  • Zineb Saghi, CEA-LETI, France
  • Andy Lupini, Oak Ridge National Laboratory
  • Ray Egerton, University of Alberta, Canada


A07 Surface and Subsurface Microscopy and Analysis

Organizers: Vincent S. Smentkowski, John A Chaney, Chanmin Su
Surface properties (composition, uniformity, thickness, topography, etc.) dictate the performance of many systems. The surface analyst is asked to detect and image species present in ever-lower concentrations and within ever-smaller spatial and depth dimensions. This symposium will emphasize state of the art surface analytical instrumentation including all aspects of surface mass spectrometry and scanning probe microscopy including nano-scale chemical and physical property analysis via TERS, IR and other probe based techniques. We will also cover advanced data analysis tools; the use of complementary surface analytical instrumentation to perform a complete analysis of complex material systems; and surface analytical challenges. Contributed papers on surface analysis are solicited for both platform and poster presentation.

Invited Speakers
  • Greg Meyers, Dow Chemical
  • Gilber Walker, Toronto University, Canada
  • An-ping Li, Oak Ridge National Laborary
  • Mathew Linford, Brigham Young University
  • Hammond John PHI, Inc.
  • David Surman, Kratos Analytical, UK
  • Tim Nunney, Thermo Scientific
  • Philipp Bruener IonTof, Germany
  • Francois Horreard, Cameca
  • Yung-Chen Wang, Castner Group
  • Alexander Pirkl, IonTof, Germany


A08 Quantitative and Qualitative Microanalysis by EPMA and SEM

Organizers: Julien Allaz, Paul Carpenter
This session will cover advances in quantitative and qualitative microanalysis by EPMA and SEM using WDS and EDS detector systems, trace and light element microanalysis, complementary techniques applied to compositional mapping, the role of standard reference materials, and educational efforts directed toward improvements in microanalysis. We welcome contributed presentations from the scientific and vendor communities, and will highlight the efforts of young scientists and the role of education in microanalysis.

Invited Speakers
  • Stuart Kearns, University of Bristol, UK
  • Anette von der Handt, University of Minnesota
  • Edward Vicenzi, Smithsonian Institution
  • Dale Newbury, National Institutes of Standards and Technology
  • Richard Wuhrer, Western Sydney University, Australia


A09 Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Organizers: Jim Ciston, Doug Medlin, Alex Eggemann
Scanning microscopies drawing on the full field of reciprocal space are rapidly growing in development and application. Recording a full series of diffraction patterns mapped at nanometer resolution liberates the microscope from the limited geometries available for STEM detectors, but more importantly opens new modes for imaging that were previously inaccessible. In addition to structural imaging, it has become possible to map materials properties such as strain, electric/magnetic fields, and octahedral rotations at nanoscale resolution or better. Such developments are being catalyzed by the emergence of new, fast detectors for both electron microscopes and synchrotron sources. Few of these new methods provides a "direct" image, but rely instead upon extensive simulation and data reduction to extract meaningful information. This symposium will focus on the application of these new experimental techniques to nanoscale materials science as well as on the successes, challenges, and needs for the management, processing and visualization of these large data streams.

Invited Speakers
  • David Muller, Cornell University
  • Paul Voyles, University of Wisconsin, Madison
  • Colin Ophus, Lawrence Berkeley National Laboratory
  • Knut Müller-Caspary, University of Bremen, Germany
  • Peter Nellist, University of Oxford, UK
  • Kenji Tsuda, Tohoku University, Japan
  • Christoph Gammer, Vienna University of Technology, Austria
  • Ute Kolb, Johannes Gutenberg-Universität Mainz, Germany


A10 Advances in Image Processing, Display and Analysis

Organizers: William A Heeschen, Clifford S Todd, Kevin Eliceiri
This symposium is focused on recent advances in digital image handling with emphasis on processing, display, and analysis. Potential topics are feature/pattern recognition, segmentation and classification, image transformation, alternate image representation, measurements, visual analytics, and advanced data analysis such as neural networks and machine learning. Advances in image management (storage, retrieval, format, etc.) and remote collaboration are also within the scope of this symposium.

Invited Speakers
  • Adi Suissa-Peleg, Harvard University
  • Andrew Cohen, Drexel University
  • Allen Goodman, Broad Institute of MIT & Harvard


A11 Advances in Scanning Electron/Ion Instrumentation and Detectors

Organizers: Brad Thiel, Matthew Phillips, Milos Toth
Recent advances in charged particle optics and instrumentation have the potential to revolutionize where, when and how scanning electron/ion microscopy is used. Miniature and microcolumns may permit SEM capability to be integrated into manufacturing equipment or combined with other analytical instrumentation. Arrays of mini-columns or single columns with beam splitters can provide high-throughput imaging of large areas at high resolution. New electron detector technologies are emerging which offer direct detection of lower energy electrons at high efficiency, and in some cases, energy filtering. Improved photon detectors are also enabling the use of cathodoluminescence in plasmonics research.

Invited Speakers
  • Pieter Kruit, Delft University of Technology, Netherlands
  • Jeff Lichtman, Harvard University
  • Larry Muray, Keysight Technologies
  • Claudio Piemonte, Fondazione Bruno Kessler, Italy
  • Robert Hull, Rensselaer Polytechnic Institute


A12 Research and Applications in Atom Probe Tomography

Organizers: Frederick Meisenkothen, Eric B. Steel
Atom probe tomography (APT) is an emergent characterization technique with tremendous potential. To fully realize this potential, researchers are actively exploring new application areas while simultaneously striving to improve the accuracy and reproducibility of the technique. This symposium is designed to bring together technicians, engineers, and scientists, from across disciplines, who share a common interest in atom probe tomography. The session will encompass research and applications spanning a wide variety of topics that include: materials applications; optimization of acquisition conditions; correlative techniques, 3-D reconstruction, and data analysis; specimen preparation techniques; detector performance; modeling and measurements to understand the impact of specimen and instrument parameters; and accuracy and precision in APT measurements and the development of APT standards.(NOTE: Meeting attendees who are interested in this session should also consider attending the Atom Probe Pre-Meeting Congress earlier in the week.)

Invited Speakers
  • Lorenzo Rigutti, Universite de Rouen, France
  • David Diercks, Colorado School of Mines
  • Mattias Thuvander, Chalmers University of Technology, Sweden
  • Emmanuelle Marquis, University of Michigan
  • Hans Juergen Kreuzer, Dalhousie University, Canada
  • Ty Prosa, Cameca/Ametek


A13 In-situ Electron Microscopy and Big Data Analytics in 2D and 3D

Organizers: Huolin Xin, Peter Ercius, Kai He
The need to measure functionality and dynamics of nanomaterials in liquids and gases calls for imaging tools with high throughput, spatial resolution, and analytical sensitivity. This symposium is dedicated to the development of advanced techniques for in situ S/TEM including realistic sample environments with functional stimuli and measurements, developments in high-throughput analytical dynamical imaging, big data analysis, and sample-beam interactions. We encourage submission of work highlighting applications of environmental TEM in electrochemistry, nucleation and growth, catalysis, corrosion, and biological processes. Particular emphasis of this symposium is given to improvements in the time resolution of quantitative imagingby STEM-EELS, STEM-EDX, EF-TEM, ADF-STEM, STEM tomography, etc., for in situ and environmental experiments.

Invited Speakers
  • Reza Yassar, University of Illinois - Chicago
  • Raymond Unocic, Oak Ridge National Laboratory
  • Megan Holtz, Cornell University
  • Haimei Zheng, Lawrence Berkeley National Laboratory
  • Seiji Takeda, Osaka University, Japan
  • Judith Yang, University of Pittsburgh
  • Joerg Jinschek, FEI Company
  • Renu Sharma, National Institutes of Standards and Technology
  • Andrew Minor, Lawrence Berkeley National Laboratory
  • Yimei Zhu, Brookhaven National Laboratory
  • Judy Cha, Yale University
  • Xiaoqing Pan, University of California, Irvine


A14 Single Atom Electron Microscopy and Spectroscopy

Organizers: Jingyue (Jimmy) Liu, Larry Allard
Atoms, the basic building blocks of matter, make up the universe and all life forms. Many factors affect how atoms behave, for example, how they are bonded to other atoms. The macro-properties of matter depend on the geometrical arrangement and the bonding of the individual atoms. Aberration-corrected electron microscopes make it possible to analyze the behavior of individual atoms, either supported on a substrate or embedded in a matrix. Spectroscopy techniques such as XEDS and EELS can be utilized to not only identify the nature of the individual atoms of interest but also investigate their electronic structure or oxidation state. This symposium provides a platform to bring together researchers from a variety of disciplines to highlight the most recent progress in characterizing the nature of individual atoms, studying their interactions with the surrounding environment, and investigating their unique properties. The symposium focuses on all aspects of imaging and analyses of (supported or embedded) single atoms and the correlation of these observations with their functional properties (e.g., electrical, magnetic, catalytic, etc.).

Invited Speakers
  • Masashi Watanabe, Lehigh University
  • Gianluigi Botton, McMaster University, Canada
  • Wu Zhou, Oak Ridge National Laboratory
  • Ming Yang, General Motors
  • Kazu Suenaga, Advanced Industrial Science and Technology, Japan
  • David Muller, Cornell University


A15 Quantitative Measurement of Intensities and Distances in Electron Microscopy

Organizers: James LeBeau, Jinwoo Hwang
Within the past few years, major breakthroughs have been achieved for quantifying the entire electron microscopy image (intensities, distances, phase, and amplitude). This symposium coversrecentadvances in accurate/precise measurements in both conventional high resolution and scanning transmission electron microscopies. Invited papers will include technique development and applications where having an absolute, quantitative scale is critical to gaining new material insights. In particular, this symposium will focus on unique and innovative approaches to solve the challenges associated quantifying images. The target attendees will be a broad mix of materials scientists and physicists aiming to extract more information from their electron microscopy data.

Invited Speakers
  • Christoph Koch, Ulm University, Germany
  • Huolin Xin, Brookhaven National Laboratory
  • Peter Nellist, Oxford University, UK
  • Naoya Shibata, University of Tokyo, Japan
  • Jianwei Miao, University of California, Los Angeles


A16 New Frontiers in Monochromated EELS

Organizers: Ian MacLaren, Peter Crozier
Using EELS and EELS spectrum imaging with new monochromated instruments offering < 200 meV energy resolution will revolutionize our understanding of nanoscale processes in materials, nanostructured systems and devices. Specifically, it will have a huge impact on our understanding on the nanoscale localization of low energy excitations in solids, including in plasmonics, vibrational spectroscopy, and interband transitions. Contributions are therefore invited in instrumentation and technique development, applications and data analysis, theory, and correlation to complementary techniques.

Invited Speakers
  • Ondrej Krivanek, Nion
  • Quentin Ramasse, SuperSTEM, UK
  • Peter Rez, Arizona State University
  • Kazu Suenaga, Advanced Industrial Science and Technology, Japan
  • Gianluigi Botton, McMaster University, Canada
  • David McComb, The Ohio State University

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