2017 Pre-Meeting Congresses

• Separate registration fee required; see registration information on website, and form for details (form available March 1, 2017).
• Click on the individual Congress listings below for information on meals and breaks.

X60 Inaugural Pre-Meeting Congress for Early Career Professionals in Microscopy & Microanalysis

X61 Focused Ion Beam Applications and Equipment Developments

X62 Smaller, Faster, Better: New Instrumentation for Electron Microscopy

X63 Understanding Radiation Beam-Damage during Cryo-, ETEM, Gas- and Liquid-Cell Electron Microscopy