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2017 Pre-Meeting Congresses
Separate registration fee required; see registration information on website, and form for details (form available March 1, 2017).
Click on the individual Congress listings below for information on meals and breaks.
X60 Inaugural Pre-Meeting Congress for Early Career Professionals in Microscopy & Microanalysis
X61 Focused Ion Beam Applications and Equipment Developments
X62 Smaller, Faster, Better: New Instrumentation for Electron Microscopy
X63 Understanding Radiation Beam-Damage during Cryo-, ETEM, Gas- and Liquid-Cell Electron Microscopy
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