Vendor Tutorials

Exhibitor Booth # Title of Tutorial Date Brief Description
Bruker Corp. 514 Crystal Orientation Mapping and Imaging at Nanometer Scale Using On-Axis TKD Monday, Aug 6th, 2018 Introduced just a few years ago, TKD in SEM, a.k.a. t-EBSD, has already become an established technique due to its much better spatial resolution as compared to standard EBSD and to the ever increasing need of analytical tools for characterizing nanomaterials. The original sample-detector configuration using the standard EBSD detector a.k.a off-axis TKD had certain limitations resulting in a drop in data quality and/or measurement efficiency. The two most important drawbacks of off-axis TKD were the strong gnomonic projection distortions in the patterns and the fact that the patterns were produced by high angle scattering electrons, i.e. very weak signal. We are going to demonstrate the unique capability of on-axis TKD which does not have these limitations. The most important factors influencing the spatial resolution of TKD in SEM will also be discussed as well as its integration with other techniques like Energy Dispersive X-Ray Spectroscopy (EDS).
Coxem Co. Ltd 614 Achieving High-Quality SEM Cross Section Imaging - A NEW Affordable Ion Mill Cross Section Polisher Monday, Aug 6th, 2018 We will be introducing our NEW Ion Mill Cross Section Polisher which is much more affordable compared to traditional products on the market.
EXpressLO LLC 538 Theory and Applications of ex situ Lift Out Monday, Aug 6th, 2018 The EXLO theory and methods will be discussed and applications in specimen lift out and manipulation will be demonstrated.
Gatan 824 Advances in EELS and EFTEM Analysis Monday, Aug 6th, 2018 Please join Gatan to learn about the latest results from our EELS systems focusing on high-speed acquisition, fine structure analysis and sensitivity improvements. We will highlight the tools and methodology used to acquire these results.
Gatan 824 Correlating Physical and Optical Properties Down to the Nanoscale Using Cathodoluminescence Monday, Aug 6th, 2018 Characterization of the optical properties of materials with spatial resolution better than the diffraction limit of light is required to further our understanding of nanostructured materials and devices, and light-matter interactions. The technique of cathodoluminescence (CL) performed in the scanning- and transmission- electron microscopes has gained great interest to study optical properties at the nanoscale due to the ability to excite optical processes with a sub-nanometer probe of electrons. Light emission is defined by its distribution in energy (wavelength), momentum (angular), and polarization and in this tutorial, we will review how the latest tools are being used to understand all three distributions, delivering the most complete understanding to date of optical properties at the nanoscale and the most accurate correlation with physical properties.
Hitachi High Technologies America, Inc. 1125 Advanced Software Image Processing for Hitachi EM/IM Systems Monday, Aug 6th, 2018 Image analysis software enhances data collection for those who wish to increase accuracy and automate research, development and quality processes. Site-specific surface analysis via SEM with Hitachi Map3D software can quickly acquire micron and nano-specific 3-dimensional model surfaces using either by stereo pairs or simultaneous acquisition using integrated image detectors. Automated image processing such as particle size analysis and 3-dimensional volumetric rendering reveals information beyond traditional microscopy techniques for applications in numerous sciences. Image-Pro and Hitachi delivers an integrated solution with macro driven customizability for automated routines on the latest Hitachi EM/IM platforms.

In this tutorial we will present multiple image processing applications including a Show-and-Learn session live with data generated from the latest microscope platforms for 2D and 3D applications. Join us to learn more about automated microscopy!
IDES, Inc. 437 Compressively Sensed Video in Transmission Electron Microscopy Monday, Aug 6th, 2018  
JEOL USA, INC 812 Various Acquisition Options with serialEM Monday, Aug 6th, 2018 The workshop focuses on using SerialEM on the JEOL JEM-1400Flash for montaging, tomography and setting up for unattended image for a single particle acquisition.
MEO Engineering / PBS&T 330 Gas Injection, Etching, and Deposition in FIB/SEM Monday, Aug 6th, 2018 Principles of Gas-Assisted Etching (GAE) and beam-induced deposition in Focused Ion Beam (FIB) and Electron Beam (SEM) systems, covering gas injection into vacuum apparatus, types of GAE reactions and precursors, influence of gas flux and raster parameters on dynamics of GAE and deposition processes, and highlights of GALEX(TM) Gas-Injection System (GIS) features.
point electronic GmbH 908 New Generation of Detectors and Electronics for Quantitative BSE Monday, Aug 6th, 2018 The workshop covers new developments in detector and image acquisition technology for BackScatter Electron (BSE) techniques. The new high-speed detector technology developed by PNDetector will be described, as well as the new high-temperature detector developed by Point Electronic. Calibrated signal amplification and acquisition is also detailed, including software for acquisition and analysis. Workflows for quantitative analysis (qBSE) and height measurements (SEM topography) are described. Applications illustrated include measurement of density, roughness and step height, as well as measurement of FIB milling and deposition rates.
Protochips 1238 Latest Advancements in the Protochips in situ Product Suite Monday, Aug 6th, 2018  
SEMTech Solutions, Inc. 531 Upgrading SEMs with Win10 Software Monday, Aug 6th, 2018 Hands on review of the new SEMView 8000 package, with Universal Electronics Control, on a refurbished FEI XL-30 ESEM and AMRAY 1830 SEM. The SEMView 8000 is now capable of upgrading most SEMs with 64 MegaPixel image capture, along with full control of the column, stage, and vacuum running under a Win10 software platform.
TESCAN USA Inc. 413 Automation of SEM Experiments and Calibration using SharkSEM and Python Monday, Aug 6th, 2018 SharkSEM has enabled simple and robust control of Tescan's SEMs through Python, allowing for automated control of experiments. Examples will be provided for how automation tasks have been integrated into serial sectioning experiments.  The impact of automated microscopy will be explained in the context of developing an autonomous material-to-information pipeline.
TESCAN USA Inc. 413 Exploring Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Integrated with FIB-SEM Monday, Aug 6th, 2018 TOF-SIMS provides another powerful capability to analyze materials within the FIB-SEM. The fundamentals of TOF-SIMS analysis and its application to materials characterization in the FIB-SEM environment will be presented.
Vitatech Electromagnetics LLC 1418 Passive Shielding, Revealed! Monday, Aug 6th, 2018 Live hands-on demonstration of the superiority of passive shielding compared to ACS only EMI solutions.
Digital Surf 425 3D Photogrammetry for SEM Monday, Aug 6th, 2018 How to reconstruct a 3D model from your SEM data in just a few seconds
Vitatech Electromagnetics LLC 1418 Retrofitting Existing Imaging Tools with Active Compensation Systems Monday, Aug 6th, 2018 Existing facilities for Electron Microscope present certain challenges for traditional electromagnetic mitigation which can be successfully abated with an Active Compensation System (ACS).
Angstrom Scientific, Inc. 1138 Demonstration of NANOPSIS M - The World's First Microsphere Objective Lens Microscope to Surpass the Optical Diffraction Limit Tuesday, Aug 7th, 2018 The NANOPSIS M is a bright-field microscope tuned to work with SMAL, the world's most powerful water-immersed objective lens with a 4 - 6 x performance increase over a regular 100 x lens. Semiconductor sample live scanning will be demonstrated.
Bruker Corp. 514 High-Speed Elemental Mapping with Micro-XRF/SEM Tuesday, Aug 7th, 2018 Introduced just a few years ago, micro-XRF has become a widely used analytical technique in SEM. One major application is element distribution measurements. However, the X-ray beam cannot be scanned as the electron beam in the SEM. Thus, the change of the measurement position has to be performed by SEM stage movement. In most SEMs, moving the stage from point to point is time consuming which results in long acquisition times. We are going to demonstrate our new piezo sub-stage which will be mounted directly on the existing SEM stage. This new stage enables distribution analysis "on the fly" meaning the stage never stops during acquisition with a maximum speed of up to 20 mm/s. Useful information on element distribution can already be obtained with an acquisition time of 1 ms per pixel. Seamlessly integrated in the ESPRIT software suite, it even allows the use of EDS and micro-XRF mapping simultaneously.
Bruker Corp. 514 Quantitative Element Mapping and Analysis of (Mainly) Electron Transparent Samples Using EDS Tuesday, Aug 7th, 2018 With the advent of SDD technology Energy Dispersive X-Ray Spectroscopy (EDS) for STEM is growing into a wide spread well-established serious analysis technique. Just identifying elements is not good enough, it becomes more and more relevant to know how many atoms there are of which element. How well can this be measured without a few assumptions and how does the composition develop during e.g. in-situ experiments?
The tutorial introduces possibilities for quantitative EDS in STEM compared to SEM and in relation to some other STEM analysis techniques. Quantitative EDS using Bruker ESPRIT SW for off-line data analysis is demonstrated. Advantages of version 2 vs version 1.9 are shown and analysis approaches tailored to specific challenges, such as nanoparticles, interfaces and composition changes during in situ experiments, are discussed.
Carl Zeiss Microscopy, LLC 624 Connecting Modern Microscopy and Classical Metallography to Train the Next Generation of Scientists Tuesday, Aug 7th, 2018 Our imaginations continue to drive the development of taller towers, stronger ships, and improved manufacturing. Despite exploding research and development in new materials, the value and importance of metals to the modern world remains clear. ASM International is a world leader in metallography education and training, offering classroom and laboratory coursework for a wide audience from career metallurgists to aspiring materials scientists in high school. In particular, metallographic preparation, microstructure interpretation, and failure analysis training programs at ASM International covers macroscopic preparation to microscopic evaluation of samples. Through a strategic partnership with ZEISS, light and electron microscopes enhance this coursework. Elemental mapping and semi-quantitative analysis of phases and constituents broaden the tools available to students. Correlative microscopy enables a convenient workflow for direct comparison of light and electron microscope contrast methods of a single area. This approach provides a complete toolbox for answering demanding industrial problems and teaching metallurgical concepts.
Carl Zeiss Microscopy, LLC 624 REFINE Your View, Imaging Tales from a Multi-Modal Lab Tuesday, Aug 7th, 2018 Multi-modal characterization workflows require a suite of tools that interact in such a way that details typically omitted or overlooked by singular techniques are elucidated in an easy to obtain and well correlated fashion. Whether spanning traditional throughput, length scale, or sample interaction limitations, imaging tools are increasingly capable of utilizing data from one instrument to guide the efforts undertaken by additional downstream methods. Examples of multi-modal investigations on advanced coatings will be used to illustrate the impact of complementary information from various forms of microscopy including both non-destructive (XRM) and destructive (FIBSEM) forms of 3-dimensional analysis
Coxem Co. Ltd 614 The NEW EM-30 LE with STEM Capability - the Most Advanced Tabletop SEM in the world Tuesday, Aug 7th, 2018 We will be showing the capabilities of the NEW EM-30 LE using CeB6 electron source along with a NEW STEM detector for low kV TEM analysis. The EM-30 LE has 300,000X magnfication with 4nm Resolution and several other new features.
Digital Surf 425 Apply Color to SEM Images Quickly and Easily Tuesday, Aug 7th, 2018 How to colorize your black & white SEM image
Direct Electron 738 Recent Developments for Cryo-EM Tuesday, Aug 7th, 2018 We'll share our recent developments related to biological cryo-EM, including improvements to hardware and algorithms for better electron counting, high-throughput data collection, large-area tomography, etc.
E.A. Fischione Instruments, Inc. 424 Versatile and Reliable Sample Preparation for SEM: Model 1061 SEM Mill Tuesday, Aug 7th, 2018 Fischione Instruments Model 1061 SEM Mill is a fast and precise ion mill for cross-section and plan view sample preparation. The SEM Mill offers stage cooling for beam-sensitive materials and vacuum transfer capability for atmosphere-sensitive materials.
Gatan 824 Application of High Speed Cameras for 4D Data Collection in STEM Tuesday, Aug 7th, 2018 Diffraction patterns directly provide crystallographic information about the specimen, which can be used to determine material structures, atomic displacements and structural modulations in crystals. This tutorial gives a quick introduction on different electron diffraction methods in transmission electron microscopy and discusses how 4D STEM diffraction-imaging experiments can benefit from high speed cameras. This will include live demonstrations of Digital Micrograph application used to collect, visualize and analyze 4D STEM diffraction datasets.
Gatan 824 Latest Developments in Gatan Microscopy Suite Tuesday, Aug 7th, 2018 We will highlight the latest new developments in Gatan Microscopy Suite (GMS), including new image analysis routines, a whole new paradigm in data presentation, new STEM and EELS features and more.
Hitachi High Technologies America, Inc. 1125 Advanced Software Image Processing for Hitachi EM/IM Systems Tuesday, Aug 7th, 2018 Image analysis software enhances data collection for those who wish to increase accuracy and automate research, development and quality processes. Site-specific surface analysis via SEM with Hitachi Map3D software can quickly acquire micron and nano-specific 3-dimensional model surfaces using either by stereo pairs or simultaneous acquisition using integrated image detectors. Automated image processing such as particle size analysis and 3-dimensional volumetric rendering reveals information beyond traditional microscopy techniques for applications in numerous sciences. Image-Pro and Hitachi delivers an integrated solution with macro driven customizability for automated routines on the latest Hitachi EM/IM platforms.

In this tutorial we will present multiple image processing applications including a Show-and-Learn session live with data generated from the latest microscope platforms for 2D and 3D applications. Join us to learn more about automated microscopy!
HREM 906 SmartAlign Plug-In Tuesday, Aug 7th, 2018 SmartAlign plug-in with Template matching module will be presented by the original developer.
Hummingbird Scientific 605 Exploring Heating and Heating/Biasing Experiments with in situ Electron Microscopy Tuesday, Aug 7th, 2018 In this tutorial we will present our newest in-situ electron microscopy platforms to perform heating and heating/biasing experiments with MEMS-based chips. We will cover the platforms capabilities and present different examples, such as the crystallization of titanium oxide amorphous thin films and the melting of Au particles (melting temperature: 1064° Celsius). Practical considerations such as sample drift, power consumption, and how samples are prepared will be discussed -- the chips where samples are mounted for characterization are contacted to the sample holder via a robust mechanism that guarantees good electrical contacts and easy sample preparation.
JEOL USA, Inc 812 Atomic Resolution TEM with Cs Correction/Cold FEG and Molecular Microscopy with Mass Spec Imaging Tuesday, Aug 7th, 2018 Two ends of the microscopy spectrum, from atomic resolution imaging to mass spec imaging, will be presented by Eric Stach, University of Pennsylvania and Robert Cody, JEOL USA
MEO Engineering / PBS&T 330 Cost of Maintaining and Useful Lifetime of FIB/SEM Equipment Tuesday, Aug 7th, 2018 Overview of pros, cons, and cost/benefit considerations for support models of FIB/SEM instrumentation and other capital equipment: extended warranty, OEM and third-party service contracts, Time and Materials (T&M) service calls, service insurance, and self-service with diversified support. Considerations for reducing cost of ownership and extending useful lifetime beyond the forced obsolescence, avenues for procurement of spare parts, consumable components, maintenance training, and support.
Microscopy Innovations 718 Walk-Away Specimen Preparation of Biological Tissue for TEM and Immunogold Labeling using ThemPrepâ„¢ ASP-1000 Automated Specimen Processor Tuesday, Aug 7th, 2018 Learn about rapid robotic parallel processing of multiple kidney, muscle and liver tissue specimens plus fullyautomated on-grid immunogold labeling using innovative mPrep capsules and the mPrep ASP-1000 Automated Specimen Processor. Kidney is processed from fixative rinse through infiltration in about an hour and other tissues typically in about 2 hours. See the ASP-1000's new fume containment system and control software with three-tiered user access and text alert signaling to operators.
Olympus America, Inc. 612 Surface Roughness 101 using Laser Scanning Confocal Microscopy Tuesday, Aug 7th, 2018 Surface metrology, measurement of solid surfaces topography, has become an important topic for many material scientists and engineers. Laser Scanning Confocal Microscopy (LSCM) is non-contact and non-destructive to samples, requires minimal sample preparation, and provides single nanometer-level resolution. In this session we will review these capabilities using Olympus' LEXT OLS5000 3D Laser Scanning Confocal Microscope.
Ted Pella, Inc. 1012 BioWave Assisted Processing for Serial Block-Face SEM (SBEM) Tuesday, Aug 7th, 2018 Serial Block-Face SEM dictates the need for an extended sample processing protocol involving several metal stains in order to increase the signal and the conductivity of the sample. Unfortunately the routine SBEM protocol now used in most labs takes 5 days to perform. However, using the PELCO Biowave Pro+ to assist in the processing gives a substantial saving in time and the entire process can now be completed in under a day and samples processed in this way give identical results in the SBEM to those processed by the standard long protocol. Presented by Rick Webb, Sr. Research Officer, University of Queensland
TVIPS 809 CMOS based TEM camera for fast image acquisition combined with high sensitivity and high dynamic range Tuesday, Aug 7th, 2018 CMOS based TEM camera and its unique properties that makes it an ideal choice for various application including in-situ experiments and MicroED.
Vitatech Electromagnetics LLC 1418 Passive Shielding, Revealed! Tuesday, Aug 7th, 2018 Live hands-on demonstration of the superiority of passive shielding compared to ACS only EMI solutions.
Vitatech Electromagnetics LLC 1418 Retrofitting existing Imaging Tools with Active Compensation Systems Tuesday, Aug 7th, 2018 Existing facilities for Electron Microscope present certain challenges for traditional electromagnetic mitigation which can be successfully abated with an Active Compensation System (ACS).
point electronic GmbH 908 New Generation of Detectors and Electronics for Quantitative BSE Tuesday, Aug 7th, 2018 The workshop covers new developments in detector and image acquisition technology for BackScatter Electron (BSE) techniques. The new high-speed detector technology developed by PNDetector will be described, as well as the new high-temperature detector developed by Point Electronic. Calibrated signal amplification and acquisition is also detailed, including software for acquisition and analysis. Workflows for quantitative analysis (qBSE) and height measurements (SEM topography) are described. Applications illustrated include measurement of density, roughness and step height, as well as measurement of FIB milling and deposition rates.
SEMTech Solutions, Inc. 531 Upgrading SEMs with Win10 Software Tuesday, Aug 7th, 2018 Hands on review of the new SEMView 8000 package, with Universal Electronics Control, on a refurbished FEI XL-30 ESEM and AMRAY 1830 SEM. The SEMView 8000 is now capable of upgrading most SEMs with 64 MegaPixel image capture, along with full control of the column, stage, and vacuum running under a Win10 software platform.
Agilent Technologies 537 Simplifying Core Facility and Shared Resource Management Wednesday, Aug 8th, 2018 Agilent's iLab Operations Software is the global leader in web-based facility management tools. Learn why more than 175 institutions use iLab to schedule, manage projects, track usage, report, and bill.
Angstrom Scientific, Inc. 1138 Demonstration of NANOPSIS M - The World's First Microsphere Objective Lens Microscope to Surpass the Optical Diffraction Limit Wednesday, Aug 8th, 2018 The NANOPSIS M is a bright-field microscope tuned to work with SMAL, the world's most powerful water-immersed objective lens with a 4 - 6 x performance increase over a regular 100 x lens. Semiconductor sample live scanning will be demonstrated.
Bruker Corp. 514 Bruker XFlash FlatQUAD EDS Detector - Gaining Analytical Advantages using an Annular Four-Channel Silicon Drift Detector Wednesday, Aug 8th, 2018 As Silicon Drift Detectors (SDDs) have become the standard detectors for energy dispersive x-ray detection in the last years, special detector designs and concepts can bring the performance to the next level. During this tutorial, you will learn more about the special multi-element concept of the XFlash® FlatQUAD, an annular detector that can be placed between the pole piece and the sample in a standard SEM using a BSE detector like setup. This setup leads to an extremely large solid angle of more than 1 sr which is typically 100 times larger than standard 10mm detectors in a conventional inclined setup as well as to a high take-off angle. Therefore extremely high count rates can be achieved easily even with low probe currents, and can be processed with four separate electronic channels in parallel, leading to maximum output count rate of more than 2,400,000 cps. These properties make the detector an ideal device for high speed mapping applications or beam sensitive sample at low accelerating voltages and beam currents and samples with an extreme topography.
Coxem Co. Ltd. 614 Automated Particle Analysis with the New SELPA and CX-200plus using Oxford AZtecEnergy Wednesday, Aug 8th, 2018 This is the first introduction for NEW capabilities in Automated Particle / Feature Analysis using the new CX-200plus SEM with Oxford AZtecEnergy. Applications include ISO Cleanliness, ASTM Steel Analysis, wear particles, Gun Shot Residue, Mineralogy, Geology and more.
Digital Surf 425 3D Photogrammetry for SEM Wednesday, Aug 8th, 2018 How to reconstruct a 3D model from your SEM data in just a few seconds
Direct Electron 738 Innovations for Materials Science TEM Wednesday, Aug 8th, 2018 We'll share our recent developments related to materials science TEM/STEM, including high-speed 4D-STEM/ptychography, high-speed in situ TEM, low-dose imaging, compressive sensing, etc.
E.A. Fischione Instruments, Inc. 424 Cryo-Transfer Tomography Holder for Advanced Cryo-Electron Microscopy Wednesday, Aug 8th, 2018 Learn more about Fischione Instruments' Model 2550 Cryo Transfer Tomography Holder; an easy to use holder for cryo transfer and tomography of thin-film frozen-hydrated/vitrified specimens for low-dose imaging and analysis.
Gatan 824 Capturing in situ EELS Video Datasets Wednesday, Aug 8th, 2018 For many in-situ experiments, dynamic behavior is irreversible, and thus, only one in-situ experiment can be performed on a single TEM sample. This makes it essential to gather as much time-resolved data simultaneously as possible, since the material may be very different during subsequent acquisitions, and the dynamics of interest may no longer be observable. Acquiring chemical information from EELS can often be an important part of interpreting the dynamics from ¬in-situ experiments. In this tutorial, workflows for in-situ EELS acquisition in GMS 3 will be explained and example datasets will be shown. Examples include core-loss, low-loss excitations, EFTEM and STEM-EELS.
Hitachi High Technologies America, Inc. 1125 Advanced MEMS In-Situ Technology for SEM & TEM - HTC Blaze Heating Holders Wednesday, Aug 8th, 2018 Advanced MEMS heaters combined with precise feedback temperature control enable high-performance in-situ capabilities of Hitachi SEM and TEM microscopes. The Blaze heating holder allows for ultra-high resolution studies at elevated temperatures due to its highly stable configuration and features easy-to-use software to provide an effective solution for all your heating needs.

In this tutorial we will present you results of selected heating studies as well as showcase the Blaze heating holders during live demonstrations on the SU7000 FE-SEM as well as HT7800 TEM. Join us to experience microscopy at the Xtreme Performance level!
HREM 906 qDPC Plug-In Wednesday, Aug 8th, 2018 The plug-in for quantitative DPC (differential phase contrast) will be presented by the original developer.
Hummingbird Scientific 605 Replicating Bulk-Level Electrochemistry in Liquid Cell TEM Wednesday, Aug 8th, 2018 In this tutorial we will present our newest in-situ electrochemical liquid cell TEM sample holder, which allows to acquire time-dependent electrochemistry data comparable to bulk samples. We will show the integration of the electrochemical liquid cell with an advanced hardware system and optimized MEMS-based chips, which have special electrodes configurations that allow true quantitative measurements of electrochemical processes in the TEM. This new in-situ TEM platform will enable and impact several areas of research, including electrochemistry, photocatalysis, and other energy related applications.
Microscopy Innovations 718 The mPrepâ„¢ System for Specimen Prep - What Has it Done Lately in Labs Like Yours? Wednesday, Aug 8th, 2018 As more users adopt the innovative mPrep® System, documented applications have grown to include biological sample prep for TEM (including ultra-rapid tissue and organism embedding), rapid prep for serial block-face SEM, virus TEM in demanding BSL3/4 labs, immuno-gold labeling, cryo-facing SEM, pharmaceutical and medical device applications, nanoparticles, and more. The tutorial will discuss applications requested by attendees.
point electronic GmbH 908 New Generation of Detectors and Electronics for Quantitative BSE Wednesday, Aug 8th, 2018 The workshop covers new developments in detector and image acquisition technology for BackScatter Electron (BSE) techniques. The new high-speed detector technology developed by PNDetector will be described, as well as the new high-temperature detector developed by Point Electronic. Calibrated signal amplification and acquisition is also detailed, including software for acquisition and analysis. Workflows for quantitative analysis (qBSE) and height measurements (SEM topography) are described. Applications illustrated include measurement of density, roughness and step height, as well as measurement of FIB milling and deposition rates.
Protochips 1238 Edge Engineering of 2D Materials Using in situ Heating Wednesday, Aug 8th, 2018  
RMC Boeckeler 1031 3D Reconstruction: Beyond Connectomics Wednesday, Aug 8th, 2018 Various applications of 3D nano-technology presented by Naomi Kamasa and Connon Thomas from Max Planck Florida Institute for Neuroscience.
SEMTech Solutions, Inc. 531 Upgrading SEMs with Win10 Software Wednesday, Aug 8th, 2018 Hands on review of the new SEMView 8000 package, with Universal Electronics Control, on a refurbished FEI XL-30 ESEM and AMRAY 1830 SEM. The SEMView 8000 is now capable of upgrading most SEMs with 64 MegaPixel image capture, along with full control of the column, stage, and vacuum running under a Win10 software platform.
TESCAN USA Inc. 413 Applications for Quantitative Phase Imaging Using the TESCAN Q-PHASE Microscope Wednesday, Aug 8th, 2018 Growing interest in the intersection of engineering and the life sciences has led to an increasing number of research studies using live-cell imaging techniques to provide critical insight into the fundamental nature of cellular and tissue function. This presentation provides an overview of the recent collaborative effort between UNF and the Mayo Clinic utilizing the TESCAN Q-PHASE microscope for label-free, time-lapse, holographic quantitative-phase-imaging (QPI) in cytometry and cytomorphology studies
TESCAN USA Inc. 413 RISE, the Confocal Raman Mapping in SEM: A Very Promising Approach for Geo-Materials and Mineralogy Wednesday, Aug 8th, 2018 The application of RISE to geosciences will be illustrated by various practical examples in the field of geo-materials and mineralogy. The Use of a SEM-EDS coupled to confocal Raman-in-SEM imaging (RISE) is a new and efficient method for identifying the mineral nature of natural materials.
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