All M&M 2018 symposia, workshops and official events will be held at the Baltimore Convention Center.
Technologists' Forum
X30 - Technologists' Forum: E. Ann Ellis Memorial Symposium
Andreas Holzenburg, University of Texas, Rio Grande Valley
Janice G. Pennington, University of Wisconsin
"If we don't have a protocol, we are developing one," said Ann Ellis when interviewing for the position of research scientist in the Microscopy & Imaging Center at Texas A&M University. After she joined the team when asked how she liked it, she responded, "Oh, this is my dream job." What did she get so excited about? Helping faculty, staff and students with their specimen preparation and imaging needs; teaching theory (never without a strong hands-on component); developing new protocols to improve specimen preparation methodology to enable data acquisition to those who otherwise could afford it; imparting knowledge on ultrastructural pathology; and engaging in outreach efforts. And she did it with a passion second to none. Ann dedicated her life to electron microscopy and specimen preparation, and to the Microscopy Society of America and local affiliate societies alike, such as her all-time favorite SEEMS.
This symposium celebrates the life of Ann Ellis with talks covering research studies that benefited and still benefit from Ann's input and approach, or simply echo her passion for it.
X31 - Technologists' Forum Special Topic Session: Specimen Preparation for Correlative FIB-SEM and XRM
Caroline Miller, Indiana University School of Medicine
3D characterization and modeling of microstructures at levels of light and electron microscopy has had a surge in interest and activity across a variety of scientific fields. Correlative work using FIB-SEM and XRM microscopes are being used to gain the necessary data and understanding of different types of microstructures from the materials to the biological world. A thorough knowledge of specimen preparation is required to achieve the maximum amount of correct information from these microscopes, while avoiding artifacts. It is important to examine surface features that represent structures not modified due to specimen preparation. The purpose of this special session will look at the specimen preparation needed for this type of correlative microscopy.
X32 - Technologists' Forum Roundtable Session: Sample Preparation Strategies for Super-Resolution Correlative Electron Microscopy
Janice G. Pennington, University of Wisconsin
This roundtable session will cover basic steps needed to correlate super-resolution fluorescence microscopy and electron microscopy with emphasis on PALM, iPALM and STORM. Proper balance of fixatives as well as specific infiltration and embedding protocols are necessary to preserve the fluorophore as well the ultrastructural integrity of the sample. Choosing the correct fluorescent label will be discussed as well as alignment of the fluorescent and EM data sets. This discussion will be good for attendees who are new to these techniques.
