Physical Sciences Tutorials

Organizer: Donovan N. Leonard, Oak Ridge National Laboratory

X40 - Scanning Nanobeam Diffraction

Presenter: Colin Ophus, Lawrence Berkeley Laboratory

Traditional scanning transmission electron microscopy (STEM) detectors are large, single pixels that integrate a subset of the transmitted electron beam signal scattered from each electron probe position. These transmitted signals are extremely rich in information, containing localized information on sample structure, composition, phonon spectra, three-dimensional defect crystallography and more. Conventional STEM imaging experiments record only 1-2 values per probe position, throwing away most of the diffracted signal information. With the introduction of extremely high speed direct electron detectors, we can now record a full image of the diffracted electron probe at each position, producing a four-dimensional dataset we refer to as a 4D-STEM experiment. This tutorial will describe the challenges and opportunities created by 4D-STEM.

X41 - Entrepreneurship in the Microscopy Community

Presenter: John Domiano, Protochips

Several entrepreneurs from the microscopy community will be in attendance for a round table Q&A with tutorial attendees on topics including, but not limited to:

X42 - Ultra-high spatial resolution EBSD: Transmission Kikuchi Diffraction (TKD) in the SEM

Presenter: Scott D. Sitzman, The Aerospace Corporation


Biological Sciences Tutorials

Organizer: Tommi A. White, University of Missouri

X43 - Cryo-FIB: Overcoming the Hurdle of Sample Preparation for in situ Cryo-Electron Tomography

Presenter: Miroslava Schaffer, Max Planck Institute of Biochemistry, Germany

In recent years, Cryo-Focussed Ion Beam (Cryo-FIB) milling of frozen hydrated specimen has become a key technique for in-situ Cryo-Electron Tomography, immensely broadening the scientific questions which can be tackled. However, the obtainability of results hinges strongly on the quality of the preparation and its reproducibility. In this tutorial, we will present the technique developments at Max Planck in Martinsried and show what is needed for a reliable, high-quality specimen preparation. We will discuss the critical issues of the preparation workflow, including:

X44 - Single-particle Cryo-EM: Data Processing Techniques for Obtaining Optimal Results

Presenter: Ali Punjani, University of Toronto

Single-particle cryo-EM is a powerful method for resolving near-atomic resolution of 3D structures of a wide variety of biologically important molecules, including membrane proteins and GPCRs. As data collection and sample preparation mature, and the use of cryo-EM expands, expertise and tools for data processing are critical for achieving state-of-the-art results at high resolutions. In this tutorial, we will present a workflow of data processing methods and advanced algorithms available in the cryoSPARC software package for single particle cryo-EM, guiding the audience through processing stages including:

X45 - How to Get Funding for Instrumentation When Budgets Are Tight (Parts I and II)

Presenters: TBD

Do you have questions about how to land an instrumentation grant for a new high-pressure freezing device or a replacement electron microscope? Then these are the tutorials for you! Decreases in federal and institutional budgets, along with increased competition for those resources, have made it more difficult to obtain funding for equipment. How can you maximize your chances for success? What does a funded grant application look like versus a not-funded one? These two tutorial sessions (Parts I and II) will provide you with advice from two different angles: agency officials and successful grant applicants. Come and hear the tips and tricks that they have to share. Be sure to bring your questions.


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