Full Symposium Descriptions
Analytical Sciences Symposia
A01 - Advances in Phase Retrieval Microscopy
Kai He, Clemson University
Charudatta Phatak, Argonne National Laboratory
Martha McCartney, Arizona State University
Toshiaki Tanigaki, Hitachi Ltd.
In the past few years, there have been significant advances in new detectors, computational algorithms and experimental implementations for phase retrieval down to atomic level in electron and X-ray microscopy, such as 4D-STEM, holography, ptychography, differential phase contrast, etc. This symposium focuses on latest theory, algorithms, and instrumentation developments in phase retrieval microscopy using coherent electrons and X-rays, as well as their applications in quantitative and functional imaging of local strain, polarity, electric and magnetic fields for functional materials and biological matters.
A02 - Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Eric Prestat, University of Manchester and SuperSTEM, United Kingdom
Francisco de la PeÃ±a, University of Lille, France
Philippe T. Pinard, Oxford Instruments NanoAnalysis, United Kingdom
Cutting-edge microscopy does not only require state-of-the-art instruments and detectors but also innovative approaches and programs to collect and analyze data. Recent advances in instrumentation and computing capabilities enable the application of machine learning for the processing of microscopy datasets. Furthermore, the development of sustainable, open-source and user-friendly software is of paramount importance to make these algorithms and workflows available widely in the scientific community and to promote reproducible research. This symposium will feature recent progress in data acquisition scheme, processing workflow, algorithm and software in electron microscopy with a focus on, but not limited to, open-source software and machine learning.
A03 - Low-Energy X-ray Spectroscopy: Novel Applications Using Soft X-ray Emission Spectroscopy (SXES), Cathodoluminescence (CL) and Synchrotron Techniques
Anette von der Handt, University of Minnesota
Emma Bullock, Carnegie Institution for Science
Juliane Gross, Rutgers University
Zach Gainsforth, University of California-Berkeley
This symposium will discuss applications and advances in low-energy X-ray spectroscopy utilizing techniques such as soft x-ray emission spectroscopy (SXES), cathodoluminescence (CL), electron energy loss spectroscopy (EELS), X-ray photoelectron spectroscopy (XPS), synchrotron-based analyses (including both absorption and emission spectroscopy), and the software designed to simulate, fit and model electron and X-ray interactions. Applications to be discussed include but are not limited to geological and extraterrestrial materials, semiconductors, biological materials, ceramics, and metals.
A04: Recent Developments in Atom Probe Tomography
Ty Prosa, Cameca Instruments Inc.
Baptiste Gault, Max-Planck-Institut für Eisenforschung, Germany
David J. Larson, Cameca Instruments Inc.
The field of atom probe tomography sees current, extensive research to understand field evaporation of different material systems, to establish theories and models, and also to develop methods that address opportunities for improving the technique (e.g. decreased reconstruction artifacts). New instrumentation developments in APT and field ion microscopy (FIM) are contributing to the expanding range of materials that can be analyzed by these techniques. This symposium focuses on key areas of recent theoretical and methodological developments and highlight the contributions on topics related, but not restricted to:
A05 - Leveraging 3D Imaging and Analysis Methods for New Opportunities in Material Science
Ashwin Shahani, University of Michigan
Roland Brunner, Materials Center Leoben Forschung GmbH, Germany
Wil Harris, Carl Zeiss Microscopy
Erdmann Spiecker, UniversitÃ¤t Erlangen-Nürnberg, Germany
In this symposium, we invite contributions from researchers developing or leveraging 3D imaging and analysis methods to drive new discoveries in materials science. This encompasses data acquisition with a variety of microscopy methods (optical, electron, ion, X-ray, neutron, and more) including 3D and multiscale/modal correlative workflows; as well as challenges associated with big data handling, image processing/analysis, and linking imaging data with computational methods (FEM, CFD, etc.). Examples of relevant classes of materials include, but are certainly not limited to, porous materials, complex intermetallics, energy storage and conversion devices, catalysts, bio-scaffolds, fiber-reinforced composites, hierarchical biomaterials, and additively manufactured components.
A06 - Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
David C. Bell, Harvard University
Natasha Erdman, JEOL USA Inc.
Hector Calderon, Instituto Politécnico Nacional, Mexico
This symposium will cover the physical and instrumental aspects as well as the application of Low Voltage SEM, TEM and STEM, including Low Dose applications to hard and soft materials imaging and analysis. With this symposium we attempt to find out if there are optimum energies/strategies when working with beam sensitive materials and what are the limitations with respect of resolution, applicable dose, achievable contrast and specimen preparation. Use of novel electron column design, beam deceleration techniques and new detector technologies for improvements of both imaging and microanalysis at low voltages will be covered. Analytical aspects of operating at low electron energies will also be discussed. We encourage submissions from both materials science and biological perspective.
A07 - Vendor Symposium
Elizabeth Dickey, North Carolina State University
Deborah Kelly, Virginia Carilion Research Institute
This symposium is a forum for vendors to highlight advances in the development and improvement of their products. It covers new methods and technologies that advance the fields of microscopy and microanalysis for both physical and biological sciences, and provides a forum for exchange of ideas and best practices.
A08 - Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Matthieu Bugnet, University of Lyon - CNRS, France
Patricia Abellan, SuperSTEM Laboratory, United Kingdom
Xiaoqing Pan, University of California-Irvine
Peter Crozier, Arizona State University
Electron energy-loss spectroscopy (EELS) has shed light on countless scientific challenges where correlated (sub)nanometer structural information was key for the elucidation of the local electronic properties and chemistry of materials. This symposium brings together the scientific community for exchanges on the latest research progress in acquisition, processing, and interpretation of low-loss and core-loss EELS. Topics covered include (not limited to): low-energy excitations, q-dependence, aloof EELS, elemental/fine structure mapping, temperature effects and non-destructive analytical characterization of materials by EELS. Studies where EELS is combined with complementary imaging and spectroscopy techniques are also welcomed.
A09: Microscopy and Microanalysis for Real-World Problem Solving
Janet H. Woodward, Buckman
Ke-Bin Low, BASF Corporation
Xiaofeng Zhang, Nanosys Inc.
Microscopy and microanalysis of real-world samples present special challenges. Non-ideal samples may not lend themselves to established methodologies for preparation and analysis. Sample amounts and background information about the material and the problem may be limited, and the time frame for producing results may be very short. This symposium will focus on ways in which biologists and physical scientists develop unique and creative solutions for sample preparation, data acquisition, and analysis, providing meaningful results to solve problems in the real world.
A10 - Advances in Focused Ion Beam Instrumentation, Applications and Techniques
Suzy Vitale, Carnegie Institution of Washington
Joshua Sugar, Sandia National Laboratories
Bruce Arey, Pacific Northwest National Laboratory
Alan Bahm, Thermo Fisher Scientific
The MSA Focused Ion Beam (FIB) Focused Interest Group (FIG) seeks to promote continuous advancement in the instrumentation, applications and techniques involved in focused ion beam work. The objective of this FIG-sponsored symposium is to provide an overview of recent developments of focused ion beam instrumentation, as well as a platform wherein FIB users can share and discuss new, novel applications and techniques across multiple scientific disciplines. Our emphasis will be on innovative approaches to sample preparation, fabrication, and analytics that go beyond conventional methods.
A11 - Current and Emerging Microscopy for Quantum Information Sciences
Miaofang Chi, Oak Ridge National Laboratory
Sonia Conesa-Boj, Delft University of Technology, Netherlands
Lena F. Kourkoutis, Cornell University
Urgent needs for transformative developments in information and energy sciences require the understanding of unusual phenomena at the nanoscale. For example, the strong correlations between electrons, spins, and atoms in many materials, and how they respond to external stimuli (T, E or B) or are modified by atomic structural and chemical defects must be elucidated. However, current experimental tools that can enable visualization, understanding, and control of the electrons, spin states, and ions, are insufficient. This symposium highlights new technique developments, applications, and breakthroughs in characterizing quantum materials and their functionality.
A12 - Advances in Cryo-EM Technology
Mike Marko, Wadsworth Center
Anchi Cheng, NY Structural Biology Center
Radostin Danev, Tokyo University, Japan
Cryo-EM provides single-particle maps with resolution in the sub-3Â range, and sub-tomogram-averaged maps in the 1 nm range, all with the sample in a near-native, hydrated state. This symposium will highlight new technology for specimen preparation, new instrumentation and software that improves the image quality, and processing advancement that pushes the resolution boundary. The symposium will have invited speakers who are key to the latest developments, and will include contributed papers from participants in this exciting field.
Biological Sciences Symposia
B01 - Multi-Modal, Large-Scale, and 3D Correlative Microscopy
James Fitzpatrick, Washington University School of Medicine
Ben Giepmans, University Medical Center Groningen, Netherlands
Jacob Hoogenboom, Delft University of Technology, Netherlands
Imaging using electron microscopy has evolved from taking structural 'snapshot' images to generating large and complex multi-dimensional datasets. Correlative Microscopy is a unique approach to locate rare events and has evolved into a semi-routine technique. However, data acquisition, navigation, molecular recognition, and interpretation of biological function still remains a challenge. We seek to highlight scientific innovations such as correlating 3D structural to 3D functional data, multi-color EM to "fingerprint" biomolecules, and volume-EM approaches. By disseminating these methods, as well as initiatives to share volume-EM data we will enable researchers to infer insights into the regulation of organelles, cells and tissues.
B02 - Element Analysis of Biological Materials
Peta Clode, University of Western Australia, Australia
Stefan Vogt, Argonne National Laboratory
Nicole Hondow, University of Leeds, United Kingdom
This session will encompass all aspects of elemental and isotopic analysis of cells, tissues, and biominerals. Techniques will include (but not be limited to) electron, ion, and X-ray based analytical platforms. Papers will be expected to cover a wide range of applications from the biomedical and biological sciences, and extend into bio-nanotechnology applications. Submissions will be encouraged from experts through to students, with the view to inspiring interaction between biologists, materials scientists, and microanalysts at all levels.
B03 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals
Ru-ching Hsia, University of Maryland-Baltimore
Marcela Redigolo, West Virginia University
Han Chen, Penn State College of Medicine
Microscopy is critically important in the ongoing research, detection, diagnosis and treatment of diseases. Advances that improve rapid and accurate detection and treatment often involve the use of various microscopic techniques in basic and clinical practice and research. These varied techniques provide us with an improved ability to diagnose and study the mechanism, development and pathology of diseases in human, plant and animal specimens. This symposium is an opportunity to share information on the investigation of pathogenic cells, tissues and entire organisms in clinical, diagnostic and research laboratories. Emphasis is placed on using latest microscopy in both clinical and research laboratories.
B04: Cutting Edge Microscopy in the Pacific Northwest
Claudia Lopez, Oregon Health & Science University /Pacific Northwest Center for Cryo-EM
Douglas Keene, Shriners Hospital for Children
The Pacific Northwest has a diverse scientific community crossing many life science disciplines. Each discipline has unique resources to offer the regional community that many researchers from other scientific focuses may not be aware of. On a national scale and as part of the NIH Transformative High Resolution Cryo-Electron Microscopy program, the "Pacific Northwest Center for Cryo-EM" will be introduced to the community. Researchers are invited to present available resources to foster collaborations and pool resources. This symposium will discuss different advances in both fluorescence and electron microscopy, the use of analytical tools to maximize data information and also visualization.
B05 - Light and Fluorescence Microscopy for Imaging Cell Surface and Structure
Justin Taraska, NIH - Laboratory of Molecular & Cellular Imaging
David Zenisek, Yale University School of Medicine
David Perrais, CNRS UMR, Institut interdisciplinaire de Neurosciences, France
Xiaolin Nan, Oregon Health & Sciences University
Advances in light and laser fluorescence resolution, particularly those seen in confocal instruments and total internal reflection fluorescence microscopy, continue to reveal both structural diversity and 4D complexity in cell biology. For this symposium we welcome reports on new developments in instrumentation for light, fluorescence, total internal reflection, light sheet and expansion fluorescence microscopy, and correlative microscopies for light, laser and electron instruments. We encourage advances in exocytosis and endocytosis and membrane remodeling, and resolution of cell signaling structures and pathways. Student posters and platform presentations on emerging research in these modalities and methodologies should consider this symposium.
B06: Pharmaceuticals FIG - Imaging, Analysis, and Regulation of Medical Products, Devices and Data Integrity
Gianpiero Torraca, Amgen, Inc.
This symposium will present diverse content related to the manufacturing and use of pharmaceuticals, medical products/devices and data integrity. Content will feature the use of advanced techniques to address the unique problems that arise during drug discovery, vaccine research, formulation, biocompatibility, production, product life cycle, and eventual patient use. In-depth technical presentations will describe the development of methods specially optimized for use with these real-world materials and biological systems, including hybrid and correlative techniques. Additionally, there will be a focus on data integrity, 21 CFR part 11 and understanding regulations as they specifically apply to the pharmaceutical industry.
B07: 3D Structures: from Macromolecular Assemblies to Whole Cells (3DEM FIG)
Melanie Ohi, University of Michigan Life Sciences Institute
Elitza Tocheva, University of British Columbia, Canada
Teresa Ruiz, University of Vermont
Our understanding of the 3D structure and functional subtleties of complex biological systems has skyrocketed due to recent advances in EM imaging technology and hybrid methodologies. This symposium will highlight structural studies of macromolecules, microorganisms, cells, and tissues using state-of-the-art high-resolution techniques. These techniques include electron crystallography, single particle cryo-EM, helical reconstruction, STEM; AFM, X-ray crystallography, and molecular modeling. Biological topics of interest include: cellular architecture, metabolism, trafficking, communication, and division; gene regulation, transcription, and translation; host-pathogen interactions and virus structure; In situ studies using TEM and SEM, and all aspects of structure-function studies of biological assemblies.
B08 - Cryo-EM - from Physics to Cell Biology: Honoring the Remarkable Legacy of Ken Downing
Melanie Ohi, University of Michigan Life Sciences Institute
Eva Nogales, University of California-Berkeley, Lawrence Berkeley National Laboratory
This symposium will honor Dr. Ken Downing's legacy by showcasing work in single particle cryo-EM, cryo-electron tomography, and microscopy methods that build on his seminal discoveries. Dr. Downing, MSA Fellow and former president, was a titan in the field of electron microscopy (EM). His scientific accomplishments span an amazing range of widely-recognized techniques and methods. Work in his laboratory led to the first high-resolution structure of tubulin using electron crystallography and he made important contributions in the current "resolution revolution" in single particle cryo-EM. Perhaps even more importantly, Ken Downing was a wonderful mentor to the next generation of scientists.
B09 - From Images to Insights: Working with Large Data in Cell Biological Imaging
Kedar Narayan, National Institutes of Health-National Cancer Institute
Camenzind Robinson, St. Jude Children's Research Hospital
Jonathan Lefman, NVIDIA Corporation
"So you've collected these massive image data. Now what?" Technological advances in cell biological imaging have resulted in the generation of massive amounts of data, yet the ability to handle (store, move, access, use, share) these data often lags far behind, especially in smaller labs and core facilities. Appropriate integration and correlation of disparate data streams at various scales, automated feature extraction, and portability of automated solutions remain daunting. This symposium aims to address issues and solutions stemming from large image data in cell biology, including image processing, correlation and segmentation, as well as archiving, annotating and distributing large data especially in the context of available or open-source options.
Physical Sciences Symposia
P01 - In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Dongsheng Li, Pacific Northwest National Laboratory
Haimei Zheng, Lawrence Berkeley National Laboratory and University of California-Berkeley
Benjamin Bammes, Direct Electron
Yu Han, King Abdullah University of Science and Technology, Saudi Arabia
In situ imaging and spectroscopy techniques have emerged as primary tools for characterizing the dynamics of materials formation. The development of in situ capabilities for TEM has led to rapid advances in our understanding of nucleation, growth, assembly in colloidal, electrochemical, organic, semiconductor, and other systems. The symposium covers a broad range of topics including particle nucleation, crystal growth, phase transformations, polymeric and organic/inorganic self-assembly, electrochemical processes, and interface dynamics in gases and liquids. This symposium aims to provide a platform of discussion to understand the physics and chemistry of materials formation for researchers from various fields.
P02 - Microscopy and Microanalysis of Nuclear and Irradiated Materials
Chad Parish, Oak Ridge National Laboratory
Khalid Hattar, Sandia National Laboratories
Pater Hosemann, University of California-Berkeley
Assel Aitkaliyeva, University of Florida
Materials for modern and future nuclear energy systems will be subject to high radiation damage doses, high temperatures, severe corrosion, and other extreme conditions. Designing materials to withstand these conditions, and understanding the response of materials to service or irradiation testing, requires high fidelity microstructural characterization. This symposium intends to bring together experts in nuclear materials science and advanced microscopy, with an emphasis on application of latest-generation methods of microscopy and microanalysis, such as atom probe tomography, aberration-corrected microscopy, transmission Kikuchi diffraction, plasma FIB, advanced data analytics, scanned probe microscopy and nano-mechanics, in situ microscopy, and other new methods, to problems in both traditional and cutting-edge nuclear and irradiated materials.
P03 - Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Joerg Jinschek, The Ohio State University
David Flannigan, University of Minnesota
Dalaver H. Anjum, King Abdullah University of Science & Technology (KAUST), Saudi Arabia
Stig Helveg, Haldor Topsoe A/S, Denmark
Atomic-scale studies performed on beam-sensitive soft and hard matter, including metal-organic frameworks, zeolites, polymers, catalysts, liquid crystals, emulsions, etc. often require novel electron microscopy characterization approaches. It is thus of critical importance to develop new techniques and concepts that control the probing beam in both space and time, to optimize the detection of every scattering event, and to understand the role of sample temperature and environment on irradiation-induced defect accumulation. We welcome submissions involving the development or optimization of EM imaging techniques as well as electron detection tools and schemes that aim for characterizing matter in its genuine atomic state.
P04 - Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Dan Hodoroaba, Federal Institute for Materials Research and Testing (BAM), Germany
Andrew Stewart, University of Limerick, Ireland
Meiken Falke, Bruker Nano GmbH, Germany
Accurate morphological, structural and chemical analysis of low-Z materials at the nanoscale is possible by high-resolution electron microscopy and related spectroscopies/microscopies, but often presents substantial challenges. The symposium invites contributions on qualitative and quantitative analysis of nanostructured light element materials, be that organic, inorganic, bio-, bio-mimetic materials, nano-inclusions or the challenge of quantifying light elements in a heavy matrix. We accept a wide range of techniques. High-Resolution SEM, TEM, STEM in SEM combined with EDS, EELS, CL, or in combination with Raman or Auger electron spectroscopy when used to improve the quantification of the analysis of low-Z materials are welcome.
P05 - Theory and Applications of Electron Tomography in the Materials Sciences
Peter Ercius, Lawrence Berkeley National Laboratory
Robert Hovden, University of Michigan
Sandra Van Aert, University of Antwerp, Belgium
Transmission electron microscopy (TEM) and scanning TEM (STEM) reveal the structure of materials across the nano-scale with achievable resolutions below one Ângstrom. However, these are only two-dimensional (2D) projections of complex three-dimensional (3D) structures. 3D morphology and composition are critical to determine the function of nano-structures used across many fields—such as energy, catalysis, and electronics. The success of electron tomography has fueled rapid innovation in quantitative, sub-nanoscale 3D analysis in electron microscopy that include recent achievements of atomic resolution and methods to determine the 3D structure from few or even a single projection image.
P06 - In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Leopoldo Molina-Luna, Technische Universität Darmstadt, Germany
Lin Zhou, Ames Laboratory
Judy Cha, Yale University
Thomas Pekin, University of California-Berkeley
Phase transformations of nanoscale materials, and corresponding changes in material properties and functionalities, are critical for fundamental science and device applications. In situ transmission electron microscopic (TEM) observations of such phase transformations provide atomic scale information to illuminate the transformation mechanisms and processes, and reveal complexities associated with the phase transformations. This proposed symposium invites in situ (S)TEM experiments that apply heating, cooling, electrical biasing, and mechanical testing to induce and probe phase transformations of functional materials and devices at the nanoscale.
P07 - Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Sergei Rouvimov, University of Notre Dame
Roberto Reis, Northwestern University
Alex Eggeman, University of Manchester, United Kingdom
Electron crystallography is a powerful tool for studying the atomic arrangement of nano-scale structures and their organization into micro-structures and objects, applicable to man-made as well as naturally occurring (biological) materials. This symposium aims to address recent developments in electron diffraction, both experimental (including the growth of scanning diffraction approaches) as well as new detectors allowing the study of materials that were traditionally unsuitable for electron microscopy. The aim is to bring together researchers from physical and biological sciences to share understanding with particular focus on novel materials/systems, new data analyses and computational methods applied to such rich structural data.
P08 - Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Chongmin Wang, Pacific Northwest National Laboratory
Matthew T. McDowell, Georgia Institute of Technology
Yuanyuan Zhu, University of Connecticut
We have witnessed significant progress in the development of new microscopic and spectroscopic techniques based on photons, electrons and ions that have improved spatial and temporal resolution. This has resulted in the unprecedented ability to investigate local structure and chemistry coupled with charge and mass transport in energy materials and devices. This symposium will focus on recent advances in microscopy imaging, diffraction and spectroscopy methods and their application to probe structural and chemical properties of materials with different dimensionalities, such as 2D materials, for energy applications, including batteries, fuel cells, catalyst, photovoltaics and thermoelectric systems.
P09 - The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Masashi Watanabe, Lehigh University
Joseph Michael, Sandia National Laboratories
Paul Kotula, Sandia National Laboratories
Techniques and applications of TEM and STEM are developing at an increasing rate. Reasons include computerization and automation, aberration correction, cryo-microscopy and others. TEM and STEM users can focus more on the data that is available from the instrument and less on the actual operations. Initially, users were educated in the laboratory, more recently, education is through textbooks and lecture courses. This symposium will include developments in TEM and STEM and to link these to improvements in the way TEM and STEM knowledge is transferred by TMBA (successful Textbooks of Microscopy from Basics to Advances, a.k.a. Too Many Bloody Acronyms!).
P10 - Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Donggao Zhao, University of Missouri-Kansas City
Minghua Ren, University of Nevada-Las Vegas
Owen Neill, University of Michigan
Electron microbeam techniques, such as SEM/ESEM, EPMA and TEM/STEM, use a focused electron probe or a small parallel electron beam to bombard a specimen and generate signals at a scale from micrometer down to Angstrom level. These signals include secondary electron (SE), backscattered electron (BSE), characteristic X-ray, Cathodoluminescence (CL), transmitted electron, diffracted or scattered electron, etc. Information acquired using these signals includes image, chemistry and crystal structure of a specimen at micrometer, nanometer and sub-Angstrom levels. The proposed symposium sessions will cover applications of integrated electron probe microscopy and microanalysis techniques in characterizing natural and synthetic materials.
P11 - Advances in Characterization of Geological and Extraterrestrial Samples
Bradley De Gregorio, U.S. Naval Research Laboratory
Kultaransingh (Bobby) Hooghan, Weatherford Laboratories
Lori Hathon, University of Houston
This symposium would be a forum for the exchange of knowledge regarding the formation, history, and use of geological and extraterrestrial samples enabled by advances in microscopy and microanalytical techniques. Invited papers would include investigations of natural samples where microscale and nanoscale imaging and analytical techniques are essential for characterization. Of particular interest would be novel applications of advanced microscopy and microanalysis to geological problems and innovative solutions to long-standing technical challenges for sample preparation and characterization. Target attendees would include scientists and engineers with backgrounds in a broad range of imaging and analytical techniques, but with research interests related to geological and extraterrestrial samples.
P12 - New Frontiers in Atom Probe Tomography Applications
Baishakhi Mazumder, University at Buffalo
Arun Devaraj, Pacific Northwest National Laboratory
This symposium aims to focus on the key areas of where atom probe tomography (APT) is being deployed to provide near-atomic scale compositional analyses and relate this information to physical properties of biological activities. Indeed, APT is used for characterizing an ever-increasing diverse range of material systems starting from wide variety of alloys, semiconductors, large band gap insulators and more recently different minerals and biomaterials. Its use in biology and medicine is also being pushed, following early efforts over 30 years ago. This symposium will cover the use of APT to provide a unique characterization of all types of materials.
P13 - Advanced Characterization of Components Fabricated by Additive Manufacturing
Isabella van Rooyen, Idaho National Laboratory
Mukesh Bachhav, Idaho National Laboratory
Federico Sciammarella, Northern Illinois University
Cesar Terrazas, The University of Texas-El Paso
Additive manufacturing (AM) has emerged as a global disruptive technology in industries such as advanced transportation, nuclear, aerospace for manufacturing complex three-dimensional components by the deposition of ceramic, alloy, or metal precursors. AM techniques provide a unique advantage for multiple industries due to the shortened development and fabrication times, quality of the product, and repeatability of the process. This symposium is intended to be an information exchange forum for cutting-edge microscopy and microanalysis techniques to assess the microstructural design aspect of existing materials and novel materials by various AM method types.