Full Symposium Descriptions


Analytical Sciences Symposia

A01 - Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Yi Jiang, Argonne National Laboratory
Huihuo Zheng, Argonne National Laboratory
Colin Ophus, Lawrence Berkeley National Laboratory
Ellen Keene, Dupont Inc.

Numerical modeling, simulation, data analysis, and visualization are crucial steps in microscopy research. This symposium will feature recent advances in simulation, image reconstruction, data acquisition and analysis workflow. Topics include, but not limited to, novel algorithms (e.g. artificial intelligence, machine learning, forward and inverse modeling, and compressed sensing), high-performance computing, and open-source software for microscopy data. We also encourage discussion of practical challenges and solutions in applying advanced algorithms to real experimental datasets.


A02 - Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

David Muller, Cornell University
Damien McGrouther, University of Glasgow, United Kingdom
Jinwoo Hwang, The Ohio State University

4D-STEM using fast-pixelated detectors has opened tremendous possibilities in the characterization of materials, allowing both physical and life sciences to push to new limits in determining structure and functionality. Through 4D-STEM, great progress has been realized in, for example, electron ptychography for extreme spatial resolution, differential phase contrast imaging of electromagnetic fields, and new imaging methods based on diffraction contrast resolved in multiple dimensions. The symposium will cover the most recent advances and common challenges in 4D-STEM of physical and biological materials, including data acquisition, algorithms and theory for data analysis, new instrumental capabilities and looking further beyond.


A03 - Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences

Toshihiro Aoki, University of California-Irvine
William Bowman, University of California-Irvine
Steven R Spurgeon, Pacific Northwest National Laboratory
Fredrik S Hage, SuperSTEM, United Kingdom

Electron energy-loss spectroscopy (EELS) has progressed substantially in recent years. Advancements in electron monochromator and EEL spectrometer design, along with improvements in detector performance, have made possible the exploration of elemental, structural, electronic, and vibrational properties of materials at the nanometer to atomic scales. It would be beneficial for the scientific community to review recent research progress in EELS. Topics covered include (but are not limited to), low-energy transitions, aloof EELS, elemental/fine structure mapping, and temperature effects, especially research pushing the frontier of science by combining new acquisition and processing methods with advanced instrumentation.


A04 - Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Christian Dwyer, Arizona State University
Paul Voyles, University of Wisconsin-Madison
Philip Batson, Rutgers University
Ye Zhu, Hong Kong Polytechnic University, Hong Kong

Advances in (S)TEM electron optics and detection systems enables the isolation of increasingly weaker scattering signals, which in turn enables both the characterization of subtle structural features within materials and the characterization of radiation-sensitive materials via lower beam doses. For example, STEM-HAADF imaging of individual, heavier dopant atoms within bulk materials is made possible by aberration correction and the high sensitivity of HAADF detectors. As another example, the recent advent of direct electron detectors enables TEM imaging experiments which elucidate the atomic structure of beam-sensitive materials such as zeolites and metal-organic frameworks. Improved detectors also allow a more complete quantification of EELS scattering, for instance, single scattering analyses very close to energy resolution limits in phonon/vibrational scattering. In many cases, data processing, electron scattering simulations and/or materials modeling also play crucial roles. In this symposium, we welcome contributions reporting on such utilizations of weak signals in (S)TEM, EELS and EDX for the characterization of materials, combining advances in instrumentation, image/signal processing, scattering theory, and materials modeling. We also welcome contributions reporting on advances in technique — experimental design, instrumentation, and/or numerical post-processing — that extract subtle, but important detail that might be otherwise be overlooked using standard techniques.


A05 - Crystallography at the Nanoscale and MicroED with Electrons and X-rays

Huifang Xu, University of Wisconsin-Madison
J. G. Wen, Argonne National Laboratory
M. C. Cherukara, Argonne National Laboratory
Marija Gajdardziska, University of Wisconsin-Milwaukee

This symposium will cover full 3D nanocrystal structure and strain determination, including 3D bulk structure, surface structure, crystal defects, nano-precipitates and chemical order/disorder such as grain boundaries, dislocations, impurities and point defects, etc. using electrons and X-rays. This symposium focuses on the latest techniques, theory and algorithms to achieve atomic-resolution 3D tomography using aberration-corrected electron beam, coherent electron & X-ray diffraction imaging, precession electron diffraction, as well as their applications in functional materials, biological and natural crystals.


A06 - Direct Phase Imaging with Coherent Electron Beam in TEM

Myung-Geun Han, Brookhaven National Laboratory
Lin Zhou, Ames Laboratory
Kai He, Clemson University
Martha McCartney, Arizona State University

Phase imaging with coherent electron beam allows unique access to weak phase objects and magnetic/electric fields down to the atomic scale, providing indispensable experimental data for understanding diverse material properties and designing novel devices. This symposium is intended to facilitate the exchange of information and scientific discussion regarding the recent progress, challenges and future directions of phase retrieval methods in TEM and their latest applications to hard, soft, and biological materials.


A07 - Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

Stephen Seddio, Thermo Fisher Scientific
Philippe Pinard, Oxford Instruments
Paul Carpenter, Washington University
Nicholas Ritchie, National Institute of Standards and Technology

What will the compositional measurement instrument of the future look like? How can quantitative electron probe microanalysis be improved to address the characterization challenges in materials and geological sciences (smaller phases, lower concentration elements, higher accuracy, larger data size, etc.)? This symposium will seek to answer these questions by featuring advances in hardware and software for energy- and/or wavelength-dispersive spectrometers installed on either electron microprobes or scanning electron microscopes.


A08 - Electron- and Synchrotron-Based X-Ray Imaging and Analysis

Jeffrey Davis, EOS GmbH, Germany
Nikolaus Cordes, Idaho National Laboratory
Eric Telfeyan, GE Global Research
Richard Wuhrer, University of Western Sydney, Australia

This session will bring together researchers performing X-ray imaging with a variety of techniques, including micro-focused X-ray tube methods such as micro XRF, XRD and CT and synchrotron-based coherent beam methods such as X-ray absorption spectroscopy, soft X-ray imaging and holography. We are also actively seeking contributions from researchers using electron beam methods such as SEM-EDS mapping, specifically those doing area fraction phase analysis and hyperspectral clustering. We are soliciting contributions from vendors with new detectors, mapping hardware and software.


A09 - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

Vincent Smentkowski, General Electric - Research
John A Chaney, The Aerospace Corporation
Xiao-Ying Yu, Pacific Northwest National Laboratory
Igor Sokolov, Tufts University

Surface properties dictate the performance of many physical and biological systems. The surface analyst is asked to detect and image species present in ever-lower concentrations and within ever-smaller spatial and depth dimensions. This symposium emphasizes state-of-the-art surface analytical instrumentation encompassing all aspects of surface and near-surface analyses, such as mass spectrometry, scanning probe microscopy and other probe-based techniques. We will cover advanced data analysis tools; correlative imaging (e.g., AFM and SEM; AFM and SIMS; FIB-SIMS); the use of complementary surface instrumentation to perform a complete analysis of complex systems; quantitative microanalysis; data processing; and surface analytical challenges. Both platform and poster presentations are encouraged.


A10 - Structural changes in Hard, Soft, and Biological Samples During Imaging: From Transmission Electron to Helium Ion Microscopy

Jani Kotakoski, University of Vienna, Austria
Gregor Hlawacek, Helmholtz-Zentrum Dresden-Rossendorf, Germany
Olga Ovchinnikova, Oak Ridge National Laboratory
Arkady Krasheninnikov, Helmholtz-Zentrum Dresden-Rossendorf, Germany

Sample degradation in both inorganic and organic materials during imaging is a major problem in transmission electron microscopy. Defects can appear due to kinetic energy transfer from energetic electrons to target atoms, through thermal and electronic excitations or beam-mediated chemical etching. Similar processes also occur in helium ion microscopy. However, structural changes can also be used for modifying the atomic structure of the sample and engineering its properties. We bring together microscopists and experts in atomistic simulations to discuss the current understanding of damage production mechanisms in these microscopy techniques.


A11 - Standards, Reference Materials, and their Applications in Quantitative Microanalysis


Sponsored by the MSA/MAS Focused Interest Group on Microanalytical Standards (FIGMAS).

Anette von der Handt, University of Minnesota
William Nachlas, Syracuse University
Owen Neill, University of Michigan
Julien Allaz, ETH Zürich, Germany

Standards and reference materials are essential for obtaining accurate quantitative compositional data from X-ray microanalysis by EPMA or SEM (WDS/EDS), as well as from other microanalytical techniques (LA-ICP-MS, SIMS, µ-XRF, FTIR, Raman spectroscopy, etc.). These materials must be rigorously evaluated for their reference compositions and homogeneity, must be widely available to the analytical community, and must be properly maintained to avoid contamination or deterioration. We welcome contributions on the synthesis, evaluation, distribution, and maintenance of standards and reference materials, as well as their appropriate use in microanalysis. We further encourage submissions on standard-based applications of quantitative microanalysis, or on the development of new quantitative microanalytical protocols.

A12 - High-Resolving Power, Multi-Modal and Correlative SIMS Imaging in Biology, Geology, and Materials

Jerry Hunter, University of Wisconsin-Madison
Gregory Fisher, Physical Electronics
Christopher Anderton, Pacific Northwest National Laboratory
Tom Wirtz, Luxembourg Institute of Science and Technology (LIST), Luxembourg

This symposium will bring together experts in 2 and 3-dimensional Secondary Ion Mass Spectrometry (SIMS) imaging combined with other morphological, orientation, elemental and molecular imaging techniques (e.g., SEM/EDS, HIM, TEM, EELS, EBSD, APT, SPM, Auger, Raman, MALDI, etc). Topics will include: FIB-SIMS for 3D analysis of heterogeneous materials and buried interfaces; correlative SIMS, Raman and Atom Probe Tomography for geological applications; biological SIMS including correlation with other MS imaging approaches; 2D materials & monolayer films (correlation with Auger, SEM/TEM and morphology with AFM); correlative SIMS, AFM, XPS and Auger analysis for fuel cells, capacitors, batteries, and other industrial applications.


A13 - Microscopy and Microanalysis of Biomineralized and Biomimetic Materials and Structures

Sue Okerstrom, Lichen Labs LLC
Kenneth Livi, Johns Hopkins University
John Fournelle, University of Wisconsin-Madison
Benjamin Linzmeier, University of Wisconsin-Madison

Nature builds functional systems with a handful of materials that have emergent properties at different scales. Calcite crystals form both the self-sharpening teeth sea urchins grind into rock, and armor protection on exoskeletons of some ants. Organic molecules are assembled to produce structural color in butterfly wings and peacock feathers, super-hydrophobic lotus leaves, low-friction sharkskin, and super-adhesive gecko feet. In addition, minerals grown with biological influence are important archives of Earth history and offer new frontiers for materials biomimicry research. Microscopy and microanalysis are important in characterizing material structure and chemistry to elucidate biomineralization mechanisms and the processes responsible for properties emergent on the macroscopic scale. This symposium aims to bring together analysts from broad perspectives to share successes and difficulties of measurement of both hard and soft materials from natural, biomimetic, or engineered materials utilizing a variety of radiation sources and detection systems.


A14 - Vendor Symposium

Yimei Zhu, Brookhaven National Laboratory
Melanie Ohi, University of Michigan
Mike Marko, Wadsworth Center

This symposium is a forum for vendors to highlight important breakthroughs in technology and methodology developed by companies working at the cutting edge of microscopy, microanalysis, and image processing. It covers new instrumentation, technologies and methods that advance all the fields of microscopy and microanalysis for both physical and biological sciences. It will provide an open forum for exchange of ideas and best practices.



Biological Sciences Symposia

B01 - 3D Structures: From Macromolecular Assemblies to Whole Cells (3DEM FIG)

Melanie Ohi, University of Michigan
Debbie Kelly, Pennsylvania State University
Teresa Ruiz, University of Vermont
William Rice, NYU Langone Health

Our understanding of the 3D structure and functional subtleties of complex biological systems has skyrocketed due to recent advances in EM imaging technology and hybrid methodologies. This symposium will highlight structural studies of macromolecules, microorganisms, cells, and tissues using state-of-the-art high-resolution techniques. These techniques include single particle cryo-EM, cryo-electron tomography, helical reconstruction, STEM; AFM, X-ray crystallography, and molecular modeling. Biological topics of interest include cellular architecture, metabolism, trafficking, communication, and division; gene regulation, transcription, and translation; host-pathogen interactions and virus structure; in situ studies using TEM and SEM, and all aspects of structure-function studies of biological assemblies.


B02 - The Promise of Cryo-Electron Tomography

Tommi A. White, University of Missouri
Wim Hagen, EMBL Heidelberg, Germany
Cheri Hampton, UES, Inc. AFRL/RXS

Cryo-electron tomography (CryoET) images a vitrified biological specimen at different tilt angles to make a 3D reconstruction. Imaging limitations are electron dose, tilt-dependent sample thickness, and the current inability to tilt a sample 180 degrees. Sample limitations are thickness and preparation efficiency, especially when preparing cryo-FIB lamellae. Combined with recent technological (direct detection, deep learning), the field of cryo-ET is technically challenging, yet rife with discovery. This session will give an overview of cryoET topics including specimen vitrification, lamella preparation, microscope operation and data collection schemes, reconstruction methods, sub-volume averaging algorithms and data management.


B03 - Methods and Applications in Localization-Based Super-Resolution Microscopy

Aaron Taylor, University of Michigan School of Medicine
Jesse Aaron, Janelia Research Campus
Damon Hoff, University of Michigan

Single molecule localization microscopy (SMLM) utilizes a large sequence of sparse, single molecule fluorescence images to achieve super resolution via estimating the location of many individual fluorophores within a sample. The final 'image' is a graph of the collection of these location estimates. Many probe labeling strategies, both genetic and organic, are now available that provide bright fluorescence as well as the requisite sparse activation. Creative hardware designs based on point-spread function engineering or interferometry can achieve different degrees of axial (z) localization precision as well as different imaging depths, depending on experimental requirements. Using appropriate dyes, image processing algorithms, and system design, sub-20 nm localization precision in x, y, and z can be routinely achieved. This high-localization precision, along with single-molecule sensitivity, has enabled a wide range of biological imaging applications such as sub-diffraction single molecule tracking, very high resolution (50-100 nm) imaging of multiple targets, and even structural reconstructions of macromolecular complexes (<10 nm) where particle averaging is applicable. Methods for fusing SMLM images with other imaging modalities are beginning to emerge.


B04 - Jim Pawley Memorial Symposium

Martin Wessendorf, University of Minnesota
Elizabeth Wright, University of Wisconsin-Madison

James Pawley was known for his contributions in both electron microscopy and in light microscopy. Jim was particularly known for his editing of the Handbook of Biological Confocal Microscopy through its three editions, and for his teaching and mentoring of students via the course "3D Microscopy of Living Cells", which was taught at University of British Columbia. This symposium will provide remembrances of Jim's influential life, as well as speakers on correlational microscopy, which stands at the intersection of light and electron microscopy, and on the new developments in technology fueling each of these two fields.


B05 - Microbes in Focus

Elizabeth Wright, University of Wisconsin-Madison
Kristin Parent, Michigan State University

Our understanding of the structure and function of microbes and microbial communities has advanced significantly with the application of optical and electron microscopy techniques and correlative imaging and analysis methodologies. This symposium highlights structural and ultrastructural studies of bacteria, archaea, fungi, protists, and viruses using microscopy techniques singly or combined with other structural methods. Topics will include microbe architecture and function; microbe-host interactions; species diversity in microbial communities; microbial community structure and function; and interactions, signaling, and sensing in microbial communities. Contributions presenting novel microscopic tools, methods development, and education outreach are strongly encouraged.


B06 - Correlative and Multimodal Microscopy and Imaging of Physical, Environmental, and Biological Sciences

Xiao-Ying Yu, Pacific Northwest National Laboratory
Si Chen, Argonne National Laboratory
James Fitzpatrick, Washington University School of Medicine
Jacob Hoogenboom, Delft University of Technology, The Netherlands

Real-world systems encompass large differences in sizes, arrangements, complexity, and operating principles, presenting scientific and technical challenges. Innovated imaging techniques in microscopy and microanalysis play a pivotal role in enabling observations across different space and time scales. This has led to advances in biology, catalysis, and energy storage, amongst others. This symposium will highlight advancement in sample preparation/handling, instrument development, and analysis of multimodal data sets. We seek contributions from novel applications in correlative electron microscopy, spectroscopy, imaging mass spectrometry (i.e., SIMS), x-ray microscopy and tomography or those addressing big data challenges in visualization and data mining of such measurements.


B07 - Biomedical and Pharmaceutical Research on the Development, Diagnosis, Prevention, and Treatment of Diseases

Ru-ching Hsia, University of Maryland-Baltimore
Daniel Skomski., Merck & Co. Inc.
Claudia López, Oregon Health & Science University
Annie Muske-Dukes, ThermoFisher Scientific

Microscopy is critically important in the research, detection, diagnosis, and therapeutic treatment of diseases. Advances that improve rapid and accurate detection and innovation in drug design and delivery often involve the use of various microscopic and analytical techniques in research, clinical, and manufacturing settings. Discussed will be diverse content related to the research and diagnosis of diseases in humans, plants, and animals, as well as drug discovery, formulation, and commercialization. Content will feature the use of advanced microscopy and imaging techniques to understand disease mechanisms, early detection, therapeutic intervention, drug delivery, and drug formulation across diverse modalities. Emphasis is placed on using the latest microscopy techniques as well as addressing data integrity and regulatory challenges.


B08 - Biological Soft X-Ray Tomography

Carolyn Larabell, University of California-San Francisco
Kenneth Fahy, SiriusXT

This symposium is a forum for the exchange of information and knowledge on the use of soft X-ray tomography for imaging biological specimens. Soft X-ray tomography images fully hydrated, intact cells in 3D without the use of contrast agents or other visualization enabling molecules. Invited papers would include those describing technical advances in specimen preparation, data processing and reconstruction, imaging formation theory, and novel applications of the soft X-ray tomography in cell science. Target audience will include cell biologists, and scientists and engineers interested in novel microscopies, including correlative imaging methods.


B09 - Image Processing Developments in Cryo-EM

Michael Cianfrocco, University of Michigan
Tim Grant, University of Wisconsin-Madison

The focus of this symposium is on the latest advancements in image processing within the cryo-EM field. Invited papers would include those describing new methods and algorithms aimed at improving the results obtained from cryo-EM processing. Specific examples include improving the resolution of single-particle reconstructions and sub-tomogram averages, new ways of dealing with sample heterogeneity, automated processing pipelines, and the use of deep learning techniques. The target audience includes those currently using or planning to use cryo-EM methods who are interested in what is possible using the latest image processing methodologies, and those with a general interest in image processing.


B10 - 3D Scanning Electron Microscopy Imaging of Biological Samples

Mrinalini Hoon, University of Wisconsin-Madison
Josh Morgan, Washington University of St. Louis

This symposium will discuss current techniques for reconstructing biological samples in 3D using scanning electron microscopy (SEM) techniques. Invited speakers will cover ATUM (automatic tape-collecting ultramicrotome) based SEM reconstruction techniques, serial block face SEM and focused ion beam SEM (FIB-SEM) reconstructions of biological preparations. The topics covered in this symposium will enable the audience to gather a comprehensive understanding of the current SEM-based approaches to perform 3D reconstructions of biological samples; understanding the pros and cons associated with each technique; and insights into the softwares used for alignment and segmentation of EM stacks and the analyses routines associated with the different methods. Target audience will include cell biologists, scientists studying cellular ensembles and circuits, and scientists interested in SEM imaging and diverse applications of SEM.


B11 - Advances in Imaging Approaches for Plant Biology

Marisa S. Otegui, University of Wisconsin-Madison
Kirk Czymmek, Donald Danforth Plant Science Center

This symposium will promote the exchange of knowledge in the development and application of different microscopy modalities in plant cell biology. Invited talks will discuss applications of emerging imaging techniques (e.g. super-resolution, clearing, label-free, Raman, electron microscopy, cryo-electron microscopy) as well as approaches for correlation across scales and imaging and analysis modalities in plant research. The target audience will include cell biologists, plant biologists, and engineers interested in technical challenges and opportunities for imaging plant cells.


B12 - Illuminating Health and Disease at New Frontiers of Spatiotemporal Resolution and Adaptive Microscopy

Jay Potts, University of South Carolina
Rengasayee Veerraghavan, The Ohio State University

This symposium presents four important frontiers that have recently transformed optical imaging, including (i) the various methods in breaking the diffraction limit to achieve super-resolution microscopy, (ii) the renaissance of selective plane illumination (light sheet) microscopy, (iii) the integration of adaptive methods into optical microscopy to correct for the heterogeneity in refractive indices, dynamic changes in sample size during development of living specimens, and (iv) emerging methods to image live samples at unprecedented temporal resolution. In turn, these technologies have ushered in an era of big data, which brings new computational challenges as well as the promise of heretofore unachievable rich, quantitative descriptions of living systems. In this symposium, we aim to highlight the exciting possibilities and hurdles faced by modern optical microscopy. In addition, the symposium will cover new developments and techniques used to image life as never before.



Physical Sciences Symposia

P01 - Advances in Electron Microscopy to Characterize Materials Embedded in Devices

Andre Mkhoyan, University of Minnesota
Nasim Alem, The Pennsylvania State University

Research in electronics, optics, and spintronics continues to grow rapidly as new materials are synthesized and incorporated into novel devices. Whereas nanoscale characterization of these materials in their free-standing states is routinely performed, characterization of these materials while they are embedded in their device application remains relatively unexplored. Full characterization of materials in devices would require establishing techniques to overcome unique challenges in sample preparation, data collection and analysis. This symposium will highlight advances in innovative sample preparation as well as novel imaging and spectroscopy techniques using analytical TEM/STEM and SEM to obtain information relevant to devices.


P02 - New Frontiers in Electron Microscopy of Two-Dimensional Materials

Pinshane Huang, University of Illinois — Urbana-Champaign
Robert Hovden, University of Michigan
Shize Yang, Brookhaven National Laboratory

2D materials are ideal systems for electron microscopy: they are a rapidly growing class of quantum systems with emergent electronic properties, low-background imaging substrates, and idealized atomically thin test structures for demonstrating methods at the frontiers of election microscopy. Furthermore, because a single projection image may entirely describe their atomic arrangements, 2D materials are an unparalleled platform for studying the relationships between structure and properties with single atom precision. This symposium seeks to highlight symbiotic developments in electron microscopy and the study of 2D materials, with a focus towards emergent quantum phenomena and pioneering techniques in electron microscopy utilizing 2D materials.


P03 - Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them

Meng Gu, Southern University of Science and Technology, China
Ruoqian Lin, Brookhaven National Laboratory
Chongmin Wang, Pacific Northwest National Laboratory
Kai He, Clemson University

Cryo-TEM has been traditionally used in the study of biological science. However, recently scientists found it very useful in the study of materials science. The advantage of cryo-TEM lies in the reduced damage to radiation-sensitive materials, for instance, batteries, catalysts, organic-inorganic solar cells, and metal-organic frameworks, etc. This symposium welcomes abstracts in all areas of energy-related materials and soft matters studied using cryo-TEM/STEM, as well as cryo-EELS/EDS spectroscopy techniques.


P04 - Advanced Characterization of Nuclear Fuels and Materials

Yaqiao Wu, Boise State University
Simon Pimblott, Idaho National Laboratory
James Cole, Idaho National Laboratory
Darryl Butt, University of Utah

For more than 10 years the Nuclear Science User Facilities program of the Department of Energy Office of Nuclear Energy has supported the development and application of advanced microstructure characterization and micro-scale testing techniques on nuclear fuels and structural (often referred to as "hot") materials at institutions across the U.S. This application of modern techniques provides unique microstructural and chemical information down to the atomic scale. This symposium highlights the world leading capabilities, and the application of state-of-the-art characterization and testing techniques (STEM, FIB, APT, Nanoindenter, PicoIndenter, etc.) to "hot" materials. Presentations on advanced methods of imaging and characterizing fluids in nanometer scale porosity potentially applicable to nuclear energy systems are also encouraged (e.g., tomography, in-situ).


P05 - Advances in Microscopy for Quantum Information Sciences

Manuel Roldan Gutierrez, Arizona State University
Ritesh Sachan, Oklahoma State University
Juan Carlos Idrobo, Oak Ridge National Laboratory
Mathieu Kociak, Universite Paris-Sud, France

Quantum computing has emerged as one of the most interesting research topics in recent years. Materials with active color-centers are identified as promising candidates for achieving energy-efficient quantum computing through individual electron spin manipulation. These color-centers, when precisely positioned in materials, demonstrate switching from a neutral state to negatively charged state when driven by external (photonic, phononic, electric and magnetic) stimuli. This symposium focuses on the recent microscopy-driven advances in the field of color-center manipulated quantum science, which is critical in developing and understanding of the correlations between electron, spin-states and atoms in materials.


P06 - In situ TEM at the Extremes

Andrew Minor, Lawrence Berkeley National Laboratory & University of California, Berkeley
Judith Yang, University of Pittsburgh
Djamel Kaoumi, North Carolina State University
Yang Yang, Lawrence Berkeley National Laboratory

In situ TEM provides unique information about the response of materials under extreme conditions, including extreme environments and/or at extreme spatiotemporal resolution. For example, the degradation of materials under extreme environments (i.e., high temperature, corrosion, mechanical deformation and radiation damage etc.) can be investigated at high resolution with specialized holders or microscope systems. Or, the observation of materials that only exist at conditions far from room temperature. Often, extreme timescales are needed to capture transient events or reversible phenomena. This symposium invites contributions from all in situ TEM experiments that contribute to the methodology development or the understanding of materials at extreme conditions.


P07 - Joint Symposium on FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Hua Guo, Rice University
Chunyang Wang, University of California-Irvine
Matthew Thorseth, Dow
Suzy Vitale, Carnegie Institution for Science

Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) are essential techniques for characterizing materials at high spatial resolution. Both imaging techniques can be used to solve complex three-dimensional (3D) structures from the two-dimensional (2D) images/projections captured, which is known as electron tomography. TEM tomography focuses on structures at nanometer and even atomic resolution, while SEM tomography is able to investigate up tens of micron-sized specimens with the aid of a focused ion beam (FIB). Both applications are supported by FIB techniques such as sample preparation, polishing, and serial sectioning for SEM tomography. In addition, these same FIB techniques can be applied to advanced characterization techniques such as 3D EDS/EBSD and SIMS, and can be correlated to other analytics such as WDS, CL, Raman spectroscopy, and u-CT. This symposium will highlight 3D imaging with electrons and other spectroscopies, sample preparation, image data post-processing strategies, as well as broader developments in FIB/SEM instrumentation, applications and techniques.


P08 - Approaching operando Imaging of Functional Materials

Marc Willinger, ETH Zürich, Switzerland
Raymond Unocic, Oak Ridge National Laboratory
Thomas Hansen, Technical University of Denmark, Denmark

Functional materials should be studied in their functional state. Imaging in vacuum and detailed investigations of equilibrium structures are insufficient to describe the structural and chemical evolution of materials under working conditions. In recent years, there have been significant developments in electron microscopy instrumentation, in situ platforms and detectors which enable in situ and operando experiments to be performed with high spatial-temporal resolution imaging, diffraction and spectroscopy with unprecedented detail. This provides us the opportunity to glimpse into the state of materials during synthesis, degradation or desired function in a well-defined environment. Concomitant with these instrumentation advances, solutions for data storage and data analytics for physics-based data extraction, as well as the role of the electron beam, need be considered. In this symposium, we aim to highlight novel approaches to in situ microscopy, illustrated with examples from materials science to gain insight into structural and chemical changes transformation mechanisms and kinetics. We seek contributions illustrating equipment development and novel use of existing equipment that can provide new insight into the state of active materials including 2D materials, nanoparticles and catalysts.


P09 - Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes

Jing Tao, Brookhaven National Laboratory
Aaron Lindenberg, Stanford University
Xuewen Fu, Nankai University, China

Understanding the structural origin of materials' functionality is challenging to obtain via equilibrium states but promising to unveil through the observation of non-equilibrium processes. The successful development of femtosecond laser systems and pump-probe techniques in the past three decades has allowed us to probe ultrafast dynamics in a variety of materials, which enables opportunities for advanced understanding of materials science. Particularly, taking advantages of strong interaction with matter during scattering, ultrafast electron pulses provide unique opportunities to probe the nonequilibrium dynamics, including the evolution of spin, charge, orbital and lattice in the ultrafast time domain. Moreover, the tidal surge of experiments exploiting non-equilibrium phenomena indicates the importance of the development of forefront facilities, such as ultrafast electron microscopes (UEM), KeV ultrafast electron diffraction (KeV-UED) and MeV ultrafast electron diffraction (MeV-UED) instruments. This symposium aims to encourage discussions of recent advancements in techniques, scientific findings, and future works employing ultrafast electron probes.


P10 - Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials

Chloe Bonamici, University of Wisconsin-Madison
Annie Bauer, University of Wisconsin-Madison
Zack Gainsforth, University of California- Berkeley

Microscopy and microanalysis are indispensable to the study of geological and extraterrestrial materials. High quality analysis enables the extraction of a maximal amount of structural, chemical, and isotopic information from a minimal amount of sample. Natural materials also pose unique challenges for microanalysis, including the potential for extreme and unpredictable compositional variability, the need for well-matched standards over a huge parameter space, a wide variation in physical properties, and sample sizes from the nanoscale to the macroscale, all of which affect preparation and analysis. We invite abstracts that highlight advances in microanalytical techniques as applied to natural materials.


P11 - Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments

Stig Helveg, Haldor Topsoe A/S, Denmark
Renske van der Veen, University of Illinois - Urbana-Champaign
Dalaver H. Anjum, Khalifa University, United Arab Emirates
Joerg R. Jinschek, The Ohio State University

Current and future applications of complex functional materials are based on physical, chemical and biological processes that occur on surfaces and interfaces. At the atomic scale, these processes are often difficult to understand and challenge our imagination, because our ability to observe atomic structures and dynamics in real space, real-time and real environments using electron microscopy is limited by the fundamental dose gap dividing structural integrity at ~ 20 e/Â2 (typical for soft matter) and reaching single-atom detection at ~ 10 000 e/Â2 (typical for hard matter). It is therefore crucial to develop new techniques and methods to bridge this classical dose gap. Path-breaking approaches will involve structuring electron probes in space and time in any environmental settings. Here we welcome submissions addressing the development or application of (electron) microscopy instrumentation, techniques and detection schemes that aim at probing atom processes in complex materials.


P12 - Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems

Timothy Spila, University of Illinois
Hugues Francois Saint Cyr, Cameca Instruments Inc.
François Vurpillot, Université de Rouen-Normandie, France
Xiaobing Hu, Northwestern University

This symposium on Atom Probe Tomography (APT) focuses on both its complementary and correlated aspects as part of the broad range of materials characterization techniques available today. Since one of the major goals sought by researchers is to achieve more accurate reconstructions and analyses of matter in three dimensions at the atomic level, this symposium will encompass all aspects of the APT field. Presentations will emphasize innovative specimen preparation, best known analytical conditions for APT data collection, latest simulations coupled with other imaging techniques for data reconstruction, and development of better algorithms and schemes for advanced data analysis. Advanced application of APT and TEM on metal alloys and other materials systems will also be covered.


X34 - Management and Operation of Microscopy Facilities

Sponsored by the MSA Facilities Operations Management (FOM) Focused Interest Group

Luisa Amelia Dempere, University of Florida
John Fournelle, University of Wisconsin-Madison
William Scheineider, University of Wisconsin

The operation and management of microscopy facilities encompass the understanding and implementation of protocols that adhere to federal government compliance as well as regulations and policies pertaining to its umbrella organization. The purpose of this symposium is to present policies, rules and best practices in the management and operation of an instrumentation centered multi-user facility. The topics covered are diverse in nature and scope and include: use rates calculation and review methodology, tracking and using operations data, evaluating the institutional impact of the facility, engaging users in compliance and safety practices, enhancing communications with users, what a day in the life of lab manager looks like, planning for instrument (hardware and software obsolescence), using social media and on-line tools to create engagement and community support, service contracts and other options for instrument support and maintenance, critical considerations for space renovation and instrument relocation, best practices for instrumentation training, liabilities associated with providing instrumentation analysis as a service.

2020 Sponsors