Sunday Short Courses
Sunday, August 1, 2021
- All short courses start at 8:30 AM and end by 5:30 PM.
- Separate registration fee required — see registration form.
- A certificate of attendance will be emailed to each participant.
X-12 Guidelines for Performing 4D-STEM Characterization from the Atomic to >Micrometer Scales: Experimental Considerations, Data Analysis and Simulation
David Muller, Cornell University
Colin Ophus, Lawrence Berkeley National Laboratory
With modern electron detector technology, it is now possible to record full images of a converged STEM probe while scanning it over the sample surface, resulting in a 4D-STEM dataset. Because the atomic-scale scattering information contained in an atomic-scale STEM probe is decoupled from the step size between STEM probe positions, 4D-STEM can be used for experiments ranging from sub-Angstrom resolution phase contrast imaging to statistical characterization of functional materials over large length scales. In this course, we will give tutorials on how to perform 4D-STEM experiments, analyze the (potentially very large!) resulting datasets, and perform 4D-STEM simulations.
X-15 Data Analysis in Materials Science
Eric Prestat, University of Manchester and SuperSTEM Laboratory, United Kingdom
Joshua Taillon, National Institute of Standards and Technology
This short course will introduce the use of HyperSpy and related Python libraries (atomap, pixStem, pyXem) for analysis of microscopy datasets. No prior Python knowledge is required. Attendees will learn how to perform basic machine learning, multi-dimensional curve fitting for EELS and EDS quantification, atomic resolution image analysis and big data processing (such as 4D STEM) on desktop computers.
For this hands-on and interactive short course, attendees will need to install software on their own laptop in advance and bring it with them to the short course (instructions will be provided).