Vendor Tutorials

Vendor Tutorials may be held in your booth on Monday, August 1, Tuesday, August 2, and Wednesday, August 3, from 5:45 PM - 6:45 PM, after the exhibit hall closes. There is no cost to host a Vendor Tutorial.

Hosting a Vendor Tutorial in your booth allows you to have a small presentation that could include: hands-on demonstration of your equipment, power point presentation, or small group discussion. Attendees sign up for the presentation(s) in which they are interested. (There is no cost to the attendee to participate.)

The list of Vendor Tutorials can be found below. Sign up will be at the M&M MegaBooth in booth 908.

Monday, August 1

Exhibitor Booth # Title of Tutorial
DECTRIS Ltd. 1636 Introducing new generation of 4D STEM detectors
Gatan/EDAX 2071 Metro: Extending counting and direct detection to everyday imaging, in-situ, and diffraction
NenoVision 1661 AFM-in-SEM demo measurement & presentation

Tuesday, August 2

Exhibitor Booth # Title of Tutorial
CAMECA 1872 The State of EPMA at CAMECA
Carl Zeiss Microscopy, LLC 1018 Multi-length Scale Characterization of High-γ' Ni-base superalloys Processed Through Electron Beam Melting for Critical Rotating Applications
DECTRIS Ltd 1636 Remote Demonstration of a New 4D STEM Detector
Direct Electron 1656 Apollo: Ultra-Fast Electron Counting Camera for Cryo-EM
Gatan/EDAX 2071 Get More from your EBSD Data with OIM Analysis
Gatan/EDAX 2071 Latitude D: An Automated Solution for Continuous Diffraction Tomography/MicroED Data Collection
JEOL 1758 Using the JEOL cryo ARM 300 to Study F-actin Binding Proteins
NenoVision 1661 AFM-in-SEM Demo Measurement & Presentation
Nion Co. 1848 Latest Developments with Nion Microscopes
Protochips 1780 AXON: A Paradigm Shift in TEM Performance, Productivity and Scientific Discovery
Ted Pella, Inc. 2172 Precision Scribing and Cleaving Methods for Microscopy Sample Preparation

Wednesday, August 3

Exhibitor Booth # Title of Tutorial
CAMECA 1872 Wide FOV and Rapid Throughput Atom Probe Tomography - CAMECA's 6000 APT Product Line
Carl Zeiss Microscopy, LLC 1018 A Thousand and One Slices: Freedom to Explore with the Focused Ion Beam Scanning Electron Microscope
DECTRIS Ltd 1636 Remote Demonstration of a New 4D STEM Detector
Direct Electron 1656 Celeritas: Ultra-Fast Camera for Materials Science
Gatan/EDAX 2071 Multimodal Data Analysis in DigitalMicrograph – Analyzing Image, Diffraction and Spectroscopy Data on a Single Software Platform
NenoVision 1661 AFM-in-SEM Demo Measurement & Presentation
Nion Co. 1848 Nion Swift: A Tool for Data Acquisition, Analysis, and Advanced Microscopy
Protochips 1780 AXON Dose Applications in Materials Research
TESCAN 1544 TESCAN Large Volume Workflow - Faster mm-scale Defect/Failure Analysis by Combining Plasma FIB Milling and Laser Ablation
zeroK NanoTech 2081 New High Resolution FIB and SIMS Instruments and Applications
MSA MAS MSC