Vendor Tutorials
Vendor Tutorials may be held in your booth on Monday, August 1, Tuesday, August 2, and Wednesday, August 3, from 5:45 PM - 6:45 PM, after the exhibit hall closes. There is no cost to host a Vendor Tutorial.
Hosting a Vendor Tutorial in your booth allows you to have a small presentation that could include: hands-on demonstration of your equipment, power point presentation, or small group discussion. Attendees sign up for the presentation(s) in which they are interested. (There is no cost to the attendee to participate.)
The list of Vendor Tutorials can be found below. Sign up will be at the M&M MegaBooth in booth 908.
Monday, August 1
| Exhibitor | Booth # | Title of Tutorial |
| DECTRIS Ltd. | 1636 | Introducing new generation of 4D STEM detectors |
| Gatan/EDAX | 2071 | Metro: Extending counting and direct detection to everyday imaging, in-situ, and diffraction |
| NenoVision | 1661 | AFM-in-SEM demo measurement & presentation |
Tuesday, August 2
| Exhibitor | Booth # | Title of Tutorial |
| CAMECA | 1872 | The State of EPMA at CAMECA |
| Carl Zeiss Microscopy, LLC | 1018 | Multi-length Scale Characterization of High-γ' Ni-base superalloys Processed Through Electron Beam Melting for Critical Rotating Applications |
| DECTRIS Ltd | 1636 | Remote Demonstration of a New 4D STEM Detector |
| Direct Electron | 1656 | Apollo: Ultra-Fast Electron Counting Camera for Cryo-EM |
| Gatan/EDAX | 2071 | Get More from your EBSD Data with OIM Analysis |
| Gatan/EDAX | 2071 | Latitude D: An Automated Solution for Continuous Diffraction Tomography/MicroED Data Collection |
| JEOL | 1758 | Using the JEOL cryo ARM 300 to Study F-actin Binding Proteins |
| NenoVision | 1661 | AFM-in-SEM Demo Measurement & Presentation |
| Nion Co. | 1848 | Latest Developments with Nion Microscopes |
| Protochips | 1780 | AXON: A Paradigm Shift in TEM Performance, Productivity and Scientific Discovery |
| Ted Pella, Inc. | 2172 | Precision Scribing and Cleaving Methods for Microscopy Sample Preparation |
Wednesday, August 3
| Exhibitor | Booth # | Title of Tutorial |
| CAMECA | 1872 | Wide FOV and Rapid Throughput Atom Probe Tomography - CAMECA's 6000 APT Product Line |
| Carl Zeiss Microscopy, LLC | 1018 | A Thousand and One Slices: Freedom to Explore with the Focused Ion Beam Scanning Electron Microscope |
| DECTRIS Ltd | 1636 | Remote Demonstration of a New 4D STEM Detector |
| Direct Electron | 1656 | Celeritas: Ultra-Fast Camera for Materials Science |
| Gatan/EDAX | 2071 | Multimodal Data Analysis in DigitalMicrograph – Analyzing Image, Diffraction and Spectroscopy Data on a Single Software Platform |
| NenoVision | 1661 | AFM-in-SEM Demo Measurement & Presentation |
| Nion Co. | 1848 | Nion Swift: A Tool for Data Acquisition, Analysis, and Advanced Microscopy |
| Protochips | 1780 | AXON Dose Applications in Materials Research |
| TESCAN | 1544 | TESCAN Large Volume Workflow - Faster mm-scale Defect/Failure Analysis by Combining Plasma FIB Milling and Laser Ablation |
| zeroK NanoTech | 2081 | New High Resolution FIB and SIMS Instruments and Applications |
