Full Symposium Descriptions


Analytical Sciences Symposia

A01 - Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences

Suzy Vitale, Carnegie Institution for Science
Frances Allen, University of California, Berkeley
Joshua Sugar, Sandia National Laboratories
Matthew Thorseth, Dow

The objective of this symposium is to provide an overview of recent developments in focused ion beam instrumentation, as well as a platform for FIB users to share and discuss novel applications and techniques across multiple scientific disciplines. Our focus will be on innovative approaches to imaging, sample preparation, micro/nanofabrication, and analytics that go beyond conventional methods in materials and life sciences, and the research that drives these new applications.

A02 - Beyond Visualization with in situ and Operando TEM

Taylor Woehl, University of Maryland
Yuanyuan Zhu, University of Connecticut
Chongmin Wang, Pacific Northwest National Laboratories

As in situ liquid and gas TEM imaging techniques become more mature, researchers are beginning to consider how to push their boundaries for quantitative understanding of material dynamics and transformations. As in situ TEM data becomes increasingly multidimensional (in real and reciprocal space) and synchronous (in situ images with real-time readout of temperature, pressure/flow, product signal, etc.), there is significant interest in extracting and even real-time tracking of quantitative information from these exceptionally rich data sets. This symposium invites papers from across the sub-fields of in situ TEM, including applications such as electrochemical systems, catalysis, 2D materials, and soft materials, focused on identifying, extracting, and measuring dynamic structural descriptors and their outcomes to advance our understanding of materials dynamics. Papers utilizing scalable computer algorithms including conventional image analysis and machine learning to extract descriptors and perform quantitative and correlative analysis (e.g. size measurement, particle tracking) on in situ TEM data sets are especially encouraged. Particular focus will be put on rigorously establishing that in situ environmental conditions lead to kinetics that are similar to the corresponding real world processes the materials are involved in.

A03 - Advanced 3D Imaging and Analysis Methods for New Opportunities in Materials Science

Roland Brunner, Materials Center Leoben
Julie Villanova, European Synchrotron Radiation Facility
Guillermo Requena, Das Deutsche Zentrum für Luft- und Raumfahrt
Robin White, Zeiss Group

We invite contributions from researchers developing and applying 3D imaging methods to drive material science. The scope of the symposium is to incorporate: (1) advanced 3D image analysis methods (conventional as well as machine-learning-based), (2) a variety of microscopy approaches based on synchrotron, FIB-SEM, neutron-tomography, XCT and X-ray microscopy, (3) the combination of morphology with structural and chemical information including multi-method/scale/in situ workflows as well as (4) the combination with computational modelling methods e.g., FEM, CFD, etc. Examples of relevant classes of materials include, but are not limited to, energy materials, lightweight materials, new structural alloys, and composites.

A04 - Developments of 4D-STEM Imaging - Enabling New Materials Applications

Laura Clark, University of Oxford
Michele Conroy, University of Limerick
Colin Ophus, Lawrence Berkeley National Laboratory
David Muller, Cornell University

4D-STEM is rapidly advancing, pushing the boundaries of which beam-sensitive materials and what functional-material processes can be studied in the microscope. Phase contrast imaging using ptychography and other advanced methods are increasing resolution far beyond conventional limits, and DPC methods are revealing the electromagnetic structures of specimens more clearly than ever before. It is also now possible to measure structure properties such as strain, orientation, order, and disorder from millions of sample points, providing statistically robust measurements over functional length scales. This symposium covers the latest developments of these techniques and applications of these methods to visualize novel materials phenomena.

A05 - Quantitative and Qualitative Mapping of Materials

Emma Bullock, Carnegie Institution for Science
Angela Halfpenny, Central Washington University

This symposium will discuss applications and advances in qualitative and quantitative mapping utilizing techniques such as energy-dispersive spectrometry, wavelength-dispersive spectrometry, x-ray fluorescence, electron backscatter diffraction, secondary ionization mass spectrometry, cathodoluminescence and laser ablation mass spectrometry. The software used to produce and manipulate maps will be discussed, as will best-practice methods for obtaining optimum results. Applications include, but are not limited to, geological and extraterrestrial materials, semiconductors, biological materials, and ceramics.

A06 - Expanding the Limits of Atom Probe Tomography

David Diercks, Colorado School of Mines
Jonathan D Poplawsky, Oak Ridge National Laboratory
Francois Vurpillot, Universite' De Rouen
Ann Chiaramonti Debay, National Institute of Standards and Technology

The use and development of atom probe tomography has been rapidly expanding and improving in many areas including hardware capabilities, reconstruction algorithms, data mining and processing, and new material applications. This symposium will present efforts exploring frontiers in atom probe tomography and field ion microscopy.

A07 - Science of Metrology with Electrons

Andrew Barnum, Thermo Fisher Scientific
Sujitra Pookpanratana, National Institute of Standards and Technology

With increasing integration of nanotechnologies into products and processes across engineering and manufacturing disciplines, new techniques are required to tackle the challenges of process monitoring and critical dimension analysis. With the capability of electron microscopy to provide imaging across a variety of signal modalities and resolutions to atomic lattice dimensions, electron microscopy has become a critical linchpin for metrology across industries. The growing volume of data provided by automated acquisition and increasing reliance on these techniques to solve a variety of metrology problems underscores new requirements for routine calibrations across analytical modes for properties such as length, strain, chemical composition, and optical behavior, as well as electric and magnetic fields. This symposium will feature current state-of-the-art, recent progress, and new challenges in the field of calibration and metrology for electron microscopes.

A08 - From Operando Microcell Experiments to Bulk Devices

Vasiliki Tileli, Swiss Federal Institute of Technology Lausanne
William C. Chueh, Stanford University
Martial Duchamp, Nanyang Technological University

Performing operando experiments using liquid, gas, electrochemical, or heating and biasing stimuli provides valuable insights that can aid the development of next-generation technologies. However, microdevices used to perform operando studies suffer from major limitations that make the acquired results inconsistent with their bulk counterparts. Scanning or transmission electron and x-ray microscopy/spectroscopy techniques all exhibit limitations having to do with the setup and its operation, beam-induced irradiation effects, and temporal, spatial, or energy resolution. This symposium aims to assess the consistency of operando experiments with process that take place in real-life devices including batteries, fuel cells, memory devices, etc.

A09 - Ultrashort Pulse Lasers: Microscopy, Simulations, and Material Interactions

Steven Randolph, Thermo Fisher Scientific
Andrew Polonsky, Sandia National Laboratories
McLean Echlin, University of California Santa Barbara
Remco Geurts, Thermo Fisher Scientific

Ultrashort pulsed lasers continue to gain adoption in the microscopy and microanalytical community due to unique attributes of fast material removal rates, the extremely low-damage ablation process, and the ability to process a wide range of materials. The combination of ultrashort pulsed lasers with SEM/FIB greatly expands the 2D and 3D capability of these instruments, including 3D materials science, fundamental laser-material interaction experiments, and ultrafast photochemistry. This symposium calls for novel results and simulations enabled by ultrashort pulsed lasers or laser-material interactions. Submissions in the fields of materials science, energy storage, biology, electronic materials, microelectronics, and laser-material interactions are welcomed.

A10 - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

Vincent Smentkowski, GE Research

Surface properties dictate the performance of many physical and biological systems. The surface analyst is asked to detect and image species present in ever-lower concentrations and within ever-smaller spatial and depth dimensions. This symposium emphasizes state-of-the-art surface analytical instrumentation encompassing all aspects of surface and near-surface analyses, such as mass spectrometry, scanning probe microscopy and other probe-based techniques. We will cover advanced data analysis tools; correlative imaging (e.g., AFM and SEM; AFM and SIMS; FIB-SIMS); the use of complementary surface instrumentation to perform a complete analysis of complex systems; quantitative microanalysis; data processing; and surface analytical challenges. Both platform and poster presentations are encouraged.


Biological Sciences Symposia

B01 - Microcrystal Electron Diffraction (MicroED)

Brent Nannenga, Arizona State University
Tamir Gonen, University of California LA

Microcrystal electron diffraction, or MicroED, is a method that can determine high-resolution structures from very small and thin 3D crystals. MicroED has been applied to a variety of microcrystalline samples, including those of biological molecules, small organic molecules, and samples from materials science. This session will focus on recent applications of MicroED for structure determination, as well as advances in MicroED methodology.

B02 - 3D Structures: From Macromolecular Assemblies to Whole Cells (3DEM FIG)

Teresa Ruiz, University of Vermont
Melanie Ohi, University of Michigan
Cheri Hampton, AFRL/RXAS Wright-Patterson Air Force Base
William Rice, NYU Langone Health

Our understanding of the 3D structure and functional subtleties of complex biological systems has skyrocketed due to recent advances in EM imaging technology and hybrid methodologies. This symposium will highlight structural studies of macromolecules, microorganisms, cells, and tissues using state-of-the-art high-resolution techniques. These techniques include single particle cryo-EM, cryo-electron tomography, helical reconstruction, STEM; AFM, X-ray crystallography, and molecular modeling. Biological topics of interest include cellular architecture, metabolism, trafficking, communication, and division; gene regulation, transcription, and translation; host-pathogen interactions and virus structure; in situ studies using TEM and SEM, and all aspects of structure-function studies of biological assemblies.

B03 - Technical Advances in Cryo-EM

Mike Marko, State University of New York, Wadsworth Center
Christopher Russo, University of Cambridge
Anchi Cheng, New York Structural Biology Center

Cryo-EM technology is in the tradition of advances in biological TEM that has long been a part of (E)MSA. These include advances in the TEM itself, as well as in cameras, specimen preparation, stages, and software. Results are now competitive with x-ray crystallography, and resolution in, single-particle cryo-EM is now in the atomic range, previously obtained only in materials science. Advances in cryo-EM are coming quickly, considerably widening the popularity of the technique. Speakers representing many of the current advances will be invited, and all contributions related to this topic will be most welcome.

B04 - Correlative and Multimodal Microscopy and Analysis

Si Chen, Argonne National Laboratory
Xiao-Ying Yu, Pacific Northwest National Laboratory
James Fitzpatrick, Washington University, St. Louis
Jacob Hoogenboom, TuDelft

Real-world systems are hierarchical, encompassing large differences in size, structure, composition and arrangement. Correlative microscopy and analysis have evolved to an essential toolkit to characterize these complex systems and have led to advances in both soft and hard material studies by providing information with complimentary modalities and across different scales. In this symposium, we highlight technical innovations in instrument development, sample preparation and handling, in-situ and cryogenic sample environment, and data analysis pipeline. We also seek contributions on applying correlative methods to physical, environmental, biological and biomedical studies.

B05 - Challenges and Advances in Electron Microscopy Research and Diagnosis of Diseases in Humans, Plants and Animals

Claudia Lopez, Oregon Health & Science University
Marcela Redigolo, West Virginia University
Joe Mowery, USDA Agriculture Research Service

This symposium covers diverse content related to the research and diagnosis of diseases in humans, animals and plants. The application of various microscopy techniques providing in-depth investigations of disease mechanisms exhibits the versatility of these techniques as key-tools in diagnosis and in the understanding of the host, the host-pathogen interaction, and its environment. Some of these methods allow for a rapid detection and identification of novel agents, including those not considered by the investigator or clinician, making these techniques highly important in clinically or epidemiologically critical situations. Target attendees include scientists from all levels of bio-imaging expertise and related backgrounds.

B06 - Imaging, Microscopy, and Micro/Nano-Analysis of Pharmaceutical, Biopharmaceutical, and Medical Health Products — Research, Development, Analysis, Regulation, and Commercialization

Daniel Skomski, Merck & Co. Inc.

This symposium, sponsored by the Pharmaceuticals Focused Interest Group (FIG), will present diverse content related to the research, development, manufacture, and use of pharmaceuticals, medical products, and devices. The intent is to connect subject matter experts dealing with the application of microscopy, imaging, and micro/nano-analysis towards problems of interest to the pharmaceutical, biopharmaceutical, medical, device, and health fields. In-depth technical presentations will address the unique problems that arise during drug discovery and development, method development and optimization, vaccine research, formulation, biocompatibility, production, product life cycle management, and eventual patient use. Addressed topics in the research include material design and properties, physiochemical characterization (actives, excipients, contaminants, small molecule/large molecule/intermediate, polymorphs, particles), product performance, pharmacology, manufacturing, failure modes, biocompatibility, stability, shelf-life, sterility, etc. Also of interest is an understanding of regulations and data integrity concerns as applied to the pharmaceutical industry. Vendors and service providers are encouraged to submit abstracts which describe the use of their technologies as they apply to pharmaceutical industry problems.

B07 - 3D Volume Electron Microscopy in Biology Research

Alice Liang, NYU Grossman School of Medicine
Christopher Guerin, Flanders Institute of Biotechnology (Emeritus)
Ru-ching Hsia, Carnegie Institution for Science

Electron microscopy remains the gold standard for examining the ultrastructural details of cells and tissues. However, for many years obtaining EM data in three dimensions was a difficult and labor-intensive task. Over the last 20 years several approaches, and technologies have been developed that make 3D EM analysis of complex tissue or whole cells increasingly efficient and accessible. While automation of the acquisition, and partial automation of the data reconstruction steps has been achieved, the path to vEM is still challenging at the sample preparation stage. This symposium will evaluate several methods jointly termed Volume electron microscopy (vEM): serial block face scanning electron microscopy (SBF-SEM), focused ion beam scanning electron microscopy (FIB-SEM) and array tomography (AT). Discussions will include different options for vEM, the challenges and improvement of sample preparation protocols and the potentials of the 3D information to answer questions not adequately addressed with 2D techniques.

B08 - From Images to Insights: Working with Large Multi-modal Data in Cell Biological Imaging

Kedar Narayan, Frederick National Laboratory, National Cancer Institute
Camenzind G Robinson, St Jude Children's Research Hospital
Aubrey Weigel, HHMI, Janelia Research Campus

Biological imaging is producing ever larger data sets but is also quickly becoming multi-modal with disparate imaging technologies often being utilized, yet the ability to handle and analyze these data often lags far behind, especially in smaller labs and core facilities. Appropriate integration and correlation of disparate data streams at various scales, and portability of automated solutions remain daunting. This symposium aims to address issues and solutions stemming from large and multi-modal image data in cell biology, including image processing, correlation, segmentation, visualization, and analysis, especially in the context of open-source options.

B09 - Memorial Symposium: Shinya Inoue

David Piston, Washington University in St Louis
Seth Watkins, University of Pittsburgh

Shinya Inoue was a pioneer in live cell imaging, who made seminal discoveries in cell division, fertilization, and early embryonic development. In the pursuit of cell biological mechanisms, he made repeated improvements to his microscopes, and incorporated the best developments from others. To reach beyond his own research, he founded an annual microscopy course at Woods Hole that fostered interactions between the microscopy industry and the research community. This symposium will honor the future of Dr. Inoue's vision, where symbiotic improvements in microscopy techniques and understanding of biological mechanisms continue to enable new discoveries.

B10 - Development, Challenges and Biomedical Applications of Tissue Clearing, Expansion Microscopy and Volumetric Imaging

Yongxin (Leon) Zhao, Carnegie Mellon University
Alan M. Watson, University of Pittsburgh

The capability of modern light microscopes to study biologic processes is often limited by the preparation of the tissue to be imaged. Advances in tissue preparation technologies, such as tissue clearing and Expansion Microscopy, facilitate more effective visualization and understanding of structures and processes in intact biologic systems. Innovation in the way that tissues are manipulated prior to imaging often spurs novel uses for established imaging platforms and may inspire the development of new hardware and computational approaches. This symposium offers the opportunity to explore advancements in tissue preparation technologies which push the limits and expand the utility of modern light microscopes. Target attendees include scientists from all levels of bio-imaging expertise and related backgrounds.


Physical Sciences Symposia

P01 - Emerging Methods for Characterizing Hydrogen Effects in Metals and Alloys

Yi-Sheng (Eason) Chen, University of Sydney
Arun Devaraj, Pacific Northwest National Laboratory
May Martin, National Institute of Standards and Technology
Motomichi Koyama, Institute for Materials Research, Tohoku University

The presence of hydrogen in metals can lead to catastrophic failures known as hydrogen embrittlement. A solution for this problem requires a multiscale understanding of microstructural hydrogen behaviors for which atom probe tomography, nanoscale secondary mass ion spectroscopy, neutron tomography and other methods have proven to be powerful. Combined with structural information provided by both in-situ and ex-situ electron microscopy, these techniques have improved the understanding of how hydrogen causes hydrogen embrittlement and how to prevent it. This symposium aims to bring together worldwide researchers focused on such emerging methods for characterizing hydrogen effects in metals and alloys.

P02 - Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices

Wenpei Gao, North Carolina State University
Kai He, Clemson University
Jiong Zhang, Intel Corporation

Existing imaging techniques in electron microscopy, including holography, ptychography, differential phase contrast, electron energy loss spectroscopy and their in-situ experimentation, now offer better spatial, temporal and energy resolution, thanks to the advancement in instrumentation and imaging theory. This extends our capability to study the structure, phonon, spin and other exotic states of quantum materials, including two-dimensional materials, topological insulator, and other candidate materials for quantum information sciences. This symposium will focus on recent progress in electron microscopy study of quantum materials, from the development of characterization theory and techniques in materials imaging, to applications through in-situ studies on conceptual devices.

P03 - Imaging Chemical Reactions using High Speed Electron Microscopy (EM)

Elena Besley, University of Nottingham
Angus Kirkland, University of Oxford

This symposium highlights recent breakthroughs in advanced materials processing, high-speed EM imaging, image analysis or big data and computational modelling used as an analytical tool for quantitative analysis of chemical kinetics at the nanoscale. High-speed EM can be usefully harnessed as a controlled source of energy to promote chemical reactions, controlling their rates, and activating additional reaction channels. High-speed EM allows the direct observation of key intermediate states in chemical reactions. These advances contribute to further chemical understanding of the dynamics of electron beam induced processes typically delivered by computational modelling.

P04 - Mechanisms of High Strain Rate Plastic Deformation: Plasticity and Microstructural Evolutions of Adiabatic Shear Bands

Francis Tetteh, York University
Solomon Boakye-Yiadom, York University
Ali Eliasu, York University
Kenneth Hukpati, York University

Under high strain rates such as car crash, ballistic impact, etc., structural materials (metals) become exposed to increasingly extreme conditions in applied pressures, strain-rates, strains and temperatures and are easily susceptible to strain localization, which results in the formation of Adiabatic Shear Bands. Also, the mechanical behavior of materials at high strain rate is however, different compared with quasi-static strain rates. It is characterized that the initiation of strain localization and formation of shear bands are manifestations of damage in metallic materials subjected to large strains of deformation and may lead to final catastrophic failure.

This session would discuss the foundation and knowledge acquisitions in plasticity and microstructure evolutions that characterize the deformation behaviors of structural materials at high strain rate dynamic loadings.

P05 - In Situ TEM Characterization of Dynamic Processes during Materials Synthesis and Processing

Dongsheng Li, Pacific Northwest National Laboratory
Qian Chen, University of Illinois
Yu Han, King Abdullah University of Science and Technology
Barnaby Levin, Direct Electron

In situ transmission electron microscopy (TEM) techniques have emerged as primary tools for characterizing the dynamics of materials formation. The development of in situ TEM capabilities has led to rapid advances in our understanding of a range of dynamic processes, including nucleation, growth, and assembly in colloidal, electrochemical, organic, semiconductor, and other systems. The symposium covers a broad range of topics including particle nucleation, crystal growth, phase transformations, polymeric and organic/inorganic self-assembly, electrochemical processes, and interface dynamics in gases and liquids. This symposium aims to provide a platform of discussion to understand the physics and chemistry of materials formation for researchers from various fields.

P06 - Nanoscale Optics with Electrons and Photons

Luiz Tizei, Université Paris-Saclayniversite
Sophie Meuret, Center for Materials Elaboration and Structural Studies
Sean Collins, Leeds University

The optical response of a system is intimately related to its structure and chemistry. For heterogeneous objects, with nanometer scale anisotropy (either chemical or structural), macroscopic optical measurements provide at best the average response requiring extensive modelling for a full picture. In this symposium, we will discuss the use of electron spectroscopies to understand the optical properties of nanomaterials. More precisely, the symposium will address how optimally to couple optical property measurements to other nanometer-scale resolved structural and chemical data. We will emphasize the use of complementary and correlative techniques to reveal the link between structure and optics at the nanoscale.

P07 - Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

Yang Yang, Pennsylvania State University
Lynne Ecker, Brookhaven National Laboratory
Janelle Wharry, Purdue University
Xing Wang, Pennsylvania State University

The growing demand for carbon-free energy worldwide can only be met by advanced energy systems, such as Gen IV nuclear reactors, molten salt energy storages, and advanced turbines, which require robust materials for higher temperature, more corrosive and more radioactive environments. This symposium will discuss how advanced microscopy techniques are leveraged to meet the crucial need to rapidly introduce new and high-performance materials. High-throughput methodologies enabled by fast detectors, artificial intelligence and automated characterization could potentially be one of the solutions. On the other hand, the combination of multiple characterization techniques on the same sample (a.k.a. correlative microscopy), including electron microscopy, X-ray synchrotron radiation characterization, atom probe tomography, and positron annihilation microscopy, etc., is playing an important role in deciphering the fundamental mechanisms of materials degradation in extreme environments. Discussions on other advanced methods such as in situ techniques and tomography are also encouraged.

P08 - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

Joe Patterson, University of California, Irvine
Hector A Calderon, Instituto Politecnico Nacional (Mexico)
Christina Kisielowski, Lawrence Berkeley National Laboratory
Jennifer Cookman, University of Limerick

Understanding, controlling and reducing electron-beam sample interactions is essential to meaningfully correlate the synthesis, chemistry and properties of organic and inorganic materials. This becomes especially important and challenging for electron tomography, analytical techniques and in-situ experiments of beam sensitive materials. This symposium welcomes contributions that address challenges in electron-beam sample interactions that enable the reliable collection of data that advances our understanding of material structures, properties, and dynamics. Topics and techniques of interest include: low-dose imaging, sample preparation, sensitive detectors, exit wave reconstruction, fast scanning and image overlapping, pulsed beams, machine learning, aloof and event-streamed spectroscopy, and theoretical aspects of electron-sample interactions.

P09 - Insights into Phase Transitions in Functional Materials by in situ/operando TEM: Experiment Meets Theory

Leopoldo Molina-Luna, Technische Universität Darmstadt
Judy Cha, Yale University
Michele Conroy, University of Limerick
Lin Zhou, Ames Laboratory

Recent technological advances in transmission electron microscopy are transforming what researchers can study at the atomic scale. The capability to perform multiple measurements while simultaneously analyzing corresponding structural, chemical, or even electronic structure changes in nanomaterials or devices down to the atomic scale is opening exciting new opportunities at the forefront of modern materials science research. Phase transformations of nanoscale materials, and corresponding changes in material properties and functionalities, are critical for fundamental science and device applications. In particular, in situ/operando TEM enables direct studies of nucleation and growth during phase transitions in real space, whose pathways and transition kinetics are subject to nanoscale heterogeneities. The focus of this symposium is on the application of in situ/operando TEM techniques that include heating, biasing, cooling, magnetic fields, and mechanical testing to induce and probe phase transitions in functional materials and devices at the nanoscale that, in synergy with theoretical methods, such as DFT calculations, phase-field, micromagnetics, modelling, finite-element based simulations, help unravel the structure and properties of materials down to the atomic scale. Furthermore, as data collection, analysis and recording of dynamic information is becoming increasingly demanding, we also welcome contributions in computer-aided image analysis and big data processing to understand the fundamental physics governing the nano- to atomic-scale phase transitions of functional materials and devices.

P10 - Advanced Imaging and Spectroscopy for Nanoscale Materials

Robert F Klie, University of Illinois Chicago
Shize Yang, Arizona State University
Juan-Carlos Idrobo, Oak Ridge National Laboratory

The objective of this symposium is to provide a platform to discuss recent developments in materials characterization enabled by aberration-corrected scanning and transmission electron microscopy. While spatial resolution of better than 60 pm is now possible, aberration-correction has also enabled a large variety of in-situ experiments, new imaging schemes, and multi-dimensional data acquisitions at close to atomic resolution. Furthermore, multimodal imaging and spectroscopy provide an unprecedented opportunity for materials characterization by using a combination of high-speed, high-sensitivity detectors and spectrometers. The chemistry and structure of crystals, interfaces, and defects down to the atomic-scale can now be directly determined under proper experimental conditions. Such capabilities offer a unique perspective to understand the structure-property relationships and pave the way towards material functionality manipulation from the atomic scale. This symposium is intended to facilitate the exchange of information on the latest developments, challenges, and outlooks in the application of advanced imaging and spectroscopy methods on resolving structures and chemistry in various materials systems, including metals, oxides, and semiconductors.

P11 - Planetary-materials Characterization in the Era of Mission Returned Sample Analysis

Tom Zega, Lunar and Planetary Laboratory - University of Arizona
Jessica Barnes, University of Arizona
Harold Connolly Jr., Rowan University
Pierre Haenecour, Lunar and Planetary Laboratory - University of Arizona

Missions to collect planetary materials from varied celestial sources have provided us with new insights into the early solar system. We expect the return of material from carbonaceous asteroid Bennu by the NASA OSIRIS-REx Mission in just over 14 months. The proposed symposium solicits papers that use microscopy-related techniques in determining the origins of planetary materials. We welcome papers that include but are not limited to: discussing desirable levels of precision or detection, improved methods for sample handling and preparation, and new analytical protocols combining multiple techniques to maximize the information that can be acquired from a small sample.Earth and planetary materials characterization.

P12 - Memorial Symposium: John C.H. Spence

Ondrej Krivanek, NION
Stuart Lindsey, Arizona State University
Henry Chapman, Deutsches Elektronen-Synchrotron DESY

John Charles Howorth Spence, FRS (foreign member) made a broad range of fundamental advances in our knowledge of the nanoworld through electron microscopy, electron diffraction, and bio-XFEL. His contributions were always highly original, and typically blazed new paths that others followed. He authored a number of key papers and several widely read textbooks, and tutored many students and postdocs who later made their own pivotal advances. He also authored a highly acclaimed popular science book and a touching biography about his father, a WWII flying ace. This symposium will cover the fields he contributed in, and chart their future course.


Cross-Cutting Sciences Symposia

C01 - Microscopy Infrastructures: Architectures, Avenues and Access

Steven Spurgeon, Pacific Northwest National Laboratory
Lewys Jones, Trinity College Dublin
Zineb Saghi, De la recherche à l'industrie
Santhana Eswara, Luxembourg Institute of Science and Technology

Modern microscopy drives new scientific discovery, and new scientific practice is driving innovations in microscopy. Hardware and software developments are reshaping how instruments are priced, purchased, designed, and operated. Today’s dynamic research landscape requires us to shift from traditional, closed operating models toward open, agile characterization platforms designed to shorten time to solutions. The field also increasingly demands better value for funders; asynchronous, remote access models; and emphasis on infrastructure resilience. We will explore emerging reprogrammable instrument architectures, new modes of automated/remote operation, and host critical dialogue on the growing cost-driven divide between technological, haves, and, have-nots, among other topics.

C02 - Microscopy and Education

Juan Pablo Hurtado Padilla, Smithsonian Institution
Scott Whittaker, Smithsonian

Microscopy and Education are complementary and inter-sectional fields. The use of microscopes in any STEM field at any age or academic level is ideal, as they can provide a clear bridge between our visual interpretation of the world and a wide variety of science topics. Furthermore, the principles of microscopy itself are practical examples of the real-world application of otherwise abstract subjects such as math, physics, chemistry and biology. This allows microscopes to be instruments than can equalize the access to science to many different audiences, even those with no direct relation to the scientific world. The Microscopy and Education symposium will provide an space for educators, microscopists and scientists to learn about experiences and proposals that push novel approaches to the use of microscopes as educational tools.

C03 - Facilities Management Crucial Skills and Strategies

Luisa Amelia Dempere, University of Florida
John Shields, University of Georgia
Caitlin Tibbetts, University of Florida

This symposium will focus on critical skills and strategies that can help core, multiuser facility managers to navigate more effectively essential functions of their role. These skills and strategies will be addressed as follows: Communication model designed to create desired outcomes in crucial conversations with users, higher administration, and stakeholders. Adoption of proven strategies to effectively influence the behavior of users, and their adoption of rules, procedures, and guidelines. Exposure to negotiation strategies that can effectively address staff and facility needs, use contracts expectations, user-facility agreements, proposal support, publications authorship, facility recognition and acknowledgement, and activities open for negotiation.

C04 - Artificial Intelligence, Instrument Automation, and High-dimensional Data Analytics for Microscopy and Microanalysis

Huolin Xin, University of California, Irvine
James LeBeau, Massachusetts Institute of Technology
Markus Kuehbach, Humboldt-Universität z u Berlin
Priyanka Periwal, University of Texas at Austin

The development of increasingly sensitive detectors and higher frames rates of acquisition are driving the development of new image analysis methods. These include the rapid development and application of advanced artificial intelligence methods such as machine learning and automation. Many of these developments are happening within the broader framework of open-source software development and can exploit open data. Open-source software can further enable researchers to design, collaborate, and share experimental techniques without the limitations of proprietary software. These developments are intertwined with issues regarding data storage, handling, and management, and are aided by adherence to Findable, Accessible, Interoperable, Reusable (FAIR) data principles. We welcome submission in the following topical areas.