Vendor Tutorial Information for Participating Companies
Exhibitors can hold a Vendor Tutorial in your booth after the exhibit hall closes for the day on Monday, Tuesday and/or Wednesday. This is your opportunity to do a presentation to interested attendees that will sign up to attend onsite. There is no cost to exhibitors or attendees. Exhibitors use the following link for additional information and to sign up. Attendees will have an opportunity to sign up while onsite in Minneapolis.
All exhibitors participating in vendor tutorials will now have attendees sign up to attend directly in their booth.
Each company must create their own sign-up sheet/process for sign-ups. M&M will not provide any AV or equipment to facilitate sign-ups.
M&M will provide up to 50 printed tickets for each company with their tutorial date and time. The Exhibits Manager will hand out tickets to each booth.
A list of participating companies will be in the MegaBooth and interested attendees will be directed to sign up within the company's booth.
Sign at MegaBooth — To include: Company, booth, tutorial title, date and time. Deadline June 16 to submit.
Confirmed Vendor Tutorials
Monday, July 24
| Exhibitor | Booth # | Title of Tutorial |
| 3D-Micromac AG | 1212 | microPREP PRO: New Vistas for Failure Analysis and Sample Preparation |
| Abberior Instruments America | 538 | Superresolution, from the Inventors of STED |
| Clark-MXR, Inc. | 1009 | Multiple Substrate Micromachining |
| Electron Microscopy Sciences | 1004 | The Prepmaster 5100 ensures repeatability and reproducibility. It reliably accomplishes your dull, dangerous, repetitious, and errorprone tasks, increasing confidence in your results and freeing your time for more complex and interesting work |
| EXpressLO LLC | 839 | EXLO and its applications for cryo lift out |
| Gatan/EDAX | 504 | DigitalMicrograph: A multifaceted platform for advanced STEM studies |
| Gatan/EDAX | 504 | Equipment ecosystem for low dose and Cryo-EM |
| Hitachi High-Tech America, Inc. | 1204 | Hitachi Powers Your Battery Research and Production |
| Linkam Scientific Instruments | 1420 | CryoGenium: new options with the automated robot for plunge-freezing of cryo-samples |
| Nanoscience Instruments | 1112 | Phenom Desktop STEM |
| NenoVision | 423 | LiteScope - In-Situ Correlative Microscopy |
| Oxford Instruments | 620 | Backscattered Electron and X-ray Imaging (BEX) |
| point electronic GmbH | 431 | Custom scan patterns with external TEM scan controller (DISS6) |
| Protochips Inc. | 410 | Machine vision-based in situ TEM for studying energy materials |
| SEC Co., Ltd | 1304 | Raman, CL, EDS and EBIC on a tabletop SEM |
| TESCAN | 819 | Accelerating and Advancing Nanoscale Characterization of Materials by seamless 4D-STEM workflows using the new TESCAN TENSOR analytical STEM microscope |
Tuesday, July 25
| Exhibitor | Booth # | Title of Tutorial |
| 3D-Micromac AG | 1212 | microPREP PRO: New Vistas for Failure Analysis and Sample Preparation |
| Abberior Instruments America | 538 | Superresolution, from the Inventors of STED |
| Angstrom Scientific Inc | 632 | Unlocking the Potential of In-Situ Microscopy |
| Barnett Technical Services | 1038 | Precise Microsampling with a Benchtop Micromanipulator |
| Bruker | 832 | Benchtop XRM |
| Bruker AXS LLC | 832 | Full Range Energy Dispersive Spectroscopy (EDS): Revealing higher energy transitions, better lower limits of detection and greater depth of information |
| CAMECA | 404 | The Latest APT Technology and Applications from the 2023 APT&M CAMECA Presentations |
| DECTRIS | 1012 | 4D STEM in practice with DECTRIS ARINA |
| Direct Electron | 1312 | Recent Advancements in Direct Detection Cameras |
| Electron Microscopy Sciences/Quorum | 1004 | Why there are cracks in my coating? How to avoid mistakes in sample preparation for Electron Microscopy Imaging. |
| Gatan/EDAX | 504 | How to use spherical indexing in OIM Analysis for better data quality |
| Gatan/EDAX | 504 | Multimodal in-situ spectroscopy |
| Hitachi High-Tech America, Inc. | 1204 | Automated Materials Analysis for Electronics and Battery Recycling |
| JEOL USA | 706 | A new FIB/SEM for TEM Sample Preparation Workflow |
| Linkam Scientific Instruments | 1420 | CryoGenium: new options with the automated robot for plunge-freezing of cryo-samples |
| Nanoscience Instruments | 1112 | VitroJet: Fully automated controlled cryo-EM sample preparation |
| Nion Company | 1104 | Latest Developments with Nion Microscopes |
| Prior Scientific | T-1504 | Innovation in Nanopositioning |
| Protochips Inc. | 410 | Unlocking the Full Potential of Your Data with a Research Data Management Machine-Vision Platform – DN |
| Quantum Detectors | 1031 | Quantum Detectors showcase 4D STEM with MerlinEM |
| Ted Pella, Inc | 904 | Tissue Clearing & decalcification using the PELCO BioWave |
| TMC | 404 | Introducing STACIS 4 Active Piezoelectric Vibration Control with Patented FloorSense™ Technology |
Wednesday, July 26
| Exhibitor | Booth # | Title of Tutorial |
| 3D-Micromac AG | 1212 | microPREP PRO: New Vistas for Failure Analysis and Sample Preparation |
| Abberior Instruments America | 538 | Superresolution, from the Inventors of STED |
| Attocube systems Inc | 1137 | Nanoscale optical analysis methods: AFM-IR, s-SNOM, nano-FTIR |
| Barnett Technical Services | 1038 | Microplastics Sampling and Detection |
| DECTRIS | 1012 | 4D STEM in practice with DECTRIS ARINA |
| Delmic B.V. | 1110 | Live demonstration of METEOR: Delmic's integrated cryo-FLM system |
| Gatan/EDAX | 504 | From electrons to images: A crash course in EM camera technology |
| Hitachi High-Tech America, Inc. | 1204 | Optimization of Cryo-TEM Screening Utilizing Hitachi's 120 kV HT7800 TEM |
| Hummingbird Scientific | 932 | Recent advances in in-situ microscopy: multi-model and multi-stimuli in-situ microscopy |
| JEOL USA | 706 | Special guest speaker – Advanced Developments for TEM |
| Linkam Scientific Instruments | 1420 | CryoGenium: new options with the automated robot for plunge-freezing of cryo-samples |
| Nanoscience Instruments | 1112 | Graphene liquid cells and their newest applications in TEM |
| NenoVision | 423 | LiteScope - In-Situ Correlative Microscopy |
| Nion Company | 1104 | Nion Swift - A tool for Data Acquisition, Analysis, and Advanced Microscopy |
| point electronic GmbH | 431 | Novel electrode-based BSE detector for in-situ microscopy |
| Quantifoil and SPT Labtech | 1138 | An Introduction to HexAuFoil next-generation cryoEM grids |
| SiriusXT | 532 | Biological Soft X-ray Tomography |
| TESCAN | 819 | Streamlining Materials Science Sample Characterization with Highly Automated FIB-SEM TEM Sample Preparation for analysis in TESCAN TENSOR 4D-STEM |
