Sunday Short Courses
X-10 High-Resolution Structure Determination by Cryo-EM
LEAD INSTRUCTOR:
Tim Grant, Morgridge Institute / University of Wisconsin-Madison
- Cryo-EM specimen preparation
- Introduction to TEM
- Single-particle data collection
- Single-particle image processing
- Validation of results
X-11 Guidelines for Performing 4D-STEM Characterization from the Atomic to >Micrometer Scales: Experimental Considerations, Data Analysis and Simulation
LEAD INSTRUCTORS:
David Muller, Cornell University
Colin Ophus, Lawrence Berkeley National Laboratory
- Electron detector technology suitable for 4D-STEM experiments
- List of possible 4D-STEM experimental configurations and references
- Analysis software for characterizing large numbers of STEM diffraction pattern images and visualization of the results
- Software and tutorial for simulating 4D-STEM datasets
X-12 Biological EM Sample Processing Short Course - Part Two
LEAD INSTRUCTORS:
Ru-ching Hsia, Carnegie Institution for Science
Alice Liang, NYU Langone’s Microscopy Laboratory
Kirk Czymmek, Donald Danford Plant Science Center
This course is the second installment of a two-part series of biological EM course. The Part II course will focus on more advanced biological EM sample processing and techniques. It is recommended that students have prior experiences with Biological EM or possess knowledges of the principles and workflow of biological EM sample processing. Students who have taken the Part I course in 2022 are welcome to return. The lectures will cover the topics listed in the bullet points below:
- Alternative fixation methods: Cryo and microwave methods
- Advanced ultramicrotomy techniques: cryo-ultramicrotomy and serial sectioning
- Immuno EM
- Volume EM using scanning electron microscope: Serial Block Face -SEM, Focused Ion Beam-SEM and Array tomography
- Correlative microscopy
- Practices of image analysis and postprocessing, segmentation and visualization
X-13 Cryo-EM for Materials Sciences: Hardware, Applications and Data Acquisition
LEAD INSTRUCTORS:
Ismail El Baggari, Harvard University
Myung-Geun Han, Brookhaven National Laboratory
Michael Zachman, Oak Ridge National Laboratory
While cryogenic TEM has revolutionized the research in biological science, its applications in materials sciences have been relatively limited. The major challenges lie in realizing reliable cryogenic specimen preparation, and atomic-scale imaging and spectroscopy at a wide range of cryogenic temperatures. Though still in its infancy, recent advancements in cryo-EM, especially in cryo-FIB and new TEM stages, have brought us the promises.
This short course will focus on the fundamentals of cryo-EM and primarily benefit those new to the field. We will highlight historical developments, current state, and future perspectives of cryo-EM for materials science. We will cover critical steps involved in a successful cryogenic microscopy study, including specimen preparation, specimen transfer, cryogenic FIB, new cryo-TEM stages, imaging, spectroscopy at low temperatures, and data analysis methods that can potentially be used to assist cryo-EM data acquisition and data analysis.
X-14 Transmission Electron Microscopy and Spectroscopy from First Principles
LEAD INSTRUCTORS:
Toma Susi, University of Vienna, Austria
Jacob Madsen, University of Vienna, Austria
Paul Zeiger, University of Stockholm, Sweden
Rebecca Nicholls, University of Oxford, UK
Simulations of transmission electron microscopy images and electron energy-loss spectra can not only be vital for correctly interpreting and understanding measured data, but may also be used to design experiments or even instrumentation. With modern open source tools, simulations of all kinds of image signals including HRTEM, ED, DPC and 4D-STEM are easy to learn and tractable on a personal computer. Computational exercises are performed using the open-source Python package abTEM. Simulation of electron energy-loss spectra is more demanding, and requires specialized expertise and high-performance computing resources. Different approaches to model phonon, plasmon and core-loss spectra are introduced.
- (Scanning) transmission electron microscopy image simulations
- Introduction to open-source TEM simulation software
- Computational exercises for modeling common imaging modes
- First-principles simulation of electron energy-loss spectroscopy
- Introduction to principles of low-loss and core-loss modeling
X-15 Automation for the Microscopy Workflow - Serial Sectioning of Materials at the Meso-scale
Lead Instructors
Mike Chapman
Rich Martens
- Automation of sample preparation
- Automation of analytical instrumentation, data acquisition and characterization
- Methods for large data – handling, storage, sharing, networking
- Improving data analysis efficiency, pathways to automation
- Optimizing current and emerging technologies to close the loop
X-16 Large Area Hyperspectral Mapping, EBSD/EDS/TKD/STEM, Machine Learning Data Analysis, Oh My!
LEAD INSTRUCTORS:
Chad Parish, Oak Ridge National Laboratory
Donovan Leonard, Microsoft
- Sample Preparation: Ar ion milling, electropolishing, carbon replica, FIB site specific
- Acquisition Parameters: Correlative, multi-length scale 30kV STEM/EDS/TKD; 200kV STEM/EDS; Large Area Mapping
- Data Analysis Approaches: PCA, Variational Bayesian Gaussian Mixture Models (VB-GMM)
- Case Studies: Irradiated Materials, LPB/EPB Additive Manufacturing, Vehicle Lightweighting Alloy Development