Sunday Short Courses

X-10 High-Resolution Structure Determination by Cryo-EM

Tim Grant, Morgridge Institute / University of Wisconsin-Madison


X-11 Guidelines for Performing 4D-STEM Characterization from the Atomic to >Micrometer Scales: Experimental Considerations, Data Analysis and Simulation

David Muller, Cornell University
Colin Ophus, Lawrence Berkeley National Laboratory


X-12 Biological EM Sample Processing Short Course - Part Two

Ru-ching Hsia, Carnegie Institution for Science
Alice Liang, NYU Langone’s Microscopy Laboratory
Kirk Czymmek, Donald Danford Plant Science Center

This course is the second installment of a two-part series of biological EM course. The Part II course will focus on more advanced biological EM sample processing and techniques. It is recommended that students have prior experiences with Biological EM or possess knowledges of the principles and workflow of biological EM sample processing. Students who have taken the Part I course in 2022 are welcome to return. The lectures will cover the topics listed in the bullet points below:


X-13 Cryo-EM for Materials Sciences: Hardware, Applications and Data Acquisition

Ismail El Baggari, Harvard University
Myung-Geun Han, Brookhaven National Laboratory
Michael Zachman, Oak Ridge National Laboratory

While cryogenic TEM has revolutionized the research in biological science, its applications in materials sciences have been relatively limited. The major challenges lie in realizing reliable cryogenic specimen preparation, and atomic-scale imaging and spectroscopy at a wide range of cryogenic temperatures. Though still in its infancy, recent advancements in cryo-EM, especially in cryo-FIB and new TEM stages, have brought us the promises.

This short course will focus on the fundamentals of cryo-EM and primarily benefit those new to the field. We will highlight historical developments, current state, and future perspectives of cryo-EM for materials science. We will cover critical steps involved in a successful cryogenic microscopy study, including specimen preparation, specimen transfer, cryogenic FIB, new cryo-TEM stages, imaging, spectroscopy at low temperatures, and data analysis methods that can potentially be used to assist cryo-EM data acquisition and data analysis.


X-14 Transmission Electron Microscopy and Spectroscopy from First Principles

Toma Susi, University of Vienna, Austria
Jacob Madsen, University of Vienna, Austria
Paul Zeiger, Uppsala University, Sweden
Rebecca Nicholls, University of Oxford, UK

Simulations of transmission electron microscopy images and electron energy-loss spectra can not only be vital for correctly interpreting and understanding measured data, but may also be used to design experiments or even instrumentation. With modern open source tools, simulations of all kinds of image signals including HRTEM, ED, DPC and 4D-STEM are easy to learn and tractable on a personal computer. Computational exercises are performed using the open-source Python package abTEM. Simulation of electron energy-loss spectra is more demanding, and requires specialized expertise and high-performance computing resources. Different approaches to model phonon, plasmon and core-loss spectra are introduced.