Vendor Tutorial Information for Attendees

Exhibitors can hold a Vendor Tutorial in their booth after the exhibit hall closes for the day on Monday, Tuesday and/or Wednesday. This is your opportunity attend a presentation by your favorite Exhibitors.

There is no cost to exhibitors or attendees.

Attendees will sign up for the vendor tutorials directly in the company's booth.

A list of participating companies will be in the MegaBooth and interested attendees will be directed to sign up within the company's booth.

Confirmed Vendor Tutorials

Monday, July 24

Exhibitor Booth # Title of Tutorial
3D-Micromac AG 1212 microPREP PRO: New Vistas for Failure Analysis and Sample Preparation
Abberior Instruments America 538 Superresolution, from the Inventors of STED
Clark-MXR, Inc. 1009 Multiple Substrate Micromachining
Electron Microscopy Sciences 1004 The Prepmaster 5100 ensures repeatability and reproducibility. It reliably accomplishes your dull, dangerous, repetitious, and errorprone tasks, increasing confidence in your results and freeing your time for more complex and interesting work
EXpressLO LLC 839 EXLO and its applications for cryo lift out
Gatan/EDAX 504 DigitalMicrograph: A multifaceted platform for advanced STEM studies
Gatan/EDAX 504 Equipment ecosystem for low dose and Cryo-EM
Hitachi High-Tech America, Inc. 1204 Hitachi Powers Your Battery Research and Production
Linkam Scientific Instruments 1420 CryoGenium: new options with the automated robot for plunge-freezing of cryo-samples
Nanoscience Instruments 1112 Phenom Desktop STEM
NenoVision 423 LiteScope - In-Situ Correlative Microscopy
Oxford Instruments 620 Backscattered Electron and X-ray Imaging (BEX)
point electronic GmbH 431 Custom scan patterns with external TEM scan controller (DISS6)
Protochips Inc. 410 Machine vision-based in situ TEM for studying energy materials
SEC Co., Ltd 1304 Raman, CL, EDS and EBIC on a tabletop SEM
TESCAN 819 Accelerating and Advancing Nanoscale Characterization of Materials by seamless 4D-STEM workflows using the new TESCAN TENSOR analytical STEM microscope

Tuesday, July 25

Exhibitor Booth # Title of Tutorial
3D-Micromac AG 1212 microPREP PRO: New Vistas for Failure Analysis and Sample Preparation
Abberior Instruments America 538 Superresolution, from the Inventors of STED
Angstrom Scientific Inc 632 Unlocking the Potential of In-Situ Microscopy
Barnett Technical Services 1038 Precise Microsampling with a Benchtop Micromanipulator
Bruker 832 Benchtop XRM
Bruker AXS LLC 832 Full Range Energy Dispersive Spectroscopy (EDS): Revealing higher energy transitions, better lower limits of detection and greater depth of information
CAMECA 404 The Latest APT Technology and Applications from the 2023 APT&M CAMECA Presentations
DECTRIS 1012 4D STEM in practice with DECTRIS ARINA
Direct Electron 1312 Recent Advancements in Direct Detection Cameras
Electron Microscopy Sciences/Quorum 1004 Why there are cracks in my coating? How to avoid mistakes in sample preparation for Electron Microscopy Imaging.
Gatan/EDAX 504 How to use spherical indexing in OIM Analysis for better data quality
Gatan/EDAX 504 Multimodal in-situ spectroscopy
Hitachi High-Tech America, Inc. 1204 Automated Materials Analysis for Electronics and Battery Recycling
JEOL USA 706 A new FIB/SEM for TEM Sample Preparation Workflow
Linkam Scientific Instruments 1420 CryoGenium: new options with the automated robot for plunge-freezing of cryo-samples
Nanoscience Instruments 1112 VitroJet: Fully automated controlled cryo-EM sample preparation
Nion Company 1104 Latest Developments with Nion Microscopes
Prior Scientific T-1504 Innovation in Nanopositioning
Protochips Inc. 410 Unlocking the Full Potential of Your Data with a Research Data Management Machine-Vision Platform – DN
Quantum Detectors 1031 Quantum Detectors showcase 4D STEM with MerlinEM
Ted Pella, Inc 904 Tissue Clearing & decalcification using the PELCO BioWave
TMC 404 Introducing STACIS 4 Active Piezoelectric Vibration Control with Patented FloorSense™ Technology

Wednesday, July 26

Exhibitor Booth # Title of Tutorial
3D-Micromac AG 1212 microPREP PRO: New Vistas for Failure Analysis and Sample Preparation
Abberior Instruments America 538 Superresolution, from the Inventors of STED
Attocube systems Inc 1137 Nanoscale optical analysis methods: AFM-IR, s-SNOM, nano-FTIR
Barnett Technical Services 1038 Microplastics Sampling and Detection
DECTRIS 1012 4D STEM in practice with DECTRIS ARINA
Delmic B.V. 1110 Live demonstration of METEOR: Delmic's integrated cryo-FLM system
Gatan/EDAX 504 From electrons to images: A crash course in EM camera technology
Hitachi High-Tech America, Inc. 1204 Optimization of Cryo-TEM Screening Utilizing Hitachi's 120 kV HT7800 TEM
Hummingbird Scientific 932 Recent advances in in-situ microscopy: multi-model and multi-stimuli in-situ microscopy
JEOL USA 706 Special guest speaker – Advanced Developments for TEM
Linkam Scientific Instruments 1420 CryoGenium: new options with the automated robot for plunge-freezing of cryo-samples
Nanoscience Instruments 1112 Graphene liquid cells and their newest applications in TEM
NenoVision 423 LiteScope - In-Situ Correlative Microscopy
Nion Company 1104 Nion Swift - A tool for Data Acquisition, Analysis, and Advanced Microscopy
point electronic GmbH 431 Novel electrode-based BSE detector for in-situ microscopy
Quantifoil and SPT Labtech 1138 An Introduction to HexAuFoil next-generation cryoEM grids
SiriusXT 532 Biological Soft X-ray Tomography
TESCAN 819 Streamlining Materials Science Sample Characterization with Highly Automated FIB-SEM TEM Sample Preparation for analysis in TESCAN TENSOR 4D-STEM
MSA MAS