In Memoriam: David Joy

With great sadness, MSA announces the passing of David Joy on August 10, 2022, having retired as Distinguished Professor after 30 years as at the University of Tennessee and ORNL.

He was an outstanding and pioneering contributor to high-resolution and scanning EM and EDX (using both electron and ions). He received his PhD in the Dept. of Metallurgy and Materials Science at Oxford, where he subsequently developed the first successful FEG STEM in Europe. At Bell labs, he pursued high-resolution Analytical EM. He made very important contributions to SEM detector design and imaging theory, and is especially well-known for his Monte Carlo modeling for electron and ion imaging and microanalysis.

He was past President of both MSA and MAS, the MAS Duncumb awardee in 2010 (as one of the inaugural MAS “Legends” class), as well as a Fellow of both MSA, MAS and the RMS. He was the MSA Burton Medalist in 1978. He presented several courses at M&M meetings and was a long-time “regular” at the Lehigh course. A special symposium honoring him was held at M&M2018. He has published over 400 papers and has edited nine books. He was also Editor-in-Chief of Scanning.

This is a great loss to Microscopy and Microanalysis.