January 15-17, 2019
Sample Preparation for Semiconductor Devices: A Complete Picture
Hatfield, PA
This course covers sample preparation required for isolation of devices, circuit components, and defects on semiconductor wafers and loose die extracted from packages. These preparation steps are essential for SEM, FIB, TEM or Optical Microscopy.
https://www.emsmicroscopyacademy.com/product-page/semi-jan19