Sustaining Member News

FEI Announces New Flagship Helios NanoLab x50 DualBeam Series

Helios outperforms competition for failure analysis, 3D nanoscale characterization and prototyping, and other techniques. It integrates FEI’s extreme high-resolution scanning electron microscope (XHR SEM) with a new, high-performance focused ion beam (FIB), to deliver an unprecedented level of imaging and milling capability for leading-edge applications in semiconductor and materials science research and development.