Sustaining Member News

X-Max—Upgrade to the Largest Area Silicon Drift Detector

Move up to ultimate productivity and accuracy for every application by upgrading your existing EDS to the X-Max, and benefit from: increased productivity (simultaneous imaging and analysis without changing microscope operating conditions), up to 10 times reduction in analysis time, convenient LN2 free operation, and true nanoanalysis (high count rates at low kV and small spot sizes enables characterization of sub 100-nm structures and beam-sensitive samples).

Oxford Instruments
www.oxford-instruments.com